JPH0399375U - - Google Patents
Info
- Publication number
- JPH0399375U JPH0399375U JP805890U JP805890U JPH0399375U JP H0399375 U JPH0399375 U JP H0399375U JP 805890 U JP805890 U JP 805890U JP 805890 U JP805890 U JP 805890U JP H0399375 U JPH0399375 U JP H0399375U
- Authority
- JP
- Japan
- Prior art keywords
- parts
- components
- defective
- testing
- linear
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000002950 deficient Effects 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 6
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP805890U JPH0712948Y2 (ja) | 1990-01-29 | 1990-01-29 | 部品試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP805890U JPH0712948Y2 (ja) | 1990-01-29 | 1990-01-29 | 部品試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0399375U true JPH0399375U (enrdf_load_stackoverflow) | 1991-10-17 |
JPH0712948Y2 JPH0712948Y2 (ja) | 1995-03-29 |
Family
ID=31511702
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP805890U Expired - Fee Related JPH0712948Y2 (ja) | 1990-01-29 | 1990-01-29 | 部品試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0712948Y2 (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010156709A (ja) * | 2004-07-23 | 2010-07-15 | Advantest Corp | 電子部品試験装置 |
-
1990
- 1990-01-29 JP JP805890U patent/JPH0712948Y2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010156709A (ja) * | 2004-07-23 | 2010-07-15 | Advantest Corp | 電子部品試験装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0712948Y2 (ja) | 1995-03-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7268534B2 (en) | Sorting handler for burn-in tester | |
DE19523969C2 (de) | Bausteintransportvorrichtung und Verfahren zum wiederholten Testen von Bausteinen für IC-Handhabungseinrichtung | |
JPH01185455A (ja) | 機能検査システム | |
JPH08248095A (ja) | 検査装置 | |
JPH0399375U (enrdf_load_stackoverflow) | ||
KR100376772B1 (ko) | 수평식 디바이스 테스트 핸들러 및 그의 작동방법 | |
KR101042652B1 (ko) | 전자부품 시험장치 | |
JPH08170976A (ja) | 半導体試験装置用ハンドラ機構 | |
JPH0454976Y2 (enrdf_load_stackoverflow) | ||
JP2545650Y2 (ja) | Ic試験装置 | |
JPH0430191Y2 (enrdf_load_stackoverflow) | ||
JP3316075B2 (ja) | Ic試験装置用オートハンドラ | |
JPS6345828A (ja) | Icハンドリング装置 | |
CN223171381U (zh) | 一种继电器外观检测设备 | |
JPH0717026Y2 (ja) | Ic試験装置 | |
JPS6112508A (ja) | 検査設備 | |
JPH0526959A (ja) | Icテスト装置 | |
JPH0717025Y2 (ja) | Ic試験装置 | |
JP2625395B2 (ja) | Icハンドラ及びicプロービング方法 | |
JP2516309Y2 (ja) | Ic供給収納ヘッドの調整機構 | |
JPS6167239A (ja) | Icハンドラの多連型搬出機構 | |
JP2549391Y2 (ja) | Icハンドラーのトレイ支持構造 | |
JP2002181886A (ja) | 部品ハンドラ、ic測定システム、icの分別方法 | |
JPH0634709Y2 (ja) | 集積回路の検査装置 | |
JPS6066105A (ja) | 寸法計測分類装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |