JPH0719015Y2 - Ｉｃ試験用恒温槽装置 - Google Patents

Ｉｃ試験用恒温槽装置

Info

Publication number
JPH0719015Y2
JPH0719015Y2 JP14671389U JP14671389U JPH0719015Y2 JP H0719015 Y2 JPH0719015 Y2 JP H0719015Y2 JP 14671389 U JP14671389 U JP 14671389U JP 14671389 U JP14671389 U JP 14671389U JP H0719015 Y2 JPH0719015 Y2 JP H0719015Y2
Authority
JP
Japan
Prior art keywords
constant temperature
head
tray
tested
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14671389U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0385586U (en, 2012
Inventor
信行 千葉
釼平 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP14671389U priority Critical patent/JPH0719015Y2/ja
Publication of JPH0385586U publication Critical patent/JPH0385586U/ja
Application granted granted Critical
Publication of JPH0719015Y2 publication Critical patent/JPH0719015Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP14671389U 1989-12-20 1989-12-20 Ｉｃ試験用恒温槽装置 Expired - Lifetime JPH0719015Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14671389U JPH0719015Y2 (ja) 1989-12-20 1989-12-20 Ｉｃ試験用恒温槽装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14671389U JPH0719015Y2 (ja) 1989-12-20 1989-12-20 Ｉｃ試験用恒温槽装置

Publications (2)

Publication Number Publication Date
JPH0385586U JPH0385586U (en, 2012) 1991-08-29
JPH0719015Y2 true JPH0719015Y2 (ja) 1995-05-01

Family

ID=31693260

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14671389U Expired - Lifetime JPH0719015Y2 (ja) 1989-12-20 1989-12-20 Ｉｃ試験用恒温槽装置

Country Status (1)

Country Link
JP (1) JPH0719015Y2 (en, 2012)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101222505B1 (ko) * 2008-07-14 2013-01-15 가부시키가이샤 아드반테스트 소켓 가이드, 소켓, 푸셔 및 전자부품 시험장치

Also Published As

Publication number Publication date
JPH0385586U (en, 2012) 1991-08-29

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