JPH0399375U - - Google Patents
Info
- Publication number
- JPH0399375U JPH0399375U JP805890U JP805890U JPH0399375U JP H0399375 U JPH0399375 U JP H0399375U JP 805890 U JP805890 U JP 805890U JP 805890 U JP805890 U JP 805890U JP H0399375 U JPH0399375 U JP H0399375U
- Authority
- JP
- Japan
- Prior art keywords
- parts
- components
- defective
- testing
- linear
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000002950 deficient Effects 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 6
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP805890U JPH0712948Y2 (ja) | 1990-01-29 | 1990-01-29 | 部品試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP805890U JPH0712948Y2 (ja) | 1990-01-29 | 1990-01-29 | 部品試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0399375U true JPH0399375U (enrdf_load_stackoverflow) | 1991-10-17 |
| JPH0712948Y2 JPH0712948Y2 (ja) | 1995-03-29 |
Family
ID=31511702
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP805890U Expired - Fee Related JPH0712948Y2 (ja) | 1990-01-29 | 1990-01-29 | 部品試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0712948Y2 (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010156709A (ja) * | 2004-07-23 | 2010-07-15 | Advantest Corp | 電子部品試験装置 |
-
1990
- 1990-01-29 JP JP805890U patent/JPH0712948Y2/ja not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010156709A (ja) * | 2004-07-23 | 2010-07-15 | Advantest Corp | 電子部品試験装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0712948Y2 (ja) | 1995-03-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |