JPS598195Y2 - Ultrasonic probe device - Google Patents

Description

[Detailed description of the invention] This invention relates to improvement of an ultrasonic probe device.

In general, most ultrasonic probe devices are used to inspect the material to be inspected (hereinafter referred to as the "test material").

) It is necessary to keep the angle of the probe surface constant with respect to the surface.

In addition, when automatically inspecting or measuring (hereinafter referred to as flaw detection) the material to be inspected that is being conveyed by the conveyor line, the ultrasonic probe should be automatically traced to the surface of the material to be inspected. is also required.

A conventional ultrasonic probe device will be described below with reference to the drawings.

FIG. 1 is a diagram for explaining a conventional ultrasonic probe device. In detail, the ultrasonic probe device facing the test material is viewed from above parallel to the flaw detection surface of the test material 1. It is.

In FIG. 1, 1 is a material to be tested, 2 is an ultrasonic probe device, and an ultrasonic probe 3 is a probe in which the ultrasonic probes 3 are wrapped around each other and attached in a staggered manner. a holder 4; a first shaft 5 that connects the probe holder 4 to the first frame 6 so as to be rotatable only in the directions of arrows A and A'; and a second shaft 7 rotatably coupled to the second frames 8, 8 only.

Note that the second frames 8, 8 are connected at the top of the page and are an integral object.

Therefore, the holder 4 is configured to follow the undulations of the flaw detection surface of the test material 1 in any direction by means of the first shaft 5 and the second shaft 7.

FIG. 2 is a drawing of the specimen 1 and probe device 2 shown in FIG. 1 viewed from the direction of arrow C.

However, in FIG. 2, the frame 6 and first shaft 5 of FIG. 1 are located above the plane of the paper and are not shown in the figure.

In FIG. 2, a shoe 9 is provided on the contact surface of the holder 4 with the specimen 1, and the probe device 2 is in contact with the specimen 1 either directly or via a couplant 10.

However, in conventional probe devices, if the surface of the test material is not flat like the surface of the test material 1 in Fig. 2 but rounded,
The surface of the probe 3 facing the material 1 to be tested and the surface of the material 1 to be tested are not parallel, but have a certain angle, and, like the portion D of the couplant 10, Test material 1
The size between the surface of the probe 3 and the surface of the probe 3 increases, and as a result, the flaw detection performance of the probe 3 deteriorates.

The test material with such a roundness is often found at the end of billet material or thick steel plate, and when the integrated holder 4 or shoe 9 contains multiple probes, the test material of the probe device 2 is The area of the surface facing the material 1 increases, making it impossible to follow the roundness of the surface of the material 1 to be inspected.

This invention is intended to improve these problems, and will be explained in detail below with reference to the drawings.

FIG. 3 is a diagram showing the ultrasonic probe device of this invention.
Compared to the probe device shown in FIG. 1, the probe device shown in FIG.
And 3b and holder 4 are not directly coupled, but probes 3a and 3b are each connected to holder 11a.
and holder 11 built in and arranged in parallel.
a and 1lb are connected to shafts 12a and 12b, and the shafts 12a and 12b form ellipses 13a and 12b in the rotational directions of arrows E and E', arrows F and F', respectively, and in the vertical direction perpendicular to the plane of the paper. 13b, they are connected with a degree of freedom in each of the above directions.

By providing the shafts 12a and 12b, the probes 3a and 3b come to follow the surface of the test material 1 and make contact, as shown in FIG. 4, which is a view of FIG. 3 viewed from the direction G. The distance H between the surface of the test material 1 of the medium 10 and each surface of the probes 3a to 3C is easily kept substantially constant.

FIG. 5 is a diagram showing the mounting portions of the shafts 12a and 12b of the holder 4, where the shafts 12a and 12b are attached to an elongated circle 13 provided in the holder 4 and extending in a direction perpendicular to the specimen 1 (not shown). a and 13b, respectively, and arrows E and E', arrows F and F, respectively, as described above.
It is free to rotate in the ' direction, and the ellipses 13a and 1
The probes 3b also have a degree of freedom in the longitudinal direction, and the centers of rotation of the probes 3a and 3b rise upward even when the surface condition of the specimen 1 as shown in FIG. Probe 3C
The state in which only the chisel is lowered, that is, the ellipses 13a and 13b
As shown in FIG. 6, which shows an example of a case where the probes do not have a 3a to 3C can imitate the surface of the test material 1.

Furthermore, when the test material 1 is transported at high speed, the vibration of the test material 1 becomes large, and the probe device 2 cannot trace it simply by its own weight, and it is necessary to apply a separate force in the direction of the test material.

However, as shown in FIG.
are connected to the holder 4 at ellipses 13a and 13b via shafts 12a and 12b, and therefore cannot transmit the above force.

Therefore, as shown in FIG. 7, the probes 3a and 3b are
must be given a force that acts in the same direction as the above force.

In FIG. 7, the axes 11a and 1lb fixed to the probes 3a and 3b form an ellipse 13a as described above.
and 13b (at the top of the paper, not shown), and is connected to the holder 4 through the shafts 11a and 1l.
b is combined with plates H4a and 14b, said plates 14a and 14b are connected to compression springs 15a and 15b.
Further, the compression springs 15a and 15b are deflected in advance, and the play H6a is connected so that the probes 3a and 3b are pressed in the direction of the arrow L.
and 16b, and the above play}16a, 16
b is fixed to the above-mentioned holder 4.

By using a probe device based on this invention, it is possible to accurately trace the probe to the test material with poor surface properties, improving the accuracy of flaw detection, and increasing the pressing force of each probe. By providing this, it is also possible to detect defects in test materials that are transported at high speed and have large vibrations.

Note that the above embodiment describes a case where there are three probes, and one probe in the center does not have an individual copying mechanism, but it is possible to provide a copying mechanism similar to the above,
Furthermore, it goes without saying that even if the number of probes is two or four or more, one or more of the probes is provided with a copying mechanism in the same manner as described above, the same function is obtained.

Furthermore, as a method of applying pressing force in advance, a method using a compression spring is described in detail in this example, but the same effect can be obtained by using a method of applying pressing force in advance using a torsion spring or tension spring. Needless to say, it's something to look forward to.

[Brief explanation of drawings]

Figures 1 and 2 are diagrams showing a conventional ultrasonic probe device, Figures 3 to 6 are diagrams showing one embodiment of this invention, and Figure 7 is another embodiment of this invention. It is a figure which shows an example. In the figure, 1 is the material to be inspected, 2 is the ultrasonic probe device, and 3
and 3a-3b are ultrasound probes, 5, 7 and 12
a, 12 b are shafts, 13 a, 13 b are long holes, 1
5 a and 15b are compression springs. Note that the same or corresponding parts in the figures are indicated by the same reference numerals.

Claims (1)

[Scope of utility model registration request] A plurality of ultrasonic probes are arranged in a staggered manner by wrapping each other, and the entire ultrasonic probe has a degree of freedom with respect to two axes arranged in a direction perpendicular to the direction of movement of the material to be inspected. In an ultrasonic probe device that is configured so that the entire ultrasonic probe traces the surface of the material to be inspected, the ultrasonic probes that are arranged in parallel among the plurality of ultrasonic probes are An ultrasonic probe device characterized in that the ultrasonic probes themselves have a degree of freedom so that the ultrasonic probes themselves arranged in parallel follow the undulations on the surface of the material to be inspected. .