JPH0712948Y2 - 部品試験装置 - Google Patents

部品試験装置

Info

Publication number
JPH0712948Y2
JPH0712948Y2 JP805890U JP805890U JPH0712948Y2 JP H0712948 Y2 JPH0712948 Y2 JP H0712948Y2 JP 805890 U JP805890 U JP 805890U JP 805890 U JP805890 U JP 805890U JP H0712948 Y2 JPH0712948 Y2 JP H0712948Y2
Authority
JP
Japan
Prior art keywords
component
defective
tray
components
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP805890U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0399375U (enrdf_load_stackoverflow
Inventor
勝利 岡安
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP805890U priority Critical patent/JPH0712948Y2/ja
Publication of JPH0399375U publication Critical patent/JPH0399375U/ja
Application granted granted Critical
Publication of JPH0712948Y2 publication Critical patent/JPH0712948Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP805890U 1990-01-29 1990-01-29 部品試験装置 Expired - Fee Related JPH0712948Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP805890U JPH0712948Y2 (ja) 1990-01-29 1990-01-29 部品試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP805890U JPH0712948Y2 (ja) 1990-01-29 1990-01-29 部品試験装置

Publications (2)

Publication Number Publication Date
JPH0399375U JPH0399375U (enrdf_load_stackoverflow) 1991-10-17
JPH0712948Y2 true JPH0712948Y2 (ja) 1995-03-29

Family

ID=31511702

Family Applications (1)

Application Number Title Priority Date Filing Date
JP805890U Expired - Fee Related JPH0712948Y2 (ja) 1990-01-29 1990-01-29 部品試験装置

Country Status (1)

Country Link
JP (1) JPH0712948Y2 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MY140086A (en) * 2004-07-23 2009-11-30 Advantest Corp Electronic device test apparatus and method of configuring electronic device test apparatus

Also Published As

Publication number Publication date
JPH0399375U (enrdf_load_stackoverflow) 1991-10-17

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Legal Events

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