JPH0547782B2 - - Google Patents

Info

Publication number
JPH0547782B2
JPH0547782B2 JP57093217A JP9321782A JPH0547782B2 JP H0547782 B2 JPH0547782 B2 JP H0547782B2 JP 57093217 A JP57093217 A JP 57093217A JP 9321782 A JP9321782 A JP 9321782A JP H0547782 B2 JPH0547782 B2 JP H0547782B2
Authority
JP
Japan
Prior art keywords
calibration curve
measurement
reaction
value
condition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57093217A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58211663A (ja
Inventor
Kyoko Makiguchi
Toshuki Sagusa
Yasushi Nomura
Katsuji Yamashita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9321782A priority Critical patent/JPS58211663A/ja
Publication of JPS58211663A publication Critical patent/JPS58211663A/ja
Publication of JPH0547782B2 publication Critical patent/JPH0547782B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G01N2035/00673—Quality control of consumables of reagents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP9321782A 1982-06-02 1982-06-02 自動分析装置 Granted JPS58211663A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9321782A JPS58211663A (ja) 1982-06-02 1982-06-02 自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9321782A JPS58211663A (ja) 1982-06-02 1982-06-02 自動分析装置

Publications (2)

Publication Number Publication Date
JPS58211663A JPS58211663A (ja) 1983-12-09
JPH0547782B2 true JPH0547782B2 (enrdf_load_stackoverflow) 1993-07-19

Family

ID=14076387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9321782A Granted JPS58211663A (ja) 1982-06-02 1982-06-02 自動分析装置

Country Status (1)

Country Link
JP (1) JPS58211663A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60154161A (ja) * 1984-01-24 1985-08-13 Shimadzu Corp 免疫反応測定に使用する検量線の作成方法
JP2795403B2 (ja) * 1986-07-30 1998-09-10 株式会社 シノテスト 免疫的測定方法及び装置
JPH0692969B2 (ja) * 1986-07-30 1994-11-16 株式会社シノテスト 免疫的測定方法
JPS6382360A (ja) * 1986-09-26 1988-04-13 Agency Of Ind Science & Technol 陶石の化学組成による耐火度測定法
JPH0640057B2 (ja) * 1987-08-11 1994-05-25 日機装株式会社 自動乾式粒度分布測定装置
JP3645023B2 (ja) * 1996-01-09 2005-05-11 富士写真フイルム株式会社 試料分析方法、検量線の作成方法及びそれを用いる分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5451577A (en) * 1977-09-30 1979-04-23 Hitachi Ltd Automatic chemical analyzer

Also Published As

Publication number Publication date
JPS58211663A (ja) 1983-12-09

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