JPH0565968B2 - - Google Patents
Info
- Publication number
- JPH0565968B2 JPH0565968B2 JP61220847A JP22084786A JPH0565968B2 JP H0565968 B2 JPH0565968 B2 JP H0565968B2 JP 61220847 A JP61220847 A JP 61220847A JP 22084786 A JP22084786 A JP 22084786A JP H0565968 B2 JPH0565968 B2 JP H0565968B2
- Authority
- JP
- Japan
- Prior art keywords
- grid
- analysis
- objective lens
- electron beam
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61220847A JPS6378444A (ja) | 1986-09-20 | 1986-09-20 | 電子ビ−ム装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61220847A JPS6378444A (ja) | 1986-09-20 | 1986-09-20 | 電子ビ−ム装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6378444A JPS6378444A (ja) | 1988-04-08 |
JPH0565968B2 true JPH0565968B2 (enrdf_load_stackoverflow) | 1993-09-20 |
Family
ID=16757473
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61220847A Granted JPS6378444A (ja) | 1986-09-20 | 1986-09-20 | 電子ビ−ム装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6378444A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07161329A (ja) * | 1993-12-07 | 1995-06-23 | Fujitsu Ltd | 電子ビーム装置 |
-
1986
- 1986-09-20 JP JP61220847A patent/JPS6378444A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6378444A (ja) | 1988-04-08 |
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