JPH0633429Y2 - 電子装置用温度試験装置 - Google Patents
電子装置用温度試験装置Info
- Publication number
- JPH0633429Y2 JPH0633429Y2 JP6644386U JP6644386U JPH0633429Y2 JP H0633429 Y2 JPH0633429 Y2 JP H0633429Y2 JP 6644386 U JP6644386 U JP 6644386U JP 6644386 U JP6644386 U JP 6644386U JP H0633429 Y2 JPH0633429 Y2 JP H0633429Y2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- air
- electronic device
- unit
- nozzle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6644386U JPH0633429Y2 (ja) | 1986-05-01 | 1986-05-01 | 電子装置用温度試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6644386U JPH0633429Y2 (ja) | 1986-05-01 | 1986-05-01 | 電子装置用温度試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62178380U JPS62178380U (US20030204162A1-20031030-M00001.png) | 1987-11-12 |
JPH0633429Y2 true JPH0633429Y2 (ja) | 1994-08-31 |
Family
ID=30904454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6644386U Expired - Lifetime JPH0633429Y2 (ja) | 1986-05-01 | 1986-05-01 | 電子装置用温度試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0633429Y2 (US20030204162A1-20031030-M00001.png) |
-
1986
- 1986-05-01 JP JP6644386U patent/JPH0633429Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS62178380U (US20030204162A1-20031030-M00001.png) | 1987-11-12 |
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