JPH0580983B2 - - Google Patents

Info

Publication number
JPH0580983B2
JPH0580983B2 JP61213346A JP21334686A JPH0580983B2 JP H0580983 B2 JPH0580983 B2 JP H0580983B2 JP 61213346 A JP61213346 A JP 61213346A JP 21334686 A JP21334686 A JP 21334686A JP H0580983 B2 JPH0580983 B2 JP H0580983B2
Authority
JP
Japan
Prior art keywords
master
spindle motor
master disc
defect
disc
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP61213346A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6367550A (ja
Inventor
Kazumi Kuryama
Yutaka Takasu
Shigeru Kono
Chiharu Koshio
Kazuhiko Osada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Video Corp
Pioneer Corp
Original Assignee
Pioneer Video Corp
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Video Corp, Pioneer Electronic Corp filed Critical Pioneer Video Corp
Priority to JP21334686A priority Critical patent/JPS6367550A/ja
Publication of JPS6367550A publication Critical patent/JPS6367550A/ja
Publication of JPH0580983B2 publication Critical patent/JPH0580983B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP21334686A 1986-09-10 1986-09-10 情報記録原盤の欠陥検査装置 Granted JPS6367550A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21334686A JPS6367550A (ja) 1986-09-10 1986-09-10 情報記録原盤の欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21334686A JPS6367550A (ja) 1986-09-10 1986-09-10 情報記録原盤の欠陥検査装置

Publications (2)

Publication Number Publication Date
JPS6367550A JPS6367550A (ja) 1988-03-26
JPH0580983B2 true JPH0580983B2 (de) 1993-11-11

Family

ID=16637634

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21334686A Granted JPS6367550A (ja) 1986-09-10 1986-09-10 情報記録原盤の欠陥検査装置

Country Status (1)

Country Link
JP (1) JPS6367550A (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01262445A (ja) * 1988-04-13 1989-10-19 Toshiba Corp 表面検査装置
JPH0283404A (ja) * 1988-09-21 1990-03-23 Anritsu Corp 平坦度測定方法
DE19904427B4 (de) * 1999-02-04 2004-12-16 Basler Ag Verfahren zum Prüfen von rotationssymmetrischen Gegenständen
JP2011106815A (ja) * 2009-11-12 2011-06-02 Arc Harima Kk 表面検査方法および表面検査装置
JP6145970B2 (ja) * 2012-06-28 2017-06-14 株式会社大林組 表面粗さ計測装置及び計測方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57161641A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for defect of surface

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55103854U (de) * 1979-01-10 1980-07-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57161641A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for defect of surface

Also Published As

Publication number Publication date
JPS6367550A (ja) 1988-03-26

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees