JPH0587008B2 - - Google Patents
Info
- Publication number
- JPH0587008B2 JPH0587008B2 JP61032742A JP3274286A JPH0587008B2 JP H0587008 B2 JPH0587008 B2 JP H0587008B2 JP 61032742 A JP61032742 A JP 61032742A JP 3274286 A JP3274286 A JP 3274286A JP H0587008 B2 JPH0587008 B2 JP H0587008B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- mask
- mounting table
- groove
- grooves
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 claims description 25
- 239000000565 sealant Substances 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 description 4
- 238000007639 printing Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61032742A JPS62193119A (ja) | 1986-02-19 | 1986-02-19 | ウエハ密着方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61032742A JPS62193119A (ja) | 1986-02-19 | 1986-02-19 | ウエハ密着方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62193119A JPS62193119A (ja) | 1987-08-25 |
| JPH0587008B2 true JPH0587008B2 (enrdf_load_stackoverflow) | 1993-12-15 |
Family
ID=12367289
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61032742A Granted JPS62193119A (ja) | 1986-02-19 | 1986-02-19 | ウエハ密着方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62193119A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9557659B2 (en) | 2013-10-23 | 2017-01-31 | Canon Kabushiki Kaisha | Lithography apparatus, determination method, and method of manufacturing article |
-
1986
- 1986-02-19 JP JP61032742A patent/JPS62193119A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9557659B2 (en) | 2013-10-23 | 2017-01-31 | Canon Kabushiki Kaisha | Lithography apparatus, determination method, and method of manufacturing article |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62193119A (ja) | 1987-08-25 |
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