JPH0533972Y2 - - Google Patents
Info
- Publication number
- JPH0533972Y2 JPH0533972Y2 JP19144287U JP19144287U JPH0533972Y2 JP H0533972 Y2 JPH0533972 Y2 JP H0533972Y2 JP 19144287 U JP19144287 U JP 19144287U JP 19144287 U JP19144287 U JP 19144287U JP H0533972 Y2 JPH0533972 Y2 JP H0533972Y2
- Authority
- JP
- Japan
- Prior art keywords
- package
- measurement probe
- pair
- head member
- tapered head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 43
- 238000005259 measurement Methods 0.000 claims description 41
- 239000004020 conductor Substances 0.000 claims description 29
- 238000012360 testing method Methods 0.000 claims description 9
- 238000011990 functional testing Methods 0.000 claims description 7
- 239000011810 insulating material Substances 0.000 claims description 6
- 239000011295 pitch Substances 0.000 description 13
- 210000000078 claw Anatomy 0.000 description 11
- 238000001514 detection method Methods 0.000 description 5
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19144287U JPH0533972Y2 (enrdf_load_stackoverflow) | 1987-12-18 | 1987-12-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19144287U JPH0533972Y2 (enrdf_load_stackoverflow) | 1987-12-18 | 1987-12-18 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0195672U JPH0195672U (enrdf_load_stackoverflow) | 1989-06-23 |
| JPH0533972Y2 true JPH0533972Y2 (enrdf_load_stackoverflow) | 1993-08-27 |
Family
ID=31482353
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19144287U Expired - Lifetime JPH0533972Y2 (enrdf_load_stackoverflow) | 1987-12-18 | 1987-12-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0533972Y2 (enrdf_load_stackoverflow) |
-
1987
- 1987-12-18 JP JP19144287U patent/JPH0533972Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0195672U (enrdf_load_stackoverflow) | 1989-06-23 |