JPH05335746A - Ceramic multilayer wiring board and manufacture thereof - Google Patents

Ceramic multilayer wiring board and manufacture thereof

Info

Publication number
JPH05335746A
JPH05335746A JP4134546A JP13454692A JPH05335746A JP H05335746 A JPH05335746 A JP H05335746A JP 4134546 A JP4134546 A JP 4134546A JP 13454692 A JP13454692 A JP 13454692A JP H05335746 A JPH05335746 A JP H05335746A
Authority
JP
Japan
Prior art keywords
capacitor
capacitance
wiring board
multilayer wiring
ceramic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP4134546A
Other languages
Japanese (ja)
Inventor
Eiichiro Hirose
英一郎 広瀬
Shinichiro Inui
信一郎 乾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP4134546A priority Critical patent/JPH05335746A/en
Publication of JPH05335746A publication Critical patent/JPH05335746A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To adjust capacitance, and manufacture a ceramic multilayer wiring board having a high yield by providing a trimmed capacitor on an inner layer sandwiched between a number of ceramic substrates. CONSTITUTION:A capacitor upper electrode 16 with one side thereof formed into a comb tooth shape is printed on an upper part of a dielectric material 14, and it is calcined after having been dried. A probe is brought into contact with an area between a capacitance check pad 12b of a lower electrode 12a and the electrode 16 to check the capacitance of the capacitor. When the capacitance is outside of a tolerance, the upper electrode 16 is trimmed by a laser beam or the like, so that a trimmed portion 16a is formed. Thereafter, joint glass 18 is printed on a substrate, and an alumina substrate 20 is laminated on the glass. This laminated substrate is then calcined. Thereby, it is possible to manufacture with a high yield a ceramic multilayer wiring board on which a capacitor with its capacitance prepared is mounted.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電子機器等に使用され
るセラミック多層配線基板およびその製造方法に関する
ものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a ceramic multilayer wiring board used for electronic equipment and the like and a method for manufacturing the same.

【0002】[0002]

【従来の技術】従来、セラミック多層配線基板は、ガラ
ス−セラミックス系材料の成形体(グリーンシート)上
へ、導体,抵抗体等とともに、コンデンサを形成するた
めの誘電体を印刷し、積層(ラミネート)した後、一括
して焼成することにより製造されている。
2. Description of the Related Art Conventionally, a ceramic multilayer wiring board is formed by printing a dielectric material for forming a capacitor together with conductors, resistors and the like on a molded body (green sheet) of glass-ceramic material and laminating (laminating) it. After that, it is manufactured by firing at once.

【0003】[0003]

【発明が解決しようとする課題】上記従来の方法では、
グリーンシート上に誘電体を印刷した後、一括焼成を行
なっているため、 (1)グリーンシートの焼成収縮挙動と誘電体のそれと
のミスマッチングに起因し、誘電体の破損が生じる場合
があった。 (2)誘電体の破損は生じなくてもコンデンサ容量の異
常が生じる場合があり、この異常が生じてもその容量調
整を行なうことはできなかった。 等の理由により、歩留りの良い製造ができないという問
題があった。
SUMMARY OF THE INVENTION In the above conventional method,
Since the dielectric material is printed on the green sheet and then fired together, (1) the dielectric material may be damaged due to the mismatch between the firing shrinkage behavior of the green sheet and that of the dielectric material. . (2) Even if the dielectric is not damaged, the capacitance of the capacitor may be abnormal. Even if this abnormality occurs, the capacitance cannot be adjusted. Due to the above reasons, there is a problem that manufacturing with a high yield cannot be performed.

【0004】本発明は、上記事情に鑑み、コンデンサ容
量を調整でき、これにより歩留りの高いセラミック多層
配線基板を製造する方法、および容量の調整されたコン
デンサが内層化されたセラミック多層配線基板を提供す
ることを目的とする。
In view of the above-mentioned circumstances, the present invention provides a method for manufacturing a ceramic multilayer wiring board which can adjust the capacitance of a capacitor and thus has a high yield, and a ceramic multilayer wiring board in which a capacitance-adjusted capacitor is formed as an inner layer. The purpose is to

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
の本発明のセラミック多層配線基板の製造方法は、焼成
済の第1のセラミック基板上に、コンデンサのための一
方の電極パターンを印刷して焼成する工程と、上記一方
の電極パターン上に誘電体を印刷する工程と、上記誘電
体上に他方の電極パターンを印刷して焼成する工程と、
上記一方の電極パターン,上記誘電体,及び上記他方の
電極パターンで構成されるコンデンサの容量を、必要に
応じて、トリミングすることにより調整する工程と、セ
ラミック基板どうしを接合するガラスを印刷する工程
と、上記第1のセラミック基板上に、上記コンデンサを
挟持するように焼成済の第2のセラミック基板を重ね合
わせて焼成する工程とを備えたことを特徴とするもので
ある。
In order to achieve the above object, a method for manufacturing a ceramic multilayer wiring board according to the present invention comprises printing one electrode pattern for a capacitor on a fired first ceramic board. And firing, a step of printing a dielectric on the one electrode pattern, a step of printing the other electrode pattern on the dielectric and firing.
A step of adjusting the capacitance of a capacitor composed of the one electrode pattern, the dielectric material, and the other electrode pattern by trimming, if necessary, and a step of printing glass for joining the ceramic substrates together. And a step of firing a second ceramic substrate that has been fired so as to sandwich the capacitor on the first ceramic substrate and firing the second ceramic substrate.

【0006】また本発明のセラミック多層配線基板は、
複数枚のセラミック基板に挟まれた内層に、トリミング
されたコンデンサを備えたことを特徴とするものであ
る。
The ceramic multilayer wiring board of the present invention is
It is characterized in that an inner layer sandwiched between a plurality of ceramic substrates is provided with a trimmed capacitor.

【0007】[0007]

【作用】本発明は、焼成済セラミック基板上へコンデン
サを印刷,焼成するものであるため、基板材質の焼成収
縮とコンデンサ材のそれとのマッチングを考慮する必要
がなく、低温同時焼成セラミック基板に比べ焼成工程が
簡単にでき、またコンデンサ材の選択にも自由度が増
す。また、セラミック基板を重ね合わせる多層化の前に
コンデンサ容量のチェック及びトリミングによる調整を
行うことができ、製品歩留が向上する。
In the present invention, since the capacitor is printed and fired on the fired ceramic substrate, it is not necessary to consider the firing shrinkage of the substrate material and the matching of the capacitor material. The firing process can be simplified and the degree of freedom in selecting the capacitor material is increased. In addition, the capacitor capacity can be checked and adjustment can be performed by trimming before the ceramic substrates are stacked to form a multilayer structure, which improves the product yield.

【0008】[0008]

【実施例】以下、本発明の実施例について説明する。図
1は、本発明のセラミック多層配線基板の一例の、コン
デンサの部分の断面図、図2,図3は、それぞれコンデ
ンサの下部電極,上部電極をなす導体パターンの一例を
示した図、図4は、コンデンサ部分の平面図である。
EXAMPLES Examples of the present invention will be described below. FIG. 1 is a sectional view of a capacitor portion of an example of a ceramic multilayer wiring board of the present invention, FIGS. 2 and 3 are diagrams showing examples of conductor patterns forming a lower electrode and an upper electrode of the capacitor, respectively. [Fig. 4] is a plan view of a capacitor portion.

【0009】ここでは、これらの図を参照しながらセラ
ミック多層配線基板の製造方法の一例について説明す
る。焼成済の複数枚のアルミナ基板10,20を用意
し、それらのアルミナ基板10,20に、図2に示すコ
ンデンサ下部電極12aを含む導体パターン12、およ
び導体パターン22を印刷,乾燥し、850℃,10分
間焼成を行った。その後下部電極12a上に誘電体14
を印刷,乾燥し、さらにその誘電体14の上部に、図3
に示すように一辺がくし刃状に形成されたコンデンサ上
部電極16を印刷,乾燥した後、850℃,30分間焼
成した。その後下部電極12aの容量チェック用パッド
12bと上部電極16との間にプローブを当てその容量
をチェックした。
Here, an example of a method for manufacturing a ceramic multilayer wiring board will be described with reference to these drawings. A plurality of fired alumina substrates 10 and 20 are prepared, and the conductor pattern 12 including the capacitor lower electrode 12a shown in FIG. 2 and the conductor pattern 22 are printed and dried on the alumina substrates 10 and 20 at 850 ° C. It was baked for 10 minutes. Then, the dielectric 14 is formed on the lower electrode 12a.
3 is printed, dried, and then on top of the dielectric 14, FIG.
As shown in (4), the capacitor upper electrode 16 having one side formed into a comb blade was printed, dried, and then baked at 850 ° C. for 30 minutes. After that, a probe was applied between the capacitance check pad 12b of the lower electrode 12a and the upper electrode 16 to check the capacitance.

【0010】ここで、この容量は目標値よりも多少大き
な値に変動するようにその中心値が定められており、容
量のチェックによりその容量が許容範囲から外れていた
ときは、図3に示す一点鎖線に沿ってその容量が許容範
囲内となるまで上部電極16がレーザ光等により切断
(トリミング)され、図1に示すようなトリミング部1
6aが形成される。このようにしてトリミングによりコ
ンデンサ容量の調整が行なわれた後、接合用ガラス18
を印刷し、アルミナ基板20を積層して焼成した。図1
に示す例では上部電極16は、アルミナ基板20に設け
られたスルーホール24内の導体を介して導体パターン
22と接続されている。
Here, the center value of the capacity is set so as to fluctuate to a value slightly larger than the target value, and when the capacity is out of the allowable range by the capacity check, it is shown in FIG. The upper electrode 16 is cut (trimmed) by laser light or the like along the alternate long and short dash line until the capacitance falls within the allowable range, and the trimming portion 1 as shown in FIG.
6a is formed. After the capacitance of the capacitor is adjusted by trimming in this way, the glass for bonding 18
Was printed, and the alumina substrates 20 were laminated and fired. Figure 1
In the example shown in, the upper electrode 16 is connected to the conductor pattern 22 via the conductor in the through hole 24 provided in the alumina substrate 20.

【0011】上記工程により、目標容量値に対する許容
範囲を±20%と設定して製造したところ、このコンデ
ンサに関し歩留り100%を達成できた。
When the manufacturing process was performed by setting the permissible range to the target capacitance value to ± 20% by the above process, the yield of this capacitor was 100%.

【0012】[0012]

【発明の効果】以上、本発明により容量の調整されたコ
ンデンサが搭載されたセラミック多層配線基板が高い歩
留りで製造された。
As described above, according to the present invention, the ceramic multi-layer wiring board on which the capacitor of which the capacitance is adjusted is mounted is manufactured with a high yield.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のセラミック多層配線基板の一例の、コ
ンデンサの部分の断面図である。
FIG. 1 is a sectional view of a capacitor portion of an example of a ceramic multilayer wiring board of the present invention.

【図2】コンデンサの下部電極をなす導体パターンの一
例を示した図である。
FIG. 2 is a diagram showing an example of a conductor pattern forming a lower electrode of a capacitor.

【図3】コンデンサの上部電極をなす導体パターンの一
例を示した図である。
FIG. 3 is a diagram showing an example of a conductor pattern forming an upper electrode of a capacitor.

【図4】コンデンサ部分の平面図である。FIG. 4 is a plan view of a capacitor portion.

【符号の説明】[Explanation of symbols]

10,20 アルミナ基板 12,22 導体パターン 12a コンデンサ下部電極 14 誘電体 16 コンデンサ上部電極 16a トリミング部 18 接合用ガラス 10, 20 Alumina substrate 12, 22 Conductor pattern 12a Capacitor lower electrode 14 Dielectric 16 Capacitor upper electrode 16a Trimming part 18 Bonding glass

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 複数枚のセラミック基板に挟まれた内層
に、トリミングされたコンデンサを備えたことを特徴と
するセラミック多層配線基板。
1. A ceramic multilayer wiring board comprising a trimmed capacitor in an inner layer sandwiched between a plurality of ceramic boards.
【請求項2】 焼成済の第1のセラミック基板上に、コ
ンデンサのための一方の電極パターンを印刷して焼成す
る工程と、 前記一方の電極パターン上に誘電体を印刷する工程と、 前記誘電体上に他方の電極パターンを印刷して焼成する
工程と、 前記一方の電極パターン,前記誘電体,及び前記他方の
電極パターンで構成されるコンデンサの容量を、必要に
応じて、トリミングすることにより調整する工程と、 セラミック基板どうしを接合するガラスを印刷する工程
と、 前記第1のセラミック基板上に、前記コンデンサを挟持
するように焼成済の第2のセラミック基板を重ね合わせ
て焼成する工程とを備えたことを特徴とするセラミック
多層配線基板の製造方法。
2. A step of printing and firing one electrode pattern for a capacitor on a fired first ceramic substrate; a step of printing a dielectric material on the one electrode pattern; By printing the other electrode pattern on the body and firing, and by trimming the capacitance of the capacitor composed of the one electrode pattern, the dielectric, and the other electrode pattern, if necessary. A step of adjusting, a step of printing glass for bonding the ceramic substrates together, and a step of stacking and firing a second ceramic substrate that has been fired so as to sandwich the capacitor on the first ceramic substrate. A method for manufacturing a ceramic multilayer wiring board, comprising:
JP4134546A 1992-05-27 1992-05-27 Ceramic multilayer wiring board and manufacture thereof Withdrawn JPH05335746A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4134546A JPH05335746A (en) 1992-05-27 1992-05-27 Ceramic multilayer wiring board and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4134546A JPH05335746A (en) 1992-05-27 1992-05-27 Ceramic multilayer wiring board and manufacture thereof

Publications (1)

Publication Number Publication Date
JPH05335746A true JPH05335746A (en) 1993-12-17

Family

ID=15130849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4134546A Withdrawn JPH05335746A (en) 1992-05-27 1992-05-27 Ceramic multilayer wiring board and manufacture thereof

Country Status (1)

Country Link
JP (1) JPH05335746A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6799976B1 (en) * 1999-07-28 2004-10-05 Nanonexus, Inc. Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6799976B1 (en) * 1999-07-28 2004-10-05 Nanonexus, Inc. Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies

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Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990803