JPS6350068U - - Google Patents

Info

Publication number
JPS6350068U
JPS6350068U JP14321486U JP14321486U JPS6350068U JP S6350068 U JPS6350068 U JP S6350068U JP 14321486 U JP14321486 U JP 14321486U JP 14321486 U JP14321486 U JP 14321486U JP S6350068 U JPS6350068 U JP S6350068U
Authority
JP
Japan
Prior art keywords
signal
output signal
frequency
mixer
phase noise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14321486U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0624779Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14321486U priority Critical patent/JPH0624779Y2/ja
Publication of JPS6350068U publication Critical patent/JPS6350068U/ja
Application granted granted Critical
Publication of JPH0624779Y2 publication Critical patent/JPH0624779Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP14321486U 1986-09-18 1986-09-18 位相雑音測定装置 Expired - Lifetime JPH0624779Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14321486U JPH0624779Y2 (ja) 1986-09-18 1986-09-18 位相雑音測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14321486U JPH0624779Y2 (ja) 1986-09-18 1986-09-18 位相雑音測定装置

Publications (2)

Publication Number Publication Date
JPS6350068U true JPS6350068U (OSRAM) 1988-04-05
JPH0624779Y2 JPH0624779Y2 (ja) 1994-06-29

Family

ID=31052683

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14321486U Expired - Lifetime JPH0624779Y2 (ja) 1986-09-18 1986-09-18 位相雑音測定装置

Country Status (1)

Country Link
JP (1) JPH0624779Y2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018044951A (ja) * 2016-08-25 2018-03-22 インフィネオン テクノロジーズ アーゲーＩｎｆｉｎｅｏｎ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ａｇ 位相雑音試験能力を備えた集積ｒｆ回路

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018044951A (ja) * 2016-08-25 2018-03-22 インフィネオン テクノロジーズ アーゲーＩｎｆｉｎｅｏｎ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ａｇ 位相雑音試験能力を備えた集積ｒｆ回路
US10090939B2 (en) 2016-08-25 2018-10-02 Infineon Technologies Ag Integrated RF circuit with phase-noise test capability
US10205541B2 (en) 2016-08-25 2019-02-12 Infineon Technologies Ag Integrated RF circuit with phase-noise test capability

Also Published As

Publication number Publication date
JPH0624779Y2 (ja) 1994-06-29

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