JPH0635181Y2 - Ultrasonic probe device - Google Patents
Ultrasonic probe deviceInfo
- Publication number
- JPH0635181Y2 JPH0635181Y2 JP1988159248U JP15924888U JPH0635181Y2 JP H0635181 Y2 JPH0635181 Y2 JP H0635181Y2 JP 1988159248 U JP1988159248 U JP 1988159248U JP 15924888 U JP15924888 U JP 15924888U JP H0635181 Y2 JPH0635181 Y2 JP H0635181Y2
- Authority
- JP
- Japan
- Prior art keywords
- ultrasonic probe
- frame
- inspected
- probe device
- shaft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
【考案の詳細な説明】 〔産業上の利用分野〕 この考案は複数個の超音波探触子を用いた超音波探触子
装置の改良に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an improvement of an ultrasonic probe device using a plurality of ultrasonic probes.
一般的に超音波探触子装置の多くは被検材の表面に対し
探触子面の角度を一定に保つ必要が有る。また，搬送ラ
インを搬送されてくる被検材を自動的にかつ搬送ライン
上で検査あるいは測定（以下探傷という）する場合は，
超音波探触子を被検材面に自動的に倣わせることも必要
となる。Generally, most ultrasonic probe devices need to keep the angle of the probe surface constant with respect to the surface of the material to be tested. In addition, when automatically inspecting or measuring the material to be inspected that is conveyed on the conveyor line (hereinafter referred to as flaw detection),
It is also necessary to make the ultrasonic probe automatically follow the surface of the material to be inspected.
第３図は従来の超音波探触子装置の構成図（被検材に対
向する超音波探触子装置を被検材の探傷面に平行な上方
から見た図）である。FIG. 3 is a configuration diagram of a conventional ultrasonic probe device (a view of an ultrasonic probe device facing a material to be inspected, viewed from above in parallel with a flaw detection surface of the material to be inspected).
第３図において，（１）は被検材，（２）は超音波探触
子装置，（３）は超音波探触子，（４）は上記超音波探
触子（３）を千鳥状に取付けたブロツク，（５）は被検
材搬送方向に直交する方向に設けられた第一の軸，
（６）は上記ブロツク（４）と，矢印A,A′方向のみ回
転可能に上記第一の軸（５）で結合された第一のフレー
ム，（７）は被検材搬送方向に平行する方向に設けられ
た第二の軸，（８）は上記第一フレーム（６）と矢印B,
B′方向のみ回転可能に上記第二の軸（７）で結合され
た第二のフレームである。In FIG. 3, (1) is the test material, (2) is an ultrasonic probe device, (3) is an ultrasonic probe, and (4) is the ultrasonic probe (3) in a staggered pattern. The block attached to (5) is the first shaft provided in the direction orthogonal to the direction in which the material to be tested is conveyed,
(6) is a first frame connected to the block (4) by the first shaft (5) so as to be rotatable only in the directions of the arrows A and A ', and (7) is parallel to the test material conveying direction. A second shaft provided in the direction, (8) is the first frame (6) and the arrow B,
The second frame is rotatably connected only in the B'direction by the second shaft (7).
なお第二のフレーム（８）は紙面上方でつながつており
一体なものである。The second frame (8) is connected to the upper side of the drawing and is integral.
上記のように構成されているのでブロツク（４）は第一
の軸（５）と第二の軸（７）とにより，被検材（１）の
探傷面のいずれの方向のうねりに対しても倣えるように
なつている。Since the block (4) is constructed as described above, the block (4) can be prevented from waviness in any direction on the flaw detection surface of the test material (1) by the first shaft (5) and the second shaft (7). Can be imitated.
第４図は第３図の被検材（１）と超音波探触子装置
（２）とを矢印Ｃ方向から見た図面である。ただし第４
図において，第二のフレーム（８）と第二の軸（７）は
同図では図示されていない。FIG. 4 is a view of the test material (1) and the ultrasonic probe device (2) of FIG. 3 viewed from the direction of arrow C. However, the fourth
In the figure, the second frame (8) and the second shaft (7) are not shown in the figure.
第４図においては（９）はブロツク（４）の被検材
（１）との接触面に設けられたシユウで，シユウ（９）
は直接あるいは接触媒質（10）を介して被検材（１）と
接している。In FIG. 4, (9) is a seal provided on the contact surface of the block (4) with the test material (1).
Is in contact with the test material (1) directly or through the contact medium (10).
上記のような従来の超音波探触子装置においては被検材
が第４図の被検材（１）の面のように平面ではなく丸味
を帯びていると，超音波探触子（３）の被検材（１）と
の対向面と，被検材（１）の面とは平行ではなく，所定
範囲内の任意の角度を有することになるとともに接触媒
質（10）のＥの部分のように，接触媒質（10）の被検材
（１）と超音波探触子（３）の面との間のギヤツプが大
きくなり，そのため超音波探触子（３）による探傷性能
が低下することになる。In the conventional ultrasonic probe apparatus as described above, if the test material is not flat like the surface of the test material (1) in FIG. ) The surface of the contact medium (1) facing the sample material (1) is not parallel to the surface of the sample material (1) and has an arbitrary angle within a predetermined range, and the portion E of the contact medium (10) As described above, the gear gap between the material to be tested (1) of the couplant (10) and the surface of the ultrasonic probe (3) becomes large, so the flaw detection performance of the ultrasonic probe (3) decreases. Will be done.
このような丸味を有する被検材としてはビレツト材や厚
鋼板の端部に多く，一体のブロツク（４）あるいは，シ
ユウ（９）が複数個の超音波探触子を内蔵する場合は，
超音波探触子装置（２）の被検材（１）との対向面の面
積が大きくなり，被検材（１）の面の丸味などに倣いき
れなくなるという課題があつた。As the test material having such roundness, there are many at the end of billet material or thick steel plate, and when the integrated block (4) or the shroud (9) incorporates a plurality of ultrasonic probes,
There is a problem that the area of the surface of the ultrasonic probe device (2) facing the material to be inspected (1) becomes large, and it becomes impossible to follow the roundness of the surface of the material to be inspected (1).
この考案はこのような課題を解消する目的でなされたも
ので，複数個の超音波探触子の内，隣り合う超音波探触
子を一組とし，被検材に対し直角な第一の回転軸を有
し，なおかつ上記回転軸の端部を被検材に対し平行な第
二の回転軸を介し，第一のフレームに結合することによ
り被検材表面の凹凸やコーナー部の丸味に対して超音波
探触子の上，下動及び回転により，被検材表面に倣うこ
とが可能な超音波探触子装置を得ることを目的とする。The present invention was made in order to solve such a problem. Among a plurality of ultrasonic probes, a pair of adjacent ultrasonic probes is used as a set, and the first ultrasonic probe is perpendicular to the test material. It has a rotating shaft, and the end of the rotating shaft is connected to the first frame through a second rotating shaft parallel to the material to be inspected. On the other hand, it is an object of the present invention to obtain an ultrasonic probe device capable of following the surface of a material to be inspected by moving the ultrasonic probe up, down and rotating.
この考案に係る超音波探触子装置は複数個の超音波探触
子を内蔵した複数個のホルダを被検材搬送方向に直交お
よび平行する方向にそれぞれ設けた二軸に対しそれぞれ
独立に回転自由度をもたせて第一のフレームに取付け、
その第一のフレームを被検材搬送方向と平行する方向に
設けた軸に対し回転自由度をもたせて第二のフレームに
取付けるようにしたものである。The ultrasonic probe device according to the present invention rotates a plurality of holders, each of which has a plurality of ultrasonic probes, independently of each other with respect to two axes provided in a direction orthogonal to and parallel to the direction in which the material is conveyed. Attach it to the first frame with a degree of freedom,
The first frame is attached to the second frame while having a degree of freedom of rotation with respect to an axis provided in a direction parallel to the material conveying direction.
この考案においては超音波探触子が被検材に直角及び平
行な回転軸で，上，下ならびに回転自由度を有している
ため，被検材表面の凹凸に対し，超音波探触子が上，下
及び回転することによつて倣うことができる。In this invention, since the ultrasonic probe has a rotation axis that is perpendicular to and parallel to the material to be inspected and has upper, lower, and rotational degrees of freedom, the ultrasonic probe can be used for unevenness on the surface of the material to be inspected. Can be imitated by moving up, down and rotating.
第１図〜第２図はこの考案の超音波探触子装置を示す図
である。1 and 2 are views showing an ultrasonic probe device of the present invention.
図に示した超音波探触子装置（２）において（３）は超
音波探触子，（11）は上記超音波探触子（３）を内蔵し
た複数個のホルダ、（12）は上記各ホルダ（11）を独立
して第一のフレーム（６）に対して矢印A,A′方向に回
転させるための軸であり、この軸（12）は被検材搬送方
向に直交する方向に設けられている。（13）は上記軸
（12）を第一のフレーム（６）に対してDD′方向に回転
させるためのピンであり、このピン（13）は被検材搬送
方向に平行する方向に設けられている。（14）はスプリ
ング，（15）は上記スプリング（14）に予圧を与えるブ
ラケツトである。In the ultrasonic probe device (2) shown in the figure, (3) is an ultrasonic probe, (11) is a plurality of holders containing the ultrasonic probe (3), and (12) is the above-mentioned holder. It is an axis for independently rotating each holder (11) with respect to the first frame (6) in the directions of arrows A and A ', and this axis (12) is in the direction orthogonal to the material conveying direction. It is provided. Reference numeral (13) is a pin for rotating the shaft (12) with respect to the first frame (6) in the DD ′ direction, and the pin (13) is provided in a direction parallel to the material conveying direction. ing. (14) is a spring, and (15) is a bracket that applies a preload to the spring (14).
この考案は〜複数個のホルダ（11）を被検材搬送方向に
直交および平行する方向にそれぞれ設けた軸（12），ピ
ン（13）に対しそれぞれ独立に回転自由度をもたせて第
一のフレーム（６）に取付け、その第一のフレーム
（６）を被検材搬送方向と平行する方向に設けた軸
（７）に対し回転自由度をもたせて第二のフレーム
（８）に取付けることにより第１図をＣ方向から見た図
面（第２図）で示されるように，超音波探触子（３）の
各面との間の距離Ｈはほぼ一定に保れ易くなる。This device is designed to have a plurality of holders (11), each of which has a rotation degree of freedom independently of the shaft (12) and the pin (13) provided in a direction orthogonal to and parallel to the direction of conveyance of the material to be tested. Attaching to the frame (6), and attaching the first frame (6) to the second frame (8) with rotational freedom with respect to the shaft (7) provided in the direction parallel to the material conveying direction. As a result, as shown in the drawing of FIG. 1 viewed from the direction C (FIG. 2), the distance H between each surface of the ultrasonic probe (3) can be kept substantially constant.
さらに被検材（１）が高速で搬送される場合は被検材
（１）の振動が大きくなり，単に超音波探触子装置
（２）の自重のみでは倣いきれないので，エアーシリン
ダ等で超音波探触子装置を被検材（１）に押付けている
が，上記軸（12）及びピン（13）を有することにより，
上記エアーシリンダ等の押付力が超音波探触子（３）に
それぞれ均等に作用するため，探傷性能が向上するとと
もに，上記シユウ（９）の偏摩耗防止にもつながる。Furthermore, when the material to be inspected (1) is conveyed at a high speed, the vibration of the material to be inspected (1) becomes large, and the ultrasonic probe device (2) cannot simply follow the dead weight. Although the ultrasonic probe device is pressed against the test material (1), by having the shaft (12) and the pin (13),
Since the pressing force of the air cylinder or the like acts on the ultrasonic probe (3) evenly, the flaw detection performance is improved and the uneven wear of the shoe (9) is prevented.
この考案による超音波探触子装置を使用することによ
り，表面形状の悪い被検材に超音波探触子を精度よく倣
わせることが可能となり，探傷の精度が向上する。By using the ultrasonic probe device according to the present invention, it becomes possible to accurately trace the ultrasonic probe to a material having a poor surface shape, and the accuracy of flaw detection is improved.
第１図及び第２図はこの考案の一実施例を示すための
図，第3,第４図は従来の超音波探触子装置を示す図であ
る。 図において（１）は被検材，（２）は超音波探触子装
置，（３）は超音波探触子，（６）は第一のフレーム，
（７）は第二の軸，（８）は第二のフレーム，（９）は
シユウ，（10）は接触媒質，（11）はホルダ，（12）は
軸，（13）はピン，（14）はスプリング，（15）はブラ
ケツトである。 なお，図中同一あるいは相当部分には同一符号を示して
ある。1 and 2 are views showing an embodiment of the present invention, and FIGS. 3 and 4 are views showing a conventional ultrasonic probe device. In the figure, (1) is a test material, (2) is an ultrasonic probe device, (3) is an ultrasonic probe, (6) is a first frame,
(7) is the second shaft, (8) is the second frame, (9) is the shaft, (10) is the contact medium, (11) is the holder, (12) is the shaft, (13) is the pin, ( 14) is a spring and (15) is a bracket. The same or corresponding parts in the drawings are designated by the same reference numerals.
Claims (1)
て配置された複数個の超音波探触子と、上記超音波探触
子を内蔵し、相互いに対向して配置された複数個のホル
ダと、上記複数個のホルダを被検材搬送方向に直交およ
び平行する方向にそれぞれ設けた二軸に対し、それぞれ
独立に回転自由度をもたせて取付けた第一のフレーム
と、上記第一のフレームを被検材搬送方向と平行する方
向に設けた軸に対し回転自由度をもたせて取付けた第二
のフレームと、上記複数個の超音波探触子を被検材に対
し押し付ける押し付け機構とを具備したことを特徴とす
る超音波探触子装置。1. A plurality of ultrasonic probes arranged to face a material to be inspected conveyed on a conveyance line, and a plurality of the ultrasonic probes built-in, which are arranged to face each other. A plurality of holders, a first frame attached with the plurality of holders independently with respect to two axes respectively provided in a direction orthogonal to and parallel to the direction of conveyance of the material to be inspected, with rotational degrees of freedom; A second frame, which is attached with the first frame having a rotational degree of freedom with respect to an axis provided in a direction parallel to the material conveying direction, and the plurality of ultrasonic probes are pressed against the material. An ultrasonic probe device comprising a pressing mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988159248U JPH0635181Y2 (en) | 1988-12-07 | 1988-12-07 | Ultrasonic probe device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988159248U JPH0635181Y2 (en) | 1988-12-07 | 1988-12-07 | Ultrasonic probe device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0279457U JPH0279457U (en) | 1990-06-19 |
| JPH0635181Y2 true JPH0635181Y2 (en) | 1994-09-14 |
Family
ID=31440293
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988159248U Expired - Lifetime JPH0635181Y2 (en) | 1988-12-07 | 1988-12-07 | Ultrasonic probe device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0635181Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016027321A (en) * | 2014-07-03 | 2016-02-18 | Ｊｆｅエンジニアリング株式会社 | Ultrasonic inspection method and probe installation fixture |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5856967U (en) * | 1981-10-12 | 1983-04-18 | 三菱電機株式会社 | Inspection equipment |
| JPS61147964U (en) * | 1985-03-07 | 1986-09-12 |
-
1988
- 1988-12-07 JP JP1988159248U patent/JPH0635181Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0279457U (en) | 1990-06-19 |
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