JPH0557536B2 - - Google Patents

Info

Publication number
JPH0557536B2
JPH0557536B2 JP59017218A JP1721884A JPH0557536B2 JP H0557536 B2 JPH0557536 B2 JP H0557536B2 JP 59017218 A JP59017218 A JP 59017218A JP 1721884 A JP1721884 A JP 1721884A JP H0557536 B2 JPH0557536 B2 JP H0557536B2
Authority
JP
Japan
Prior art keywords
crystal
concave surface
jig
spherical concave
slice
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59017218A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59153152A (ja
Inventor
Buroeru Heeruto
Fuijingu Aruberuto
Adorianusu Maria Ond Antoniusu
Furantsu Karoru Sheisen Yosefu
Petorusu Antoniusu Fu Mashiasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV, Koninklijke Philips Electronics NV filed Critical Philips Gloeilampenfabrieken NV
Publication of JPS59153152A publication Critical patent/JPS59153152A/ja
Publication of JPH0557536B2 publication Critical patent/JPH0557536B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP59017218A 1983-02-04 1984-02-03 二重収束ｘ線分光結晶及び該結晶を具えるｘ線検査装置 Granted JPS59153152A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8300421A NL8300421A (nl) 1983-02-04 1983-02-04 Roentgen onderzoek apparaat met dubbel focusserend kristal.

Publications (2)

Publication Number Publication Date
JPS59153152A JPS59153152A (ja) 1984-09-01
JPH0557536B2 true JPH0557536B2 (enExample) 1993-08-24

Family

ID=19841350

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59017218A Granted JPS59153152A (ja) 1983-02-04 1984-02-03 二重収束ｘ線分光結晶及び該結晶を具えるｘ線検査装置

Country Status (5)

Country Link
EP (1) EP0115892B1 (enExample)
JP (1) JPS59153152A (enExample)
CA (1) CA1222075A (enExample)
DE (1) DE3465519D1 (enExample)
NL (1) NL8300421A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8501181A (nl) * 1985-04-24 1986-11-17 Philips Nv Kristal voor een roentgenanalyse apparaat.
JPS62141730U (enExample) * 1986-02-28 1987-09-07
WO1996034274A2 (en) * 1995-04-26 1996-10-31 Philips Electronics N.V. Method of manufacturing an x-ray optical element for an x-ray analysis apparatus
FR2841371B1 (fr) * 2002-06-19 2004-10-22 Xenocs Ensemble optique et procede associe
AU2003260613A1 (en) 2002-06-19 2004-01-06 Xenocs Optical unit and associated method
CN107024493A (zh) * 2017-03-20 2017-08-08 中国工程物理研究院电子工程研究所 一种碳化硅单晶晶片基平面弯曲的测试方法
CN114649106B (zh) * 2022-03-17 2024-08-27 重庆大学 一种球面高能透射晶体成像器及制造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL6410514A (enExample) * 1964-09-10 1966-03-11
JPS454549Y1 (enExample) * 1968-10-11 1970-03-02
JPS5023994A (enExample) * 1973-07-02 1975-03-14
US3927319A (en) * 1974-06-28 1975-12-16 Univ Southern California Crystal for X-ray crystal spectrometer
US4078175A (en) * 1976-09-20 1978-03-07 Nasa Apparatus for use in examining the lattice of a semiconductor wafer by X-ray diffraction
DD149420A1 (de) * 1980-03-03 1981-07-08 Reinhard Arnhold Roentgendiffraktometer

Also Published As

Publication number Publication date
CA1222075A (en) 1987-05-19
NL8300421A (nl) 1984-09-03
EP0115892A1 (en) 1984-08-15
JPS59153152A (ja) 1984-09-01
DE3465519D1 (en) 1987-09-24
EP0115892B1 (en) 1987-08-19

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