JPH06346295A - Plating current controller - Google Patents

Plating current controller

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Publication number
JPH06346295A
JPH06346295A JP14071493A JP14071493A JPH06346295A JP H06346295 A JPH06346295 A JP H06346295A JP 14071493 A JP14071493 A JP 14071493A JP 14071493 A JP14071493 A JP 14071493A JP H06346295 A JPH06346295 A JP H06346295A
Authority
JP
Japan
Prior art keywords
plating
current
total
cell
plating current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14071493A
Other languages
Japanese (ja)
Other versions
JP2757328B2 (en
Inventor
Akihiko Yoshida
昭彦 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP14071493A priority Critical patent/JP2757328B2/en
Publication of JPH06346295A publication Critical patent/JPH06346295A/en
Application granted granted Critical
Publication of JP2757328B2 publication Critical patent/JP2757328B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To enable an optimum plating in accordance with plating conditions by distributing an optimum working load of plating current for the overall plating current to each plating cell. CONSTITUTION:The plating currents to be supplied to plating cells 3a to 3c are detected by current detectors 4a to 4c and added by an adder 8. The difference between the total of the added plating current and a total current refference of a calculating circuit 10 is obtained by an adder 10a, and the current refference distributed based on the difference given by the adder 10a is inputted to working load distribution control circuits 12a to 12c by a PI controller 9. The plating current refference for each plating cell is calculated by the control circuits 12a to 12c based on the set value of the plating current load factor of each plating cell and supplied to distributors 7a to 7c, and a plating current is supplied to the plating cells 3a to 3c through the controller 6a to 6c, rectifiers 5a to 5c and the current detectors 4a to 4c.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は各メッキセルのメッキ
電流の使用負荷バランスを考慮し、メッキ電流密度を所
定範囲内に制御するメッキ電流制御装置に関するもので
ある。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plating current controller for controlling a plating current density within a predetermined range in consideration of a load balance of a plating current of each plating cell.

【0002】[0002]

【従来の技術】従来、この種の制御装置は、各メッキセ
ルの電流負荷バランスを考慮しながら厳密なメッキ電流
密度を制御することなく、もっぱらメッキセルの総合電
流の制御を行うものであった。従来例として特公平1−
48359号公報がある。この公報の要部を示したもの
が図4で、従来のメッキ電流自動制御装置のブロック図
である。
2. Description of the Related Art Heretofore, this type of control device has exclusively controlled the total current of the plating cells without strictly controlling the plating current density while considering the current load balance of each plating cell. As a conventional example, Japanese Patent Publication 1-
There is a 48359 publication. FIG. 4 shows the main part of this publication, and is a block diagram of a conventional plating current automatic control device.

【0003】1は図示矢印方向に進行するメッキ対策の
ストリップ、2はストリップ1のライン速度を検出する
速度検出器、3a〜3cはストリップ1にメッキするメ
ッキセル、4a〜4cはメッキセル3a〜3cに供給さ
れるメッキ電流を検出する電流検出器、5a〜5cはメ
ッキ電流を供給する整流器、6a〜6cは整流器5a〜
5cを介してメッキセル3a〜3cに供給する電流が所
定値となるように制御するコントローラ、7a〜7cは
コントローラ6a〜6cにメッキ電流を分配・供給する
分配器、8は検出器4a〜4cの出力によりメッキ電流
の総和を求める加算器、9はPI(比例、積分)コント
ローラで、出力信号を分配器7a〜7cに供給する。
Reference numeral 1 is a strip as a countermeasure against plating which advances in the direction of the arrow in the figure, 2 is a speed detector for detecting the line speed of the strip 1, 3a to 3c are plating cells for plating the strip 1, and 4a to 4c are plating cells 3a to 3c. A current detector for detecting the supplied plating current, 5a to 5c are rectifiers for supplying the plating current, and 6a to 6c are rectifiers 5a to
A controller that controls the current supplied to the plating cells 3a to 3c via 5c to a predetermined value, 7a to 7c are distributors that distribute and supply the plating current to the controllers 6a to 6c, and 8 is a detector 4a to 4c. An adder 9 for obtaining the sum of the plating currents by the output, and a PI (proportional, integral) controller 9 supplies the output signals to the distributors 7a to 7c.

【0004】10は計算回路であり、速度検出器2を介
して得るストリップ1のライン速度と、電流基準との差
を求め加算器10aに供給する。加算器10aは加算器
8のメッキ電流の総和と計算回路10の出力との差を求
め、PIコントローラ9に供給する。11は目付量、板
幅、電極効率及びライン速度から総合電流基準を計算
し、これを計算回路10に供給する電流基準回路であ
る。
Reference numeral 10 is a calculation circuit, which finds the difference between the line speed of the strip 1 obtained through the speed detector 2 and the current reference and supplies it to the adder 10a. The adder 10 a obtains the difference between the sum of the plating currents of the adder 8 and the output of the calculation circuit 10 and supplies the difference to the PI controller 9. Reference numeral 11 is a current reference circuit that calculates a total current reference from the basis weight, plate width, electrode efficiency and line speed, and supplies this to the calculation circuit 10.

【0005】次に動作について説明する。各メッキセル
3a〜3cに供給されるメッキ電流は電流検出器4a〜
4cにより検出され、加算器8で加算される。これによ
り求められたメッキ電流の総和は、加算器10aにより
計算回路10の総合電流基準との差が求められ、PIコ
ントローラ9に供給される。PIコントローラ9は加算
器10aから与えられる差に基づき分配された電流基準
を分配器7a〜7cに供給する。分配器7a〜7cはメ
ッキ電流を各コントローラ6a〜6c、整流器5a〜5
c及び電流検出器4a〜4cを介してメッキセル3a〜
3cに供給する。
Next, the operation will be described. The plating current supplied to each of the plating cells 3a to 3c is the current detector 4a to
4c, and the adder 8 adds them. The sum of the plating currents thus obtained is calculated by the adder 10a as a difference from the total current reference of the calculation circuit 10, and is supplied to the PI controller 9. The PI controller 9 supplies the current reference distributed based on the difference given from the adder 10a to the distributors 7a to 7c. The distributors 7a to 7c distribute the plating current to the controllers 6a to 6c and the rectifiers 5a to 5c.
c and the current detectors 4a to 4c, the plating cells 3a to
Supply to 3c.

【0006】速度検出器2によって検出されたストリッ
プ1のライン速度は、計算回路10に入力され、計算回
路10はこのライン速度の増減に従い電流基準回路11
により設定された総合電流基準を増減させる。例えばラ
イン速度が増大したときは、総合電流基準は増加され
る。
The line speed of the strip 1 detected by the speed detector 2 is input to the calculation circuit 10, and the calculation circuit 10 increases or decreases the line speed and the current reference circuit 11 increases.
The total current reference set by is increased or decreased. For example, when line speed increases, the total current reference is increased.

【0007】なお、このライン速度と電流基準の関係は
数1で表される。 ΣI:総合電流基準(A),F:ファラデー定数(C/
F),C:目付量(g/m2)g:板幅(mm),V:
ライン速度(mpm),G:Deposit Rati
o(g/F),η:メッキ効率(%)
The relationship between the line speed and the current reference is expressed by equation 1. ΣI: Total current reference (A), F: Faraday constant (C /
F), C: basis weight (g / m 2 ) g: plate width (mm), V:
Line speed (mpm), G: Deposit Rati
o (g / F), η: Plating efficiency (%)

【0008】[0008]

【数1】 [Equation 1]

【0009】[0009]

【発明が解決しようとする課題】従来の制御装置は以上
のように構成されているので、目付量、板幅、電極効率
及びライン速度等のメッキ条件が変化した場合、例え
ば、各メッキセルの濃度の違いや後段側のメッキセルで
のメッキを薄くしてメッキ具合を良くする等の場合、各
メッキセルのメッキ電流の使用負荷率を設定することが
できないので、各メッキセルの電流負荷バランスを考慮
しながら、メッキ電流密度を所定範囲内に制御すること
が困難であるという問題点があった。
Since the conventional control device is constructed as described above, when the plating conditions such as the basis weight, plate width, electrode efficiency and line speed are changed, for example, the concentration of each plating cell is changed. However, if you want to improve the plating condition by thinning the plating in the plating cell on the subsequent stage side and improving the plating condition, it is not possible to set the usage load factor of the plating current of each plating cell, so consider the current load balance of each plating cell. However, it is difficult to control the plating current density within a predetermined range.

【0010】この発明は上記のような課題を解決するた
めになされたものであり、各メッキセルのメッキ電流の
メッキ総合電流に対する最適な使用負荷分担を決定する
と共に、各メッキセルの電流密度を所定範囲となるよう
に制御するメッキ電流制御装置を得ることを目的とす
る。また、各メッキセルの使用、不使用に応じて使用負
荷分担を補正するメッキ電流制御装置を得ることを目的
とする。また、メッキ付着量のフィードバックにより最
適なメッキ付着量を確保するメッキ電流制御装置を得る
ことを目的とする。
The present invention has been made in order to solve the above problems, and determines the optimum load sharing of the plating current of each plating cell with respect to the total plating current, and also determines the current density of each plating cell within a predetermined range. It is an object of the present invention to obtain a plating current control device that controls so that Another object of the present invention is to obtain a plating current control device that corrects the usage load share depending on the use or non-use of each plating cell. It is another object of the present invention to obtain a plating current control device that secures an optimum plating adhesion amount by feeding back the plating adhesion amount.

【0011】[0011]

【課題を解決するための手段】この発明に係るメッキ電
流制御装置は、複数のメッキセルに供給されるメッキ電
流の総和と、被メッキ材の送り速度に対応して所定範囲
のメッキ電流密度を得るように設定された総合電流基準
とを比較した結果に従い、各メッキセルのメッキ電流を
制御するメッキ電流制御装置において、各メッキセルの
メッキ電流とメッキ総合電流との比として予め決められ
た使用負荷分担に応じて、上記メッキ電流の総和と総合
電流基準との比較結果から各メッキセルのメッキ電流を
演算し、この演算結果によってメッキ電流を制御する使
用負荷分担手段を備えたものである。
A plating current controller according to the present invention obtains a plating current density within a predetermined range corresponding to the sum of plating currents supplied to a plurality of plating cells and the feed speed of a material to be plated. According to the result of comparison with the total current standard set as described above, in the plating current control device that controls the plating current of each plating cell, the load distribution predetermined as the ratio of the plating current of each plating cell to the total plating current is used. Accordingly, a load sharing means is provided for calculating the plating current of each plating cell from the result of comparison between the sum of the plating currents and the total current reference, and controlling the plating current based on the result of the calculation.

【0012】また、各メッキセルの使用・不使用に応じ
て上記使用負荷分担を補正する使用負荷分担補正手段を
備えたものである。
Further, there is provided a use load share correction means for correcting the use load share according to use / non-use of each plating cell.

【0013】また、メッキ付着量検出手段と、この検出
したメッキ付着量および被メッキ材の送り速度から補正
に必要な電流値を演算し、この演算結果で総合電流基準
を補正するメッキ付着量補正手段を備えたものである。
Further, a plating amount detecting means and a current value necessary for correction are calculated from the detected plating amount and the feed speed of the material to be plated, and the total amount of current is corrected based on the calculation result. It is equipped with means.

【0014】[0014]

【作用】この発明のメッキ電流制御装置は、複数のメッ
キセルに供給されるメッキ電流の総和と、メッキされる
被メッキ材の送り速度に対応して所定範囲のメッキ電流
密度を得るように設定された総合電流基準とを比較した
比較結果を、各メッキセルのメッキ電流とメッキ総合電
流との比として予め決められた使用負荷分担によって、
各メッキセルのメッキ電流を演算して、この演算結果で
メッキ電流を制御する。
The plating current control device of the present invention is set so as to obtain a plating current density within a predetermined range in accordance with the sum of the plating currents supplied to the plurality of plating cells and the feeding speed of the material to be plated. By comparing the result of comparison with the total current standard, which is determined as the ratio of the plating current of each plating cell to the total plating current,
The plating current of each plating cell is calculated, and the plating current is controlled by the calculation result.

【0015】また、各メッキセルの使用・不使用に応じ
て上記使用負荷分担を補正する。
Further, the usage load sharing is corrected according to the use / non-use of each plating cell.

【0016】また、検出したメッキ付着量と被メッキ材
の送り速度から補正に必要な電流値を演算し、この演算
結果で総合電流基準を補正する。
Further, a current value required for correction is calculated from the detected plating adhesion amount and the feed speed of the material to be plated, and the total current reference is corrected by the calculation result.

【0017】[0017]

【実施例】【Example】

実施例1.以下、この発明の実施例1を図1に基づいて
説明する。図において、1〜11は従来のものと同等で
説明を省略する。12a〜12cは予め決められた各メ
ッキセルのメッキ電流の使用負荷率に従い、メッキ総合
電流に対する使用負荷分担を行う制御回路である。
Example 1. Hereinafter, Embodiment 1 of the present invention will be described with reference to FIG. In the figure, 1 to 11 are the same as the conventional ones and their explanations are omitted. Reference numerals 12a to 12c are control circuits that carry out the use load share of the total plating current according to the use load ratio of the plating current of each plating cell determined in advance.

【0018】次に動作について説明する。各メッキセル
3a〜3cに供給されるメッキ電流は電流検出器4a〜
4cにより検出され、加算器8で加算される。これによ
り求められたメッキ電流の総和は、加算器10aにより
計算回路10の総合電流基準との差が求められ、PIコ
ントローラ9に供給される。PIコントローラ9は加算
器10aから与えられる差に基づき分配された電流基準
を使用負荷分担制御回路12a〜12cに入力する。
Next, the operation will be described. The plating current supplied to each of the plating cells 3a to 3c is the current detector 4a to
4c, and the adder 8 adds them. The sum of the plating currents thus obtained is calculated by the adder 10a as a difference from the total current reference of the calculation circuit 10, and is supplied to the PI controller 9. The PI controller 9 inputs the current reference distributed based on the difference given from the adder 10a to the working load sharing control circuits 12a to 12c.

【0019】使用負荷分担制御回路12a〜12cは、
各メッキセルのメッキ電流の使用負荷率の設定値に従
い、各メッキセルのメッキ電流基準を演算し、分配器7
a〜7cに供給する。分配器7a〜7cはメッキ電流を
各コントローラ6a〜6c、整流器5a〜5c及び電流
検出器4a〜4cを介してメッキセル3a〜3cに供給
する。
The use load sharing control circuits 12a-12c are
The plating current reference of each plating cell is calculated according to the set value of the usage load factor of the plating current of each plating cell, and the distributor 7
a to 7c. The distributors 7a to 7c supply the plating current to the plating cells 3a to 3c via the controllers 6a to 6c, the rectifiers 5a to 5c and the current detectors 4a to 4c.

【0020】ここで使用負荷分担制御回路12a〜12
cは、下記の式、即ち、数2で表される式に基づき演算
し、各メッキセルの電流基準(Ij)を決定する。各メ
ッキセルの電流基準(Ij)=(総合電流基準)・(各
メッキセルの負荷分担率)
Here, the load sharing control circuits 12a-12 are used.
c is calculated based on the following formula, that is, the formula represented by Formula 2, and the current reference (Ij) of each plating cell is determined. Current standard of each plating cell (Ij) = (Comprehensive current standard)-(Load sharing rate of each plating cell)

【0021】[0021]

【数2】 [Equation 2]

【0022】実施例2.実施例1では、使用負荷分担制
御回路12a〜12cにより各メッキセルのメッキ電流
基準を演算する場合について述べたが、図2に示すよう
に、各メッキセルの使用、不使用に応じて使用負荷分担
を補正する使用負荷分担補正回路13を追加し、この補
正出力で使用負荷分担制御回路12a〜12cの出力を
補正する。従って、各メッキセルの整流器5a,5b,
5cを入、切した場合でも最適なメッキ付着量を確保す
ることができる。
Example 2. In the first embodiment, the case where the plating current reference of each plating cell is calculated by the usage load sharing control circuits 12a to 12c has been described. However, as shown in FIG. 2, the usage load sharing is performed depending on whether each plating cell is used or not. A use load sharing correction circuit 13 for correction is added, and the outputs of the use load sharing control circuits 12a to 12c are corrected by this correction output. Therefore, the rectifiers 5a, 5b of each plating cell,
Even if 5c is turned on and off, the optimum amount of deposited plating can be secured.

【0023】実施例3.また、図3に示すように、メッ
キ付着量を検出する検出装置14と、この検出されたメ
ッキ付着量のフィードバック値とライン速度検出器2か
らの速度フィードバック値より補正に必要な総合電流値
を算出するメッキ付着量補正回路15と、加算器16を
設け、メッキ付着量のフィードバック信号によりメッキ
総合電流基準を補正する。この補正により、目付量、板
幅、電極効率及びライン速度等のメッキ諸条件の変化に
対しても最適なメッキ付着量を確保することができる。
Example 3. Further, as shown in FIG. 3, a detection device 14 for detecting the plating adhesion amount, a feedback value of the detected plating adhesion amount and a speed feedback value from the line speed detector 2 are used to calculate a total current value necessary for correction. A plating adhesion amount correction circuit 15 for calculating and an adder 16 are provided, and the plating total current reference is corrected by a feedback signal of the plating adhesion amount. With this correction, it is possible to secure the optimum amount of deposited plating even with changes in various plating conditions such as the basis weight, plate width, electrode efficiency and line speed.

【0024】実施例4.実施例2の使用負荷分担補正回
路13によるメッキセルの使用、不使用による補正と、
実施例3のメッキ付着量のフィードバックによる補正と
の両者を併用してもよい。
Example 4. Correction by use or non-use of the plating cell by the use load sharing correction circuit 13 of the second embodiment,
It is also possible to use both the correction and the correction by the feedback of the plating adhesion amount of the third embodiment.

【0025】[0025]

【発明の効果】以上のように、この発明によれば、各メ
ッキセル毎にメッキ電流の使用負荷率を設定できるよう
にしたので、メッキ溶液の濃度等メッキ諸条件に応じた
メッキ電流が設定でき、最適なメッキ付着量を確保でき
る効果がある。
As described above, according to the present invention, since the use load factor of the plating current can be set for each plating cell, the plating current can be set according to various plating conditions such as the concentration of the plating solution. There is an effect that the optimum amount of plating adhesion can be secured.

【0026】また、各メッキセルの使用・不使用に応じ
て使用負荷分担を補正するようにしたので、更に良好な
メッキが得られる効果がある。
Further, since the sharing of the usage load is corrected depending on the use / non-use of each plating cell, there is an effect that a better plating can be obtained.

【0027】また、検出したメッキ付着量と被メッキ材
の送り速度から補正に必要な電流値を演算し、この演算
結果で総合電流基準を補正するようにしたので、更に良
好なメッキが得られる効果がある。
Further, a current value required for correction is calculated from the detected amount of adhered plating and the feed speed of the material to be plated, and the total current reference is corrected based on this calculation result, so that better plating can be obtained. effective.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の実施例1のメッキ電流制御装置を示
すブロック図である。
FIG. 1 is a block diagram showing a plating current control device according to a first embodiment of the present invention.

【図2】この発明の実施例2のメッキ電流制御装置を示
すブロック図である。
FIG. 2 is a block diagram showing a plating current control device according to a second embodiment of the present invention.

【図3】この発明の実施例3のメッキ電流制御装置を示
すブロック図である。
FIG. 3 is a block diagram showing a plating current control device according to a third embodiment of the present invention.

【図4】従来のメッキ電流制御装置を示すブロック図で
ある。
FIG. 4 is a block diagram showing a conventional plating current control device.

【符号の説明】[Explanation of symbols]

1 ストリップ 2 速度検出器 3a,3b,3c メッキセル 4a,4b,4c 電流検出器 5a,5b,5c 整流器 6a,6b,6c コントローラ 7a,7b,7c 分配器 8 加算器 9 PIコントローラ 10 計算回路 10a 加算器 11 電流基準回路 12a,12b,12c 使用負荷分担制御回路 13 使用負荷分担補正回路 14 メッキ付着量検出装置 15 メッキ付着量補正回路 16 加算器 1 strip 2 speed detector 3a, 3b, 3c plating cell 4a, 4b, 4c current detector 5a, 5b, 5c rectifier 6a, 6b, 6c controller 7a, 7b, 7c distributor 8 adder 9 PI controller 10 calculation circuit 10a addition Device 11 Current reference circuit 12a, 12b, 12c Working load sharing control circuit 13 Working load sharing correction circuit 14 Plating adhesion amount detection device 15 Plating adhesion amount correction circuit 16 Adder

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 複数のメッキセルに供給されるメッキ電
流の総和と、被メッキ材の送り速度に対応して所定範囲
のメッキ電流密度を得るように設定された総合電流基準
とを比較した結果に従い、各メッキセルのメッキ電流を
制御するメッキ電流制御装置において、各メッキセルの
メッキ電流とメッキ総合電流との比として予め決められ
た使用負荷分担に応じて、上記メッキ電流の総和と総合
電流基準との比較結果から各メッキセルのメッキ電流を
演算し、この演算結果によってメッキ電流を制御する使
用負荷分担手段を備えたことを特徴とするメッキ電流制
御装置。
1. According to a result of comparing a total sum of plating currents supplied to a plurality of plating cells and a comprehensive current reference set so as to obtain a plating current density in a predetermined range corresponding to a feed speed of a material to be plated. In the plating current control device for controlling the plating current of each plating cell, the total of the above plating current and the total current reference are calculated according to the load distribution predetermined as the ratio between the plating current of each plating cell and the total plating current. A plating current control device comprising a load sharing means for calculating a plating current of each plating cell from the comparison result and controlling the plating current according to the calculation result.
【請求項2】 複数のメッキセルに供給されるメッキ電
流の総和と、被メッキ材の送り速度に対応して所定範囲
のメッキ電流密度を得るように設定された総合電流基準
とを比較した結果に従い、各メッキセルのメッキ電流を
制御するメッキ電流制御装置において、各メッキセルの
メッキ電流とメッキ総合電流との比として予め決められ
た使用負荷分担に応じて、上記メッキ電流の総和と総合
電流基準との比較結果から各メッキセルのメッキ電流を
演算し、この演算結果によってメッキ電流を制御する使
用負荷分担手段、およびこの使用負荷分担手段を各メッ
キセルの使用・不使用に応じて補正する使用負荷分担補
正手段を備えたことを特徴とするメッキ電流制御装置。
2. According to a result of comparing a total sum of plating currents supplied to a plurality of plating cells and a total current reference set so as to obtain a plating current density within a predetermined range corresponding to a feed speed of a material to be plated. In the plating current control device for controlling the plating current of each plating cell, the total of the above plating current and the total current reference are calculated according to the load distribution predetermined as the ratio between the plating current of each plating cell and the total plating current. The load current sharing means for calculating the plating current of each plating cell from the comparison result, and controlling the plating current according to the result of the calculation, and the load sharing correction means for correcting the load sharing means according to the use / non-use of each plating cell A plating current control device comprising:
【請求項3】 メッキ付着量検出手段と、このメッキ付
着量検出手段によって検出したメッキ付着量および被メ
ッキ材の送り速度から補正に必要な電流値を演算し、こ
の演算結果によって総合電流基準を補正するメッキ付着
量補正手段を備えたことを特徴とする請求項1項または
2項記載のメッキ電流制御装置。
3. A plating adhesion amount detecting means, a current value necessary for correction is calculated from the plating adhesion amount detected by the plating adhesion amount detecting means and a feed speed of a material to be plated, and a total current reference is obtained by the calculation result. 3. The plating current control device according to claim 1, further comprising a plating adhesion amount correction means for correcting.
JP14071493A 1993-06-11 1993-06-11 Plating current control device Expired - Fee Related JP2757328B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14071493A JP2757328B2 (en) 1993-06-11 1993-06-11 Plating current control device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14071493A JP2757328B2 (en) 1993-06-11 1993-06-11 Plating current control device

Publications (2)

Publication Number Publication Date
JPH06346295A true JPH06346295A (en) 1994-12-20
JP2757328B2 JP2757328B2 (en) 1998-05-25

Family

ID=15275010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14071493A Expired - Fee Related JP2757328B2 (en) 1993-06-11 1993-06-11 Plating current control device

Country Status (1)

Country Link
JP (1) JP2757328B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7563352B2 (en) 2001-10-27 2009-07-21 Atotech Deutschland Gmbh Method and conveyorized system for electorlytically processing work pieces

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7563352B2 (en) 2001-10-27 2009-07-21 Atotech Deutschland Gmbh Method and conveyorized system for electorlytically processing work pieces

Also Published As

Publication number Publication date
JP2757328B2 (en) 1998-05-25

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