JPH0536771A - デバイス試験装置 - Google Patents

デバイス試験装置

Info

Publication number
JPH0536771A
JPH0536771A JP3353478A JP35347891A JPH0536771A JP H0536771 A JPH0536771 A JP H0536771A JP 3353478 A JP3353478 A JP 3353478A JP 35347891 A JP35347891 A JP 35347891A JP H0536771 A JPH0536771 A JP H0536771A
Authority
JP
Japan
Prior art keywords
vacuum chamber
printed board
adapter
signal
multilayer printed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3353478A
Other languages
English (en)
Japanese (ja)
Inventor
Friedbert Gelzer
ゲルツアー フリートベルト
Volker Wuerttenberger
ヴユルテンベルガー フオルカー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wincor Nixdorf International GmbH
Original Assignee
Siemens Nixdorf Informationssysteme AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Nixdorf Informationssysteme AG filed Critical Siemens Nixdorf Informationssysteme AG
Publication of JPH0536771A publication Critical patent/JPH0536771A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3353478A 1990-12-20 1991-12-17 デバイス試験装置 Pending JPH0536771A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4041027.7 1990-12-20
DE4041027A DE4041027C1 (enExample) 1990-12-20 1990-12-20

Publications (1)

Publication Number Publication Date
JPH0536771A true JPH0536771A (ja) 1993-02-12

Family

ID=6420933

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3353478A Pending JPH0536771A (ja) 1990-12-20 1991-12-17 デバイス試験装置

Country Status (4)

Country Link
US (1) US5216360A (enExample)
EP (1) EP0492217A3 (enExample)
JP (1) JPH0536771A (enExample)
DE (1) DE4041027C1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5488345A (en) * 1993-07-02 1996-01-30 Yazaki Corporation Disconnection mechanism for a dark current fuse
US5632654A (en) * 1995-01-20 1997-05-27 Yazaki Corporation Fuse connection structure

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5378984A (en) * 1992-01-20 1995-01-03 Advantest Corporation EB type IC tester
US5528161A (en) * 1994-09-15 1996-06-18 Venturedyne Limited Through-port load carrier and related test apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62213053A (ja) * 1986-03-13 1987-09-18 Nippon Telegr & Teleph Corp <Ntt> 電子ビ−ム試験装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4864228A (en) * 1985-03-15 1989-09-05 Fairchild Camera And Instrument Corporation Electron beam test probe for integrated circuit testing
WO1987001813A1 (en) * 1985-09-23 1987-03-26 Sharetree Limited An oven for the burn-in of integrated circuits
US4875004A (en) * 1988-06-01 1989-10-17 The United States Of America As Represented By The Secretary Of The Army High speed semiconductor characterization technique
US5041783A (en) * 1989-02-13 1991-08-20 Olympus Optical Co., Ltd. Probe unit for an atomic probe microscope
US5039938A (en) * 1990-06-21 1991-08-13 Hughes Aircraft Company Phosphor glow testing of hybrid substrates

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62213053A (ja) * 1986-03-13 1987-09-18 Nippon Telegr & Teleph Corp <Ntt> 電子ビ−ム試験装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5488345A (en) * 1993-07-02 1996-01-30 Yazaki Corporation Disconnection mechanism for a dark current fuse
US5629663A (en) * 1993-07-02 1997-05-13 Yazaki Corporation Disconnection mechanism for a dark current fuse
US5680088A (en) * 1993-07-02 1997-10-21 Yazaki Corporation Disconnection mechanism for a dark current fuse
US5632654A (en) * 1995-01-20 1997-05-27 Yazaki Corporation Fuse connection structure

Also Published As

Publication number Publication date
DE4041027C1 (enExample) 1992-06-25
EP0492217A3 (en) 1992-12-09
EP0492217A2 (de) 1992-07-01
US5216360A (en) 1993-06-01

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