JPH053915B2 - - Google Patents

Info

Publication number
JPH053915B2
JPH053915B2 JP59261185A JP26118584A JPH053915B2 JP H053915 B2 JPH053915 B2 JP H053915B2 JP 59261185 A JP59261185 A JP 59261185A JP 26118584 A JP26118584 A JP 26118584A JP H053915 B2 JPH053915 B2 JP H053915B2
Authority
JP
Japan
Prior art keywords
electron beam
function
measuring
energy spectrum
intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59261185A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61138149A (ja
Inventor
Shotaro Izumi
Kenichi Oohori
Yoshiharu Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP59261185A priority Critical patent/JPS61138149A/ja
Publication of JPS61138149A publication Critical patent/JPS61138149A/ja
Publication of JPH053915B2 publication Critical patent/JPH053915B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP59261185A 1984-12-11 1984-12-11 透過電子線エネルギ−スペクトルの測定方法 Granted JPS61138149A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59261185A JPS61138149A (ja) 1984-12-11 1984-12-11 透過電子線エネルギ−スペクトルの測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59261185A JPS61138149A (ja) 1984-12-11 1984-12-11 透過電子線エネルギ−スペクトルの測定方法

Publications (2)

Publication Number Publication Date
JPS61138149A JPS61138149A (ja) 1986-06-25
JPH053915B2 true JPH053915B2 (cg-RX-API-DMAC7.html) 1993-01-18

Family

ID=17358311

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59261185A Granted JPS61138149A (ja) 1984-12-11 1984-12-11 透過電子線エネルギ−スペクトルの測定方法

Country Status (1)

Country Link
JP (1) JPS61138149A (cg-RX-API-DMAC7.html)

Also Published As

Publication number Publication date
JPS61138149A (ja) 1986-06-25

Similar Documents

Publication Publication Date Title
CN108398416A (zh) 一种基于激光拉曼光谱的混合物成分测定方法
DE2817333A1 (de) Photometrische vorrichtung
JPH0619390B2 (ja) デイジタル・フ−リエ変換の後処理方法
CA1138226A (en) Gas measurement and analysis system
JPH053915B2 (cg-RX-API-DMAC7.html)
JPS5871541A (ja) イオンマイクロアナライザ
CN118111335A (zh) 基于光强梯度一致性的光谱共焦位移测量方法及系统
Goto et al. Anodic stripping semidifferential electroanalysis with thin mercury film electrode formed in situ
CN110441748A (zh) 一种基于幅度信息的α-β滤波方法
JPH0475467B2 (cg-RX-API-DMAC7.html)
US4355533A (en) Gas measurement and analysis system
JPH05273122A (ja) シリコン結晶中不純物の赤外吸収測定方法
Statham Quantifying benefits of resolution and count rate in EDX microanalysis
Jakubowska et al. Deviations from bilinearity in multivariate voltammetric calibration models
Khaydukova et al. Multivariate processing of atomic-force microscopy images for detection of the response of plasticized polymeric membranes
JPS61175555A (ja) 螢光ｘ線分析装置を用いる定量分析方法
JPS6353456A (ja) 単色ｘ線画像計測装置
US2847641A (en) Method for analyzing white fuming nitric acid
JPH0379742B2 (cg-RX-API-DMAC7.html)
JP2000235064A (ja) 回転電機の残存絶縁破壊電圧値の推定装置
JPH05126780A (ja) 溶液濃度測定方法
JPS62161071A (ja) レ−ダ情報処理装置
JPS5846701B2 (ja) イオンセンタクセイデンキヨクオモチイタブンセキソウチ
JPH03172743A (ja) 分光分析装置におけるピークサーチ法
JPS59103260A (ja) マクロアナライザ−の検出感度補正装置