JPH0624779Y2 - 位相雑音測定装置 - Google Patents

位相雑音測定装置

Info

Publication number
JPH0624779Y2
JPH0624779Y2 JP14321486U JP14321486U JPH0624779Y2 JP H0624779 Y2 JPH0624779 Y2 JP H0624779Y2 JP 14321486 U JP14321486 U JP 14321486U JP 14321486 U JP14321486 U JP 14321486U JP H0624779 Y2 JPH0624779 Y2 JP H0624779Y2
Authority
JP
Japan
Prior art keywords
frequency
signal
phase noise
local oscillator
filter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14321486U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6350068U (OSRAM
Inventor
武則 栗原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP14321486U priority Critical patent/JPH0624779Y2/ja
Publication of JPS6350068U publication Critical patent/JPS6350068U/ja
Application granted granted Critical
Publication of JPH0624779Y2 publication Critical patent/JPH0624779Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP14321486U 1986-09-18 1986-09-18 位相雑音測定装置 Expired - Lifetime JPH0624779Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14321486U JPH0624779Y2 (ja) 1986-09-18 1986-09-18 位相雑音測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14321486U JPH0624779Y2 (ja) 1986-09-18 1986-09-18 位相雑音測定装置

Publications (2)

Publication Number Publication Date
JPS6350068U JPS6350068U (OSRAM) 1988-04-05
JPH0624779Y2 true JPH0624779Y2 (ja) 1994-06-29

Family

ID=31052683

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14321486U Expired - Lifetime JPH0624779Y2 (ja) 1986-09-18 1986-09-18 位相雑音測定装置

Country Status (1)

Country Link
JP (1) JPH0624779Y2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10090939B2 (en) 2016-08-25 2018-10-02 Infineon Technologies Ag Integrated RF circuit with phase-noise test capability

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10090939B2 (en) 2016-08-25 2018-10-02 Infineon Technologies Ag Integrated RF circuit with phase-noise test capability
US10205541B2 (en) 2016-08-25 2019-02-12 Infineon Technologies Ag Integrated RF circuit with phase-noise test capability

Also Published As

Publication number Publication date
JPS6350068U (OSRAM) 1988-04-05

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