JPH07150272A - Tin plated copper alloy material for electrical and electronic parts and production thereof - Google Patents

Tin plated copper alloy material for electrical and electronic parts and production thereof

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Publication number
JPH07150272A
JPH07150272A JP29787693A JP29787693A JPH07150272A JP H07150272 A JPH07150272 A JP H07150272A JP 29787693 A JP29787693 A JP 29787693A JP 29787693 A JP29787693 A JP 29787693A JP H07150272 A JPH07150272 A JP H07150272A
Authority
JP
Japan
Prior art keywords
tin
copper alloy
iron
intermetallic compound
plated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29787693A
Other languages
Japanese (ja)
Inventor
Masaaki Isono
誠昭 磯野
Satoshi Maruo
聡 丸尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP29787693A priority Critical patent/JPH07150272A/en
Publication of JPH07150272A publication Critical patent/JPH07150272A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To produce a tin plated copper alloy material for electrical and electronic parts excellent in solderability even if a tin plating layer therein is thin and furthermore excellent in thermal peeling resistance and to provide a method for producing the same. CONSTITUTION:This material is the one in which the middle of a copper alloy and a tin plating layer is provided with an intermetallic compound layer of iron and tin formed by melting having 0.1 to 0.4mum thickness. The surface of the copper alloy is applied with an iron or iron alloy plating layer of 0.08 to 0.3mum, and the surface is furthermore applied with tin plating and the tin plating layer is thereafter reflowed, by which the middle of the copper alloy material and tin plating layer is provided with the intermetallic compound layer of iron and tin having 0.1 to 0.4mum thickness. Moreover, the surface of the copper alloy is applied with the iron or iron alloy plating layer of 0.08 to 0.3mum, which is thereafter immersed in molten tin and is applied with tin plating, and at the same time, the middle of the copper alloy material and tin plating layer is provided with the intermetallic compound layer of iron and tin having 0.1 to 0.4mum thickness.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電気・電子部品用錫め
っき銅合金材およびその製造方法に係る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a tin-plated copper alloy material for electric / electronic parts and a method for producing the same.

【0002】[0002]

【従来の技術】錫めっき銅合金材は、端子・コネクター
をはじめ様々な電気・電子部品に用いられている。電気
・電子部品用として錫めっきを施す目的は、耐食性、良
好な半田付け性を付与するためである。また接点では、
接触抵抗値を低く安定に保つ目的をも持っている。
2. Description of the Related Art Tin-plated copper alloy materials are used in various electric and electronic parts such as terminals and connectors. The purpose of applying tin plating for electric / electronic parts is to impart corrosion resistance and good solderability. Also, at the contact,
It also has the purpose of keeping the contact resistance low and stable.

【0003】従来、これらの錫めっき銅合金材の多く
は、銅合金上に直接錫めっきを施すか、あるいは銅合金
材と錫めっき材の中間に銅下地めっきを施して製造され
ていた。
Conventionally, most of these tin-plated copper alloy materials have been manufactured by directly plating the copper alloy with tin, or by plating copper undercoat between the copper alloy material and the tin-plated material.

【0004】これらの錫めっき銅合金材を用いた電気・
電子部品は、実装の際の半田付け時や、実装後の使用環
境において熱影響を受ける。この熱影響は、錫めっき層
表面を酸化したり、銅合金中や銅下地めっき中のCuの
錫めっき中への拡散を促進したりして次のような様々な
問題の原因となる。
Electricity using these tin-plated copper alloy materials
Electronic components are affected by heat during soldering during mounting and in the usage environment after mounting. This thermal effect causes various problems as described below by oxidizing the surface of the tin plating layer or promoting diffusion of Cu in the copper alloy or copper undercoat into the tin plating.

【0005】例えば、錫めっきと、銅合金中や銅下地め
っき中からのCuとが反応拡散して、脆い金属間化合物
を形成し、その厚さが厚くなると、曲げ加工時のめっき
層の剥離の原因となる。また、錫めっき層全体が合金化
してしまい純錫層がなくなると、半田付けは不可能にな
る。
For example, tin plating and Cu from the copper alloy or the copper undercoat plating react and diffuse to form a brittle intermetallic compound, and when the thickness increases, the plating layer peels off during bending. Cause of. Further, if the entire tin-plated layer is alloyed and the pure tin layer is lost, soldering becomes impossible.

【0006】これら問題を避けるための一つの対策とし
て、錫めっき層を厚く施し(例えば、3〜5μmと
し)、Cuの錫めっき層表面までの拡散の時間をかせぐ
方法があるが、錫は高価な金属であり、錫めっき材のコ
ストを高くするという問題がある。また、錫めっきが厚
いとスタンピングの際に端面に錫のバリ(スタンピング
のカス)が多く発生し、金型の寿命を短くするという問
題が生じる。
As one of the measures for avoiding these problems, there is a method in which a tin plating layer is thickly formed (for example, 3 to 5 μm) to increase the diffusion time of Cu to the surface of the tin plating layer, but tin is expensive. Since it is a simple metal, there is a problem that the cost of the tin-plated material is increased. Further, if the tin plating is thick, a large amount of tin burrs (stamping residue) is generated on the end surface during stamping, which causes a problem of shortening the life of the mold.

【0007】そこで、従来通りの薄い錫めっき層(通常
1〜1.5μm)で耐熱剥離性、耐熱半田付け性にすぐ
れた錫めっき銅合金材が望まれる。
Therefore, a tin-plated copper alloy material having a conventional thin tin-plated layer (usually 1 to 1.5 μm) and excellent in heat-resistant peeling property and heat-resistant soldering property is desired.

【0008】[0008]

【発明が解決しようとする課題】本発明は、錫めっき層
の厚さを薄くとも、半田付け性に優れ、かつ耐熱剥離性
にも優れる電気・電子部品用錫めっき銅合金材及びその
製造方法を提供することを目的とする。
DISCLOSURE OF THE INVENTION The present invention provides a tin-plated copper alloy material for electric / electronic parts which is excellent in solderability and heat-resistant peeling property even when the thickness of the tin-plated layer is thin, and a method for producing the same. The purpose is to provide.

【0009】[0009]

【課題を解決するための手段】上記課題を解決するため
の電気・電子部品用錫めっき銅合金材は、銅合金と錫め
っき層の中間に0.1〜0.4μmの溶融により生じた
鉄と錫との金属間化合物層を持つことを特徴とする。
A tin-plated copper alloy material for electric / electronic parts for solving the above-mentioned problems is an iron produced by melting 0.1 to 0.4 μm between a copper alloy and a tin-plated layer. And an intermetallic compound layer of tin and tin.

【0010】上記課題を解決するための電気・電子部品
用錫めっき銅合金材の製造方法は、銅合金の表面に0.
08〜0.3μmの鉄または鉄合金めっき層を施し、さ
らにその上に錫めっきを施した後、錫めっき層を再溶
(リフロー)させることによって、銅合金材と錫めっき
層の中間に0.1〜0.4μmの鉄と錫の金属間化合物
層を設けることを特徴とする。
A method of manufacturing a tin-plated copper alloy material for electric / electronic parts for solving the above-mentioned problems is a method of forming a tin alloy on a surface of a copper alloy.
An iron or iron alloy plating layer having a thickness of 08 to 0.3 μm is applied, and then tin plating is applied on the iron or iron alloy plating layer, and then the tin plating layer is re-melted (reflowed) so that the copper alloy material and the tin plating layer are provided with 0 An intermetallic compound layer of iron and tin having a thickness of 1 to 0.4 μm is provided.

【0011】また、電気・電子部品用錫めっき銅合金材
の製造方法は、銅合金の表面に0.08〜0.3μmの
鉄または鉄合金めっき層を施した後、それを溶融した錫
中に浸潰し、錫めっきすると同時に、銅合金材と錫めっ
き層の中間に0.1〜0.4μmの鉄と錫の金属間化合
物層を設けることを特徴とする。
Further, the method for producing a tin-plated copper alloy material for electric / electronic parts is as follows. The surface of the copper alloy is coated with an iron or iron alloy plating layer having a thickness of 0.08-0.3 μm It is characterized in that an intermetallic compound layer of iron and tin having a thickness of 0.1 to 0.4 μm is provided between the copper alloy material and the tin plating layer at the same time as immersing in and tin plating.

【0012】[0012]

【作用】以下に本発明の作用を本発明をなすに際して得
た知見等とともに説明する。銅合金あるいは銅下地めっ
き上に錫めっきを施すと、錫と銅が反応拡散して、Cu
3Snからなるε層、Cu6Sn5からなるη層ができ
る。これらの拡散は非常に速く、100〜200℃で数
時間から数十時間で1〜2μm拡散する。しかるに本発
明者は、銅合金と錫めっき層の間に適当な厚さの鉄と錫
の金属間化合物層を設ける理由は、この鉄と錫の金属間
化合物層が、錫めっき層中への銅の拡散を防ぎ、しいて
は錫めっき層に金属間化合物を形成するのを防ぐことを
見いだした。よって、錫めっき層は純錫の部分を安定し
て保存することができる。ここで、鉄と錫の金属間化合
物とは、Fe3Sn、Fe3Sn2、FeSn、FeSn3
のことである。
The operation of the present invention will be described below together with the findings obtained in the present invention. When tin plating is applied on a copper alloy or copper undercoat, tin and copper react and diffuse to form Cu.
An ε layer made of 3 Sn and an η layer made of Cu 6 Sn 5 are formed. These diffusions are very fast, and the diffusion is 1-2 μm at 100 to 200 ° C. for several hours to several tens of hours. However, the inventor of the present invention is to provide an intermetallic compound layer of iron and tin having an appropriate thickness between the copper alloy and the tin plating layer, because the intermetallic compound layer of iron and tin is It has been found that it prevents the diffusion of copper and thus the formation of intermetallic compounds in the tin plating layer. Therefore, the tin-plated layer can stably store the pure tin portion. Here, the intermetallic compound of iron and tin means Fe 3 Sn, Fe 3 Sn 2 , FeSn, FeSn 3
That is.

【0013】従来は、銅と錫との金属間化合物や鉄と錫
との金属間化合物のような金属間化合物ができると曲げ
加工によって金属間化合物の層と銅合金材との界面から
めっき層が剥離すると言われていた。
Conventionally, when an intermetallic compound such as an intermetallic compound of copper and tin or an intermetallic compound of iron and tin is formed, the plating layer is formed from the interface between the layer of the intermetallic compound and the copper alloy material by bending. Was said to peel off.

【0014】しかし、経時的な拡散によってできる金属
間化合物とは異なり、溶融してできたものは、界面に拡
散による欠陥もなく密着性に優れていることを本発明者
は知見したのである。ただ、溶融してできた金属間化合
物について本発明者が幾多の実験を重ねたところ、やは
り曲げ加工によって剥離することがあった。そこで、ど
のような場合に剥離し、どのような場合に剥離しないか
を詳細に調べたところ、剥離の有無は、金属間化合物の
厚さに大きく左右されることを突き止めた。すなわち、
後にも詳細に説明するが、金属間化合物層がある一定の
厚さよりも薄いときは、めっきの剥離は全く発生しない
ことを知見した。
However, the present inventor has found that, unlike the intermetallic compound formed by diffusion over time, the one formed by melting has excellent adhesion without defects due to diffusion at the interface. However, when the present inventor repeatedly conducted many experiments on the intermetallic compound formed by melting, it was found that the intermetallic compound was also exfoliated by bending. Then, when the peeling was performed in detail and in what case the peeling was not performed, it was found that the presence or absence of the peeling was greatly influenced by the thickness of the intermetallic compound. That is,
As will be described in detail later, it was found that when the intermetallic compound layer is thinner than a certain thickness, no peeling of the plating occurs.

【0015】このように、我々は従来悪影響を及ぼすと
されてきた鉄と錫との金属間化合物層が、それを錫の融
点以上の温度で生成し、厚さを適当に制御することによ
って、反対にCuとSnの相互拡散を抑制し、錫めっき
層の合金化を防ぐことを明らかにした。また、かかる鉄
と錫との金属間化合物は、Ni3Snなる金属間化合物
よりも銅合金中のCuの拡散抑制作用がはるかに高いこ
とも見いだした。これによって、熱的にも、また経時的
にも安定した半田付け性を有する錫めっき銅合金材及び
その製造方法を発明したのである。
As described above, by forming an intermetallic compound layer of iron and tin, which has been hitherto adversely affected, at a temperature higher than the melting point of tin, and controlling the thickness appropriately, On the contrary, it was clarified that the mutual diffusion of Cu and Sn is suppressed and the alloying of the tin plating layer is prevented. It was also found that such an intermetallic compound of iron and tin has a far higher effect of suppressing diffusion of Cu in a copper alloy than an intermetallic compound of Ni 3 Sn. Thus, the inventors have invented a tin-plated copper alloy material having stable solderability both thermally and with time, and a method for producing the same.

【0016】ここで、鉄と錫との金属間化合物層の厚さ
を0.1μm以上としたのは、銅の錫中ヘの拡散を防ぐ
には0.1μm以上の鉄と錫の金属間化合物層が必要だ
からである。また、0.4μm以下としたのは、それ以
上厚くても銅の拡散防止の効果に大差は無いためであ
る。また、0.4μm以上に鉄と錫の金属間化合物層が
成長すると、曲げ加工時に曲げの応力が大きくなって鉄
と錫の金属間化合物層が銅合金の界面から剥離したり、
錫めっき層の大部分が合金層になって半田が付かなくな
ったりするからである。また、合金層が必要以上に厚い
と錫めっき材をスタンピングする際に、ダイスの寿命を
短くする原因にもなる。よって、鉄と錫の金属間化合物
層の厚さは0.1〜0.4μmとした。
Here, the thickness of the intermetallic compound layer of iron and tin is set to 0.1 μm or more in order to prevent diffusion of copper into tin. This is because the compound layer is necessary. The reason why the thickness is 0.4 μm or less is that there is no great difference in the effect of preventing the diffusion of copper even if the thickness is thicker than that. Further, when the intermetallic compound layer of iron and tin grows to 0.4 μm or more, bending stress increases during bending, and the intermetallic compound layer of iron and tin peels off from the interface of the copper alloy.
This is because most of the tin-plated layer becomes an alloy layer and solder cannot adhere to it. Further, if the alloy layer is thicker than necessary, it may shorten the life of the die when stamping the tin-plated material. Therefore, the thickness of the intermetallic compound layer of iron and tin is set to 0.1 to 0.4 μm.

【0017】次に、製造方法について説明する。錫めっ
きを施す方法は、電気めっき後にリフロー処理する方
法、溶融錫の中に、浸潰する方法のいずれでもよい。前
者では、電気めっき皮膜を再溶解させる時にめっきと錫
めっきが溶融して、鉄と錫の金属間化合物層をつくる。
また、溶融鉄めっきの場合も同様に鉄と錫の金属間化合
物層をつくる。これらはいずれも錫めっきを施す工程と
鉄めっきを金属間化合物層に変化させることを行うもの
である。
Next, the manufacturing method will be described. The method of applying tin plating may be either a method of performing a reflow treatment after electroplating or a method of immersing it in molten tin. In the former, when the electroplating film is redissolved, the plating and the tin plating melt to form an intermetallic compound layer of iron and tin.
Also, in the case of hot dip iron plating, an intermetallic compound layer of iron and tin is similarly formed. In all of these, the step of applying tin plating and the step of changing iron plating into an intermetallic compound layer are performed.

【0018】鉄めっきの厚さを0.08μm以上とした
のは、それよりも薄いと鉄と錫の金属間化合物層の厚さ
が不十分で、CuのSnめっき中ヘの拡散防止効果が不
十分になるからである。また、0.3μm以下としたの
は、それ以上厚いと不必要な厚さの鉄と錫の金属間化合
物層ができ加工性を悪化させるためである。よって、鉄
めっきの厚さは0.05〜0.3μmとした。
The thickness of the iron plating is set to 0.08 μm or more because if it is thinner than this, the thickness of the intermetallic compound layer of iron and tin is insufficient and the effect of preventing Cu from diffusing into the Sn plating is achieved. Because it will be insufficient. The reason why the thickness is 0.3 μm or less is that if it is thicker than that, an intermetallic compound layer of iron and tin having an unnecessary thickness is formed and workability is deteriorated. Therefore, the thickness of iron plating is set to 0.05 to 0.3 μm.

【0019】鉄めっきは、リフロー処理後および溶融錫
めっき後に完全に無くなっていることが重要である。な
ぜならば、鉄めっき層が残っていると本材が電子部品と
なって使用される間に、鉄と錫の相互拡散が進行して、
鉄と錫からなる金属間化合物層がさらに成長し、必要以
上の厚さになる恐れがあるからである。拡散によってで
きる金属間化合物はめっき層の界面に欠陥を伴ったりし
て剥離の原因になりかねない。また、必要以上の厚さの
金属間化合物層は加工性を低下させる。
It is important that the iron plating is completely gone after the reflow treatment and the hot tin plating. This is because if the iron plating layer remains, the interdiffusion of iron and tin will proceed while the material is used as an electronic component.
This is because the intermetallic compound layer composed of iron and tin may grow further and become thicker than necessary. The intermetallic compound formed by diffusion may cause peeling due to defects in the interface of the plating layer. In addition, an intermetallic compound layer having an excessive thickness reduces workability.

【0020】また、錫めっきの厚さは、コストやスタン
ピング時の屑の発生を考慮すると薄い方が望ましい。一
方、耐熱剥離性、半田付け性の観点からは厚い方が望ま
しい。しかし、めっきを行ってから部品に加工され、機
器に実装される際の半田付けを行うまでの期間をおよそ
1年とすると、その期間、半田付け性を保持するために
は、すくなくとも0.8μmは必要であると考える。詳
細は、めっき材の用途に応じて決定すればよい。もちろ
ん、半田付けを行うまでの期間が短い場合には0.8μ
mよりも薄くしてもよく、その場合であっても剥離を生
ずることはない。
The thickness of the tin plating is preferably thin in consideration of cost and generation of scraps during stamping. On the other hand, from the viewpoint of heat-resistant peelability and solderability, a thicker one is desirable. However, assuming that the period from plating to processing into parts and soldering when mounted on equipment is about 1 year, in order to maintain solderability during that period, at least 0.8 μm Think necessary. The details may be determined according to the application of the plated material. Of course, 0.8μ if the period before soldering is short
It may be thinner than m, and even in that case, peeling does not occur.

【0021】めっきを施す銅合金材料には、錫および鉄
を含んだ合金が望ましい。なぜならば、多くの端子・コ
ネクターなどの接触子は、スタンピングによって作られ
るが、もし銅合金が鉄を含有しておれば、そのスタンピ
ング屑が、めっき層を剥離することなしに再利用できる
からである。
The copper alloy material to be plated is preferably an alloy containing tin and iron. This is because many terminals, connectors and other contacts are made by stamping, but if the copper alloy contains iron, the stamping debris can be reused without peeling the plating layer. is there.

【0022】特に、前記銅合金は、Sn:1.5〜2.
5重量%、Fe:0.05〜0.15重量%、P:0.
02〜0.05重量%、残部Cuからなる銅合金、また
はZn:1.0〜5.0重量%、Sn:1.0〜2.5
重量%、Fe:0.05〜0.15重量%、P:0.0
2〜0.05重量%、残部Cuからなる銅合金を用いる
ことが好ましい。これらの合金は、本発明の製造方法を
用いても強度や導電率等の材料特性の変化無い耐熱性に
優れる銅合金であり、また、Cu下地めっきを施さずと
も、鉄と錫との金属間化合物層だけで、Znの拡散を防
止することができ、経時的にも良好な半田付け性、接触
抵抗値を保持することが可能となる。
In particular, the copper alloy is Sn: 1.5-2.
5% by weight, Fe: 0.05 to 0.15% by weight, P: 0.
02-0.05 wt%, copper alloy consisting of the balance Cu, or Zn: 1.0-5.0 wt%, Sn: 1.0-2.5
% By weight, Fe: 0.05 to 0.15% by weight, P: 0.0
It is preferable to use a copper alloy composed of 2 to 0.05% by weight and the balance Cu. These alloys are copper alloys excellent in heat resistance without change in material properties such as strength and conductivity even when the manufacturing method of the present invention is used. Further, even if Cu undercoating is not applied, metal of iron and tin is used. Zn can be prevented from diffusing only by the intermetallic compound layer, and good solderability and contact resistance value can be maintained over time.

【0023】[0023]

【実施例】第1表に示す錫めっき材を作成した。りん青
銅材はCu6wt%Sn−0.045wt%Pからなる
りん青銅二種材をもちいた。また、KLF−5はCu−
2wt%Sn−0.1wt%Fe0.03wt%Pから
なる銅合金である。用いた錫めっき液組成およびめっき
条件は第2表に示した。また、鉄合金めっき液組成およ
びめっき条件は第3表に示した。このとき鉄合金めっき
層の組成は鉄が90重量%であった。
Example A tin-plated material shown in Table 1 was prepared. As the phosphor bronze material, a phosphor bronze type 2 material composed of Cu6 wt% Sn-0.045 wt% P was used. Also, KLF-5 is Cu-
It is a copper alloy composed of 2 wt% Sn-0.1 wt% Fe 0.03 wt% P. The tin plating solution composition and plating conditions used are shown in Table 2. The composition of the iron alloy plating solution and the plating conditions are shown in Table 3. At this time, the composition of the iron alloy plating layer was 90% by weight of iron.

【0024】これらの錫めっき材を150℃で100、
500、1000時間熱処理した後、これらの材料の9
0゜繰り返し曲げを2回行い、曲げ部表面を実体顕微鏡
で観察し、めっき層の剥離の有無を確認した。また、半
田付け性は、最近のコネクターの表面実装化に伴い増加
してきたリフロー半田付け方法を考慮した220℃で1
0分までの範囲の熱処理後に評価した。半田付け性は、
半田付け後に半田の付着面積が85%以上を『良好』と
し、それ以下を『不良』とした。結果は第1表に合わせ
て示した。
100% of these tin-plated materials at 150 ° C.
After heat treatment for 500 to 1000 hours, 9 of these materials
Bending was repeated twice at 0 °, and the surface of the bent portion was observed with a stereoscopic microscope to confirm the presence or absence of peeling of the plating layer. Also, solderability is 1 at 220 ° C considering the reflow soldering method that has been increasing with the recent surface mounting of connectors.
Evaluation was performed after heat treatment for a range of up to 0 minutes. Solderability is
After soldering, a solder adhesion area of 85% or more was defined as “good”, and a solder adhesion area of less than 85% was defined as “defective”. The results are shown in Table 1.

【0025】その結果、鉄と錫の金属間化合物層の厚さ
が0.1μm以上の時、熱剥離は起こらなかった。これ
は、錫と鉄の金属間化合物が銅の錫層への拡散を抑制す
るため、錫と銅の金属間化合物がほとんど成長せず、熱
剥離の原因と言われるカーケンダルボイドが発生しない
ためである。また、従来材は、150℃×500時間で
めっきの剥離が発生した。鉄と錫の金属間化合物層の厚
さが0.5μm以上では曲げ試験によって剥離が発生し
た。よって、鉄と錫の金属間化合物層の厚さは、0.1
〜0.4μmが適当である。
As a result, thermal peeling did not occur when the thickness of the intermetallic compound layer of iron and tin was 0.1 μm or more. This is because the intermetallic compound of tin and iron suppresses the diffusion of copper into the tin layer, so that the intermetallic compound of tin and copper hardly grows, and Kirkendall voids that are said to cause thermal exfoliation do not occur. Is. Further, with the conventional material, peeling of the plating occurred at 150 ° C. for 500 hours. When the thickness of the intermetallic compound layer of iron and tin was 0.5 μm or more, peeling occurred in the bending test. Therefore, the thickness of the intermetallic compound layer of iron and tin is 0.1
0.4 μm is suitable.

【0026】また、鉄めっきを施さないものは、220
℃×5分の熱処理で半田付け不良が発生するのに対し、
本発明による錫めっき材は、10分でも良好な半田付け
性が得られた。半田付け性ヘの熱影響の点でも、本発明
の実施例材は優れていた。
[0026] In addition, the one without iron plating is 220
In contrast to soldering failure caused by heat treatment at ℃ × 5 minutes,
The tin-plated product according to the present invention provided good solderability even after 10 minutes. The example material of the present invention was also excellent in terms of the thermal effect on the solderability.

【0027】[0027]

【発明の効果】本発明によって、耐熱剥離性、耐熱半田
付け性にすぐれた電気・電子部品用錫めっき銅合金材を
提供することができる。この錫めっき銅合金材は、端子
・コネクター等の電気・電子部品の耐熱剥離性、耐熱半
田付け性を向上させることになり、機器の信頼性を高め
ることに貢献できる。
According to the present invention, it is possible to provide a tin-plated copper alloy material for electric and electronic parts, which is excellent in heat-resistant peeling property and heat-resistant soldering property. This tin-plated copper alloy material improves heat-resistant peeling resistance and heat-resisting solderability of electric and electronic parts such as terminals and connectors, and can contribute to increase the reliability of equipment.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施例における試験条件及び結果を示す表であ
る。
FIG. 1 is a table showing test conditions and results in Examples.

【図2】実施例における錫めっき条件等を示す表であ
る。
FIG. 2 is a table showing tin plating conditions and the like in examples.

【図3】実施例における鉄めっき条件等を示す表であ
る。
FIG. 3 is a table showing iron plating conditions and the like in examples.

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 銅合金と錫めっき層の中間に0.1〜
0.4μmの厚さで溶融により生じた鉄と錫との金属間
化合物層を持つことを特徴とする電気・電子部品用錫め
っき銅合金材。
1. 0.1 to 0.1 is provided between the copper alloy and the tin plating layer.
A tin-plated copper alloy material for electric and electronic parts, which has an intermetallic compound layer of iron and tin produced by melting in a thickness of 0.4 μm.
【請求項2】 前記銅合金は、鉄および錫を成分として
含有する銅合金であることを特徴とする請求項1記載の
電気・電子部品用錫めっき銅合金材。
2. The tin-plated copper alloy material for electric / electronic parts according to claim 1, wherein the copper alloy is a copper alloy containing iron and tin as components.
【請求項3】 前記銅合金は、Sn:1.5〜2.5重
量%、Fe:0.05〜0.15重量%、P:0.02
〜0.05重量%、残部Cuからなる銅合金、またはZ
n:1.0〜5.0重量%、Sn:1.0〜2.5重量
%、Fe:0.05〜0.15重量%、P:0.02〜
0.05重量%、残部Cuからなる銅合金であることを
特徴とする請求項2記載の電気・電子部品用錫めっき銅
合金材。
3. The copper alloy comprises Sn: 1.5 to 2.5% by weight, Fe: 0.05 to 0.15% by weight, P: 0.02.
~ 0.05 wt%, copper alloy with balance Cu, or Z
n: 1.0 to 5.0 wt%, Sn: 1.0 to 2.5 wt%, Fe: 0.05 to 0.15 wt%, P: 0.02
The tin-plated copper alloy material for electric / electronic parts according to claim 2, which is a copper alloy consisting of 0.05% by weight and the balance Cu.
【請求項4】 銅合金の表面に0.08〜0.3μmの
鉄または鉄合金めっき層を施し、さらにその上に錫めっ
きを施した後、錫めっき層を再溶(リフロー)させるこ
とによって、銅合金材と錫めっき層の中間に0.1〜
0.4μmの鉄と錫の金属間化合物層を設けることを特
徴とする電気・電子部品用錫めっき銅合金材の製造方
法。
4. An iron or iron alloy plating layer having a thickness of 0.08 to 0.3 μm is formed on the surface of a copper alloy, tin is further plated thereon, and then the tin plating layer is re-melted (reflow). , 0.1 between copper alloy material and tin plating layer
A method for producing a tin-plated copper alloy material for electric / electronic parts, which comprises providing an intermetallic compound layer of 0.4 μm of iron and tin.
【請求項5】 銅合金の表面に0.08〜0.3μmの
鉄または鉄合金めっき層を施した後、それを溶融した錫
中に浸潰し、錫めっきすると同時に、銅合金材と錫めっ
き層の中間に0.1〜0.4μmの鉄と錫の金属間化合
物層を設けることを特徴とする電気・電子部品用錫めっ
き銅合金材の製造方法。
5. An iron or iron alloy plating layer having a thickness of 0.08 to 0.3 μm is applied to the surface of a copper alloy, which is then immersed in molten tin and tin-plated, and at the same time, a copper alloy material and a tin-plated material. A method for producing a tin-plated copper alloy material for electric / electronic parts, which comprises providing an intermetallic compound layer of iron and tin having a thickness of 0.1 to 0.4 μm in the middle of the layers.
【請求項6】 前記銅合金として、鉄および錫を成分と
して含有する銅合金をもちいることを特徴とする請求項
4または5記載の電気・電子部品用錫めっき銅合金材の
製造方法。
6. The method for producing a tin-plated copper alloy material for electric / electronic parts according to claim 4, wherein a copper alloy containing iron and tin as components is used as the copper alloy.
【請求項7】 前記銅合金は、Sn:1.5〜2.5重
量%、Fe:0.05〜0.15重量%、P:0.02
〜0.05重量%、残部Cuからなる銅合金、またはZ
n:1.0〜5.0重量%、Sn:1.0〜2.5重量
%、Fe:0.05〜0.15重量%、P:0.02〜
0.05重量%、残部Cuからなる銅合金であることを
特徴とする請求項6記載の電気・電子部品用錫めっき銅
合金材の製造方法。
7. The copper alloy comprises Sn: 1.5 to 2.5% by weight, Fe: 0.05 to 0.15% by weight, P: 0.02.
~ 0.05 wt%, copper alloy with balance Cu, or Z
n: 1.0 to 5.0 wt%, Sn: 1.0 to 2.5 wt%, Fe: 0.05 to 0.15 wt%, P: 0.02
7. The method for producing a tin-plated copper alloy material for electric / electronic parts according to claim 6, which is a copper alloy composed of 0.05% by weight and the balance Cu.
JP29787693A 1993-11-29 1993-11-29 Tin plated copper alloy material for electrical and electronic parts and production thereof Pending JPH07150272A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29787693A JPH07150272A (en) 1993-11-29 1993-11-29 Tin plated copper alloy material for electrical and electronic parts and production thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29787693A JPH07150272A (en) 1993-11-29 1993-11-29 Tin plated copper alloy material for electrical and electronic parts and production thereof

Publications (1)

Publication Number Publication Date
JPH07150272A true JPH07150272A (en) 1995-06-13

Family

ID=17852266

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29787693A Pending JPH07150272A (en) 1993-11-29 1993-11-29 Tin plated copper alloy material for electrical and electronic parts and production thereof

Country Status (1)

Country Link
JP (1) JPH07150272A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6759142B2 (en) 2001-07-31 2004-07-06 Kobe Steel Ltd. Plated copper alloy material and process for production thereof
JP2016098379A (en) * 2014-11-18 2016-05-30 東洋鋼鈑株式会社 Soldering material

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6759142B2 (en) 2001-07-31 2004-07-06 Kobe Steel Ltd. Plated copper alloy material and process for production thereof
US6939621B2 (en) 2001-07-31 2005-09-06 Kobe Steel, Ltd. Plated copper alloy material and process for production thereof
JP2016098379A (en) * 2014-11-18 2016-05-30 東洋鋼鈑株式会社 Soldering material

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