JPH058396B2 - - Google Patents

Info

Publication number
JPH058396B2
JPH058396B2 JP6467084A JP6467084A JPH058396B2 JP H058396 B2 JPH058396 B2 JP H058396B2 JP 6467084 A JP6467084 A JP 6467084A JP 6467084 A JP6467084 A JP 6467084A JP H058396 B2 JPH058396 B2 JP H058396B2
Authority
JP
Japan
Prior art keywords
hgi
radiation
electrodes
electrode
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP6467084A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60209196A (ja
Inventor
Yoshihiko Kumazawa
Juichiro Nishina
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP6467084A priority Critical patent/JPS60209196A/ja
Publication of JPS60209196A publication Critical patent/JPS60209196A/ja
Publication of JPH058396B2 publication Critical patent/JPH058396B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP6467084A 1984-03-31 1984-03-31 半導体放射線検出器 Granted JPS60209196A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6467084A JPS60209196A (ja) 1984-03-31 1984-03-31 半導体放射線検出器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6467084A JPS60209196A (ja) 1984-03-31 1984-03-31 半導体放射線検出器

Publications (2)

Publication Number Publication Date
JPS60209196A JPS60209196A (ja) 1985-10-21
JPH058396B2 true JPH058396B2 (OSRAM) 1993-02-02

Family

ID=13264849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6467084A Granted JPS60209196A (ja) 1984-03-31 1984-03-31 半導体放射線検出器

Country Status (1)

Country Link
JP (1) JPS60209196A (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11234747B2 (en) 2015-02-25 2022-02-01 National University Corporation Tokyo Medical And Dental University Medical device, device structures for dentistry, for head and neck surgery and for orthopedic surgery, and method for bonding medical device to bone

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7741610B2 (en) * 2007-11-01 2010-06-22 Oy Ajat Ltd. CdTe/CdZnTe radiation imaging detector and high/biasing voltage means

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11234747B2 (en) 2015-02-25 2022-02-01 National University Corporation Tokyo Medical And Dental University Medical device, device structures for dentistry, for head and neck surgery and for orthopedic surgery, and method for bonding medical device to bone

Also Published As

Publication number Publication date
JPS60209196A (ja) 1985-10-21

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