JPS6196453A - Inspecting instrument - Google Patents
Inspecting instrumentInfo
- Publication number
- JPS6196453A JPS6196453A JP59217907A JP21790784A JPS6196453A JP S6196453 A JPS6196453 A JP S6196453A JP 59217907 A JP59217907 A JP 59217907A JP 21790784 A JP21790784 A JP 21790784A JP S6196453 A JPS6196453 A JP S6196453A
- Authority
- JP
- Japan
- Prior art keywords
- sector
- center point
- inspected
- ultrasonic
- ultrasonic wave
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は例えば超音波を用いて被検材中の欠陥や介在
物の有無を検査する検査装置、特にその超音波入射中心
点の位置ずれ防止に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an inspection device that uses ultrasonic waves to inspect the presence or absence of defects or inclusions in a material to be inspected, and particularly to an inspection device that uses ultrasonic waves to inspect the presence or absence of defects or inclusions in a material to be inspected. It is about prevention.
第4図は従来の検査装置を示す斜視図、第5図はその断
面図、第6図は動作を説明するための断面図−Cあり、
(llゆ被検材、(□)は。。被検材(1)K対向する
超音波プローブ、 (31Uこの超音波プローブを保持
するホルダ、(4)はこのホルダに取り付けられかつ被
検材(1)に接触するシューである。また(5)は第1
のジンバルフレーム、(6)はこの第1のジンバルフレ
ームに取り付けられかつホルダ(3)ヲ回転支持する第
1のピン、(7)は第2のジンバルフレーム、(8)は
この第2のジンバルフレームに取り付けられ、かつ第1
のジンバルフレーム(5)ヲ回転支持する第2のピンで
ありジンバル機構を構成している。Fig. 4 is a perspective view showing a conventional inspection device, Fig. 5 is a sectional view thereof, and Fig. 6 is a sectional view -C for explaining the operation.
(ll) Material to be tested, (□). Material to be tested. (1) is the shoe that contacts the first one.
(6) is a first pin that is attached to this first gimbal frame and rotationally supports the holder (3), (7) is a second gimbal frame, (8) is a first pin that is attached to this first gimbal frame, and (8) is a first pin that is attached to this first gimbal frame and rotationally supports the holder (3). attached to the frame and the first
This is the second pin that rotatably supports the gimbal frame (5) and constitutes a gimbal mechanism.
従来の検査装置は上記のように構成され9例えは被検材
(11が搬送されてくると、第2のジンバルフレーム(
7)勿第2のピン(8)とげ、水平かつ直角方向に支持
する検査装置押し付は機構(図示せず)によって、シュ
ー(4)は被検材(1)に接触させられる。The conventional inspection device is configured as described above, and when the material to be inspected (9, for example) is transported, the second gimbal frame (
7) Of course, the second pin (8) is barbed, and the inspection device is supported horizontally and at right angles by a pressing mechanism (not shown), and the shoe (4) is brought into contact with the material to be inspected (1).
被検材(1)に曲が夛等の不整がある場合は、ホルダ(
3)およびシュー(4)が、上記被検材(11の不整に
対し第1のピン(6)とホルダ(3)および、第2のピ
ン(8)と第1のジンバルフレーム(5)との回転動作
さらに。If the material to be inspected (1) has irregularities such as multiple curves, remove the holder (
3) and the shoe (4), the first pin (6) and the holder (3) and the second pin (8) and the first gimbal frame (5) Further rotational movement.
検査装置押し付は機構による上下動作によって倣い、超
音波プローブ(2)が、被検材(1)の表面の法線方向
に一致するようになっている。The inspection device is pressed by a mechanism that moves up and down, so that the ultrasonic probe (2) aligns with the normal direction of the surface of the material to be inspected (1).
上記のような従来の検査装置では9例えば被検材(1)
の左端からLのところに超音波入射中心点Aを定め検査
する場合、第5図に示すように被検材(1)が水平状態
の場合は、第2のピン(8)の回転中心Bと、超音波入
射中心黒人は共に被検材(1)の左端からLの距離のと
ころにあシ所定の検査をすることができるが、第6図に
示すように被検材(11が例えば超音波入射中心点Aま
わシに左方上に傾いた場合には、第2のピン(8)の回
転中心Bは、被検材(1)の左端からLの距離のところ
におるが、超音波入射中心点Aは、第2のピン(8)の
回転中心Bのまわシに回転、左方上Xに移動する。従っ
て超音波入射中心点は水平距離換算でΔLだけ左方に移
動しておシ、被検材(11の左端からLの距離のところ
の検査音することができないという問題点があった。In the conventional inspection device as described above, 9. For example, the material to be inspected (1)
When inspecting by setting the ultrasonic incidence center point A at a distance L from the left end of the pin, if the specimen (1) is in a horizontal state as shown in , and the center of ultrasound incidence can both be placed at a distance of L from the left edge of the specimen (1) to carry out a prescribed inspection. When the ultrasound incidence center point A is tilted upward to the left, the rotation center B of the second pin (8) is located at a distance L from the left end of the test material (1). The ultrasound incidence center point A rotates around the rotation center B of the second pin (8) and moves to the upper left X. Therefore, the ultrasound incidence center point moves to the left by ΔL in terms of horizontal distance. However, there was a problem in that it was not possible to make an inspection sound at a distance L from the left end of the material to be inspected (11).
ここでは第2のピン(8)の回転中心Bのまわりについ
て述べたが、第1のピン(6)の回転についても同様の
問題点があった。Although the description has been made here about the rotation center B of the second pin (8), a similar problem also exists regarding the rotation of the first pin (6).
この発明は、かかる問題点を解決するためになされたも
ので、被検材が例えば超音波入射中心点まわシに傾いた
場合でも、超音波入射中心点が移動せず所定の位置の検
査をすることができる検査装[11−得ることを目的と
する。This invention was made to solve this problem, and even if the material to be inspected is tilted toward the center of ultrasonic wave incidence, the center point of ultrasonic wave incidence does not move and inspection can be performed at a predetermined position. The purpose is to obtain an inspection device [11-] that can be used.
この発明に係る検査装置は、超音波入射中心点を中心に
、超音波プローブを保持するホルダおよびシューが揺動
動作できるように構成した揺動部をフレームに取りつけ
たものでおる。The inspection device according to the present invention has a swinging section attached to a frame so that a holder for holding an ultrasound probe and a shoe can swing around the center point of ultrasound incidence.
〔作用〕。[Effect].
この発明においては、超音波入射中心点と、超音波プロ
ーブの回転中心が一致しているので、被検材が例えば超
音波入射中心点まわシに傾いていても、超音波入射中心
点が移動することがない。In this invention, the ultrasonic incidence center point and the rotation center of the ultrasonic probe coincide, so even if the specimen is tilted toward the ultrasonic incidence center point, the ultrasonic incidence center point will move. There's nothing to do.
第1図はこの発明の一実施例を示す斜視図、第2図はそ
の断面図、第3図は動作を説明するための断面図でろ、
j5.(1)は被検材、(2)〜(4)は上記従来装置
と全く同一のものである。(9)はホルダ(3)全支持
し超音波入射中心点を中心とする円の一部で作られた第
1のセクタ、員はこの第1のセクタを揺動動作させる第
1のセクタガイド、住υは上記第1のセクタガイドa1
に取り付けられ、上記第1のセクタ(9)および第1の
セクタガイド顛による揺動動作方向とは直角方向に揺動
動作しかつ超音波入射中心点を中心とする円の一部で作
られた第2のセクタ、(t2はこの第2のセクタを揺動
動作させる第2のセクタガイドであり、揺動部を構成し
ている。Fig. 1 is a perspective view showing an embodiment of the present invention, Fig. 2 is a sectional view thereof, and Fig. 3 is a sectional view for explaining the operation.
j5. (1) is the material to be tested, and (2) to (4) are exactly the same as the conventional apparatus described above. (9) is a first sector that fully supports the holder (3) and is made of a part of a circle centered on the ultrasonic incidence center point, and member (9) is a first sector guide that swings this first sector. , residence υ is the first sector guide a1 above.
It is attached to the first sector (9) and swings in a direction perpendicular to the swinging direction of the first sector guide frame, and is made of a part of a circle centered on the ultrasonic incident center point. The second sector (t2 is a second sector guide for swinging this second sector, and constitutes a swinging section).
また(I3は第2のセクタガイドfi3’を支持するフ
レームである。Further, (I3 is a frame that supports the second sector guide fi3'.
上記のように構成された検査装置においては。In the inspection device configured as described above.
第1のセクタ(9)および第2のセクタαυとも超音波
入射中心点を中心にもつ円の一部で作られているので、
超音波プローブ(2)、ホルダ+3)およびシュー(4
)は、超音波入射中心点すわりに揺動動作することがで
きるので、被検材(1)の左端からLのところに超音波
入射中心点Avr一定め検査する場合、第2図に示すよ
うに被検材(1)が水平状態でも、第3図に示すように
被検材(1)が例えば超音波入射中心点Atわりに左方
上に傾いた状態においても、超音波プローブ(2)の、
超音波入射中心点Aは移動せずに、被検材(1)の左端
からLのところにあって検査することができる。Since both the first sector (9) and the second sector αυ are made of a part of a circle having the ultrasound incident center point as the center,
Ultrasonic probe (2), holder +3) and shoe (4)
) can swing in place of the center of ultrasonic incidence, so when inspecting the center of ultrasonic wave incidence Avr at a fixed position L from the left end of the material to be inspected (1), as shown in Figure 2. Even when the specimen (1) is horizontal, as shown in Fig. 3, the ultrasound probe (2) of,
The ultrasonic incidence center point A can be inspected at a distance L from the left end of the material to be inspected (1) without moving.
この発明は以上説明したとおシ、超音波スロープが超音
波入射中心点を中心に持つ円の一部で作られたセクタ上
を揺動動作することにより、被検材が傾いた場合でも超
音波入射中心点が位置ずれを起こさないという効果があ
る。As explained above, this invention has the advantage that the ultrasonic slope swings on a sector made of a part of a circle centered on the ultrasonic incident center point, so that even if the specimen is tilted, the ultrasonic wave will not be transmitted. This has the effect that the center of incidence does not shift in position.
第1図はこの発明の一実施例を示す斜視図、第2図はそ
の断面図、第3図は動作を説明するための断面図、第4
図は従来の検査装置の斜視図、第5図はその断面図、第
6図は動作を説明するための断面図である。
図において、(2)は超音波プローブ、(3)はホルダ
。
(4)けシュー、(9)は第1のセクタ、α値は第1の
セクタガイド、αυけ第2のセクタ、 (12は第2の
セクタガイド、α1はフレームである。
なお1図中同一符号は同一または相当部分を示す。Fig. 1 is a perspective view showing an embodiment of the present invention, Fig. 2 is a sectional view thereof, Fig. 3 is a sectional view for explaining the operation, and Fig. 4 is a sectional view showing an embodiment of the present invention.
The figure is a perspective view of a conventional inspection device, FIG. 5 is a sectional view thereof, and FIG. 6 is a sectional view for explaining the operation. In the figure, (2) is an ultrasound probe, and (3) is a holder. (4) Keshu, (9) is the first sector, α value is the first sector guide, αυ is the second sector, (12 is the second sector guide, α1 is the frame. Note that in Figure 1 The same reference numerals indicate the same or equivalent parts.
Claims (1)
を保持するホルダ、このホルダに取り付けられ、上記被
検材に接触するシュー、上記超音波プローブの超音波入
射中心点を中心にもつ円の一部で作られた第1のセクタ
、この第1のセクタを揺動動作させる第1のセクタガイ
ド、上記第1のセクタガイドに取り付けられ、上記第1
のセクタおよび第1のセクタガイドの揺動動作方向とは
直角方向に揺動動作しかつ超音波入射中心点を中心にも
つ円の一部で作られた第2のセクタ、この第2のセクタ
を揺動動作をさせる第2のセクタガイドを備えたことを
特徴とする検査装置。An ultrasonic probe facing the material to be inspected, a holder that holds the ultrasonic probe, a shoe attached to the holder that contacts the material to be inspected, and a circle whose center is the ultrasonic incidence center point of the ultrasonic probe. a first sector made of a part; a first sector guide for swinging the first sector; a first sector guide attached to the first sector guide;
A second sector that swings in a direction perpendicular to the swinging direction of the sector and the first sector guide and is made of a part of a circle having the ultrasound incidence center point as its center. An inspection device comprising a second sector guide that performs a swinging motion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59217907A JPS6196453A (en) | 1984-10-17 | 1984-10-17 | Inspecting instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59217907A JPS6196453A (en) | 1984-10-17 | 1984-10-17 | Inspecting instrument |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6196453A true JPS6196453A (en) | 1986-05-15 |
Family
ID=16711616
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59217907A Pending JPS6196453A (en) | 1984-10-17 | 1984-10-17 | Inspecting instrument |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6196453A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009051241A1 (en) * | 2007-10-19 | 2009-04-23 | Kabushiki Kaisha Toshiba | Profiling apparatus |
WO2009051242A1 (en) | 2007-10-19 | 2009-04-23 | Kabushiki Kaisha Toshiba | Profiling apparatus |
-
1984
- 1984-10-17 JP JP59217907A patent/JPS6196453A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009051241A1 (en) * | 2007-10-19 | 2009-04-23 | Kabushiki Kaisha Toshiba | Profiling apparatus |
WO2009051242A1 (en) | 2007-10-19 | 2009-04-23 | Kabushiki Kaisha Toshiba | Profiling apparatus |
JP2009101428A (en) * | 2007-10-19 | 2009-05-14 | Toshiba Corp | Copying device |
JP2009115782A (en) * | 2007-10-19 | 2009-05-28 | Toshiba Corp | Profiling apparatus |
EP2192406A1 (en) * | 2007-10-19 | 2010-06-02 | Kabushiki Kaisha Toshiba | Profiling apparatus |
EP2192406A4 (en) * | 2007-10-19 | 2011-05-04 | Toshiba Kk | Profiling apparatus |
US7987723B2 (en) | 2007-10-19 | 2011-08-02 | Kabushiki Kaisha Toshiba | Copying apparatus |
KR101147368B1 (en) * | 2007-10-19 | 2012-05-23 | 가부시끼가이샤 도시바 | Profiling apparatus |
US8191422B2 (en) | 2007-10-19 | 2012-06-05 | Kabushiki Kaisha Toshiba | Copying apparatus |
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