JPH05327144A - Hybrid integrated circuit device - Google Patents

Hybrid integrated circuit device

Info

Publication number
JPH05327144A
JPH05327144A JP4080153A JP8015392A JPH05327144A JP H05327144 A JPH05327144 A JP H05327144A JP 4080153 A JP4080153 A JP 4080153A JP 8015392 A JP8015392 A JP 8015392A JP H05327144 A JPH05327144 A JP H05327144A
Authority
JP
Japan
Prior art keywords
integrated circuit
circuit device
heat dissipation
substrate
hybrid integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4080153A
Other languages
Japanese (ja)
Other versions
JP2730388B2 (en
Inventor
Masaki Nishimura
雅貴 西村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP4080153A priority Critical patent/JP2730388B2/en
Publication of JPH05327144A publication Critical patent/JPH05327144A/en
Application granted granted Critical
Publication of JP2730388B2 publication Critical patent/JP2730388B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45117Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
    • H01L2224/45124Aluminium (Al) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components

Landscapes

  • Structure Of Printed Boards (AREA)

Abstract

PURPOSE:To improve heat dissipation by forming a pattern for heat dissipation connected with a main substrate on which a hybrid integrated circuit device is mounted, on the rear of an organic substrate. CONSTITUTION:A spot facing is formed in an organic substrate (glass epoxy substrate) 1, and an IC chip 6 is bonded and mounted by using adhesive resin 5. The IC is electrically connected with an electrode pattern 2 formed on the glass epoxy substrate 1 by using Au or aluminum wires 7. The inside of a resin frame 4 which is previously mounted on a protective body 3 is sealed by using resin 8. A connection pattern 12 for heat dissipation is formed on the rear of the glass epoxy substrate 1. A hybrid integrated circuit device is mounted on a main substrate 11 by using solder 9 as shown in figure. Connection lands 10, the electrode pattern 2, and the connection pattern 12 for heat dissipation are connected by using solder 9 for mounting. Thereby heat dissipation effect is improved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は混成集積回路装置に関
し、特に有機基板上にICチップ等を搭載する表面実装
型の混成集積回路装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a hybrid integrated circuit device, and more particularly to a surface mount type hybrid integrated circuit device in which an IC chip or the like is mounted on an organic substrate.

【0002】[0002]

【従来の技術】従来の有機基板上にICチップ等を搭載
する表面実装型の混成集積回路装置の構造は図3を参照
し説明すると、ガラスエポキシ基板1に座ぐりが形成さ
れ座ぐり上にICチップ6が接着樹脂5により接着・搭
載されている。金線又はアルミ線7でICチップ6と有
機基板上の導体2が電気的に接続され、樹脂封止8によ
り、ICチップ6と金線又はアルミ線7が保護されてい
る。
2. Description of the Related Art The structure of a conventional surface mount type hybrid integrated circuit device in which an IC chip or the like is mounted on an organic substrate will be described with reference to FIG. The IC chip 6 is bonded and mounted with the adhesive resin 5. The IC chip 6 and the conductor 2 on the organic substrate are electrically connected by the gold wire or the aluminum wire 7, and the IC chip 6 and the gold wire or the aluminum wire 7 are protected by the resin sealing 8.

【0003】主基板11との接続はガラスエポキシ基板
1に半円型の金メッキされた電極2を設けてあり、その
電極と主基板11にあらかじめ形成された搭載用ランド
10に実装する事により行う。
Connection with the main board 11 is made by providing a semi-circular gold-plated electrode 2 on a glass epoxy board 1 and mounting the electrode on a mounting land 10 formed in advance on the main board 11. ..

【0004】図3(A)は従来の有機基板表面実装型混
成集積回路装置の断面図である。又、図3(B)は、外
形を表わした斜視図である。樹脂封止用の枠4は基板保
護体3の上に実装する。主基板11への実装は半田9を
用いて実装する。
FIG. 3A is a sectional view of a conventional organic substrate surface mounting type hybrid integrated circuit device. Further, FIG. 3B is a perspective view showing the outer shape. The resin-sealing frame 4 is mounted on the substrate protector 3. The main board 11 is mounted using solder 9.

【0005】[0005]

【発明が解決しようとする課題】従来の有機基板表面実
装型混成集積回路装置は、セラミック基板等に比較し、
放熱性が悪い為、ICチップの内部発熱が低く抑えられ
る回路にしか使用出来ないという使用上の制約があっ
た。
The conventional organic substrate surface mounting type hybrid integrated circuit device has a
Since the heat dissipation is poor, there is a restriction in use that it can be used only in a circuit that can suppress the internal heat generation of the IC chip.

【0006】[0006]

【課題を解決するための手段】本発明の有機基板上にI
Cチップ等を搭載する表面実装型の混成集積回路装置
は、混成集積回路装置を実装する主基板と電気的接続を
する電極パターン以外に半田で接続する放熱用のパター
ンを備えている。
Means for Solving the Problems I on the organic substrate of the present invention
A surface-mount type hybrid integrated circuit device having a C chip or the like is provided with a heat radiation pattern to be connected by solder in addition to an electrode pattern for electrical connection with a main board on which the hybrid integrated circuit device is mounted.

【0007】[0007]

【実施例】次に本発明について図面を参照して説明す
る。図1は本発明実施例(1)の断面図である。有機基
板(ガラスエポキシ基板)1に座ぐりを設け、ICチッ
プを接着樹脂5により接着・搭載し、Au又はアルミ線
7によりガラスエポキシ基板1に設けられた導体(電極
パターン)2に電気的接続をする。保護体3上にあらか
じめ搭載された樹脂枠4の内部を樹脂8で封止する。1
2はガラスエポキシ基板裏面に設けた放熱用接続パター
ンである。上述の混成集積回路装置の主基板11への実
装は、図1に示すように、半田9により行う。主基板1
1上に形成された接続ランド10と、電極パターン2,
放熱用接続パターン12を半田9で各々接続し実装す
る。
The present invention will be described below with reference to the drawings. FIG. 1 is a sectional view of an embodiment (1) of the present invention. A counterbore is provided on an organic substrate (glass epoxy substrate) 1, an IC chip is bonded and mounted with an adhesive resin 5, and an electrical connection is made with a conductor (electrode pattern) 2 provided on the glass epoxy substrate 1 by Au or an aluminum wire 7. do. The inside of the resin frame 4 previously mounted on the protector 3 is sealed with the resin 8. 1
Reference numeral 2 is a heat radiation connection pattern provided on the back surface of the glass epoxy substrate. The above-mentioned hybrid integrated circuit device is mounted on the main substrate 11 by solder 9 as shown in FIG. Main board 1
1, the connection land 10 and the electrode pattern 2,
The heat-dissipating connection patterns 12 are connected and mounted by solder 9 respectively.

【0008】主基板11と放熱用接続パターン12を接
続する事により、混成集積回路装置を動作させた際の発
熱が主基板にも放熱される為、温度上昇が軽減される。
By connecting the main board 11 and the heat dissipation connection pattern 12, the heat generated when the hybrid integrated circuit device is operated is also radiated to the main board, so that the temperature rise is reduced.

【0009】図2は本発明実施例(2)の断面図であ
る。有機基板(ガラスエポキシ基板)1に座ぐりを設け
ICチップ6を接着樹脂5により接着・搭載し、Au又
はアルミ線7によりガラスエポキシ基板1に設けられた
導体(電極パターン)2に電気的接続をする。保護体3
上にあらかじめ搭載された樹脂枠4の内部を樹脂8で封
止する。12は放熱用接続パターンである。この実施例
では、ガラスエポキシ基板1の放熱用接続パターン12
が形成される部分は座ぐりが設けられている。その他は
先の実施例と同じである。
FIG. 2 is a sectional view of the embodiment (2) of the present invention. A counterbore is provided on an organic substrate (glass epoxy substrate) 1 to bond and mount an IC chip 6 with an adhesive resin 5, and an electrical connection is made to a conductor (electrode pattern) 2 provided on the glass epoxy substrate 1 with Au or an aluminum wire 7. do. Protector 3
The inside of the resin frame 4 previously mounted above is sealed with the resin 8. Reference numeral 12 is a heat dissipation connection pattern. In this embodiment, the heat dissipation connection pattern 12 of the glass epoxy substrate 1 is used.
A counterbore is provided in the portion where the is formed. Others are the same as in the previous embodiment.

【0010】上述の混成集積回路装置の主基板11への
実装は、半田9により行う。主基板11上に形成された
接続ランド10と、電極パターン2、放熱用接続パター
ン2を半田9により各々接続し、実装する。この実施例
の放熱用パターン12は、ガラスエポキシを基板の座ぐ
りを設けた部分に形成してあり、発熱源のICチップ6
に近い為、先の実施例よりも放熱効果が良い。
The above-mentioned hybrid integrated circuit device is mounted on the main substrate 11 by solder 9. The connection land 10 formed on the main board 11, the electrode pattern 2, and the heat dissipation connection pattern 2 are connected by solder 9 and mounted. The heat dissipation pattern 12 of this embodiment is formed of glass epoxy on the portion of the substrate where the counterbore is provided, and the IC chip 6 of the heat source is formed.
Therefore, the heat radiation effect is better than that of the previous embodiment.

【0011】[0011]

【発明の効果】以上説明したように本発明は、裏面に設
けられた接続パターンと、主基板とを半田で接続する様
にしたことにより、搭載部品の発熱を主基板側に放熱出
来る為、裏面の放熱性は、従来に対して実施例(1)で
は大幅に改善された、さらに実施例(2)では有機基板
の厚みを約半分にした場合は実施例(1)よりも約30
%放熱性が改善されるという効果を有する。
As described above, according to the present invention, since the connection pattern provided on the back surface and the main board are connected by solder, the heat of the mounted components can be radiated to the main board side. The heat dissipation on the back surface was significantly improved in Example (1) as compared with the conventional one, and in Example (2), when the thickness of the organic substrate was reduced to about half, it was about 30 compared to Example (1).
% This has the effect of improving heat dissipation.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明実施例(1)の断面図。FIG. 1 is a sectional view of an embodiment (1) of the present invention.

【図2】実施例(2)の断面図。FIG. 2 is a sectional view of Example (2).

【図3】従来装置の構造図であり、(A)は断面図、
(B)は外形の斜視図。
FIG. 3 is a structural view of a conventional device, (A) is a sectional view,
(B) is a perspective view of the outer shape.

【符号の説明】[Explanation of symbols]

1 有機基板(ガラスエポキシ樹脂等) 2 電極パターン 3 保護体(絶縁樹脂) 4 樹脂枠 5 接着樹脂 6 ICチップ 7 Au又はアルミ線 8 樹脂 9 半田 10 接続ランド 11 主基板 12 放熱用接続パターン 1 Organic Substrate (Glass Epoxy Resin etc.) 2 Electrode Pattern 3 Protective Body (Insulating Resin) 4 Resin Frame 5 Adhesive Resin 6 IC Chip 7 Au or Aluminum Wire 8 Resin 9 Solder 10 Connection Land 11 Main Board 12 Heat Dissipation Connection Pattern

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 電気配線を有する有機基板上にICチッ
プ等を搭載した表面実装型の混成集積回路装置におい
て、混成集積回路装置を実装する主基板と接続する放熱
用のパターンを前記有機基板の裏面に備えた事を特徴と
する混成集積回路装置。
1. In a surface-mount type hybrid integrated circuit device in which an IC chip or the like is mounted on an organic substrate having electric wiring, a heat radiation pattern for connecting to a main substrate on which the hybrid integrated circuit device is mounted is provided on the organic substrate. A hybrid integrated circuit device characterized by being provided on the back surface.
JP4080153A 1992-04-02 1992-04-02 Hybrid integrated circuit device Expired - Lifetime JP2730388B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4080153A JP2730388B2 (en) 1992-04-02 1992-04-02 Hybrid integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4080153A JP2730388B2 (en) 1992-04-02 1992-04-02 Hybrid integrated circuit device

Publications (2)

Publication Number Publication Date
JPH05327144A true JPH05327144A (en) 1993-12-10
JP2730388B2 JP2730388B2 (en) 1998-03-25

Family

ID=13710356

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4080153A Expired - Lifetime JP2730388B2 (en) 1992-04-02 1992-04-02 Hybrid integrated circuit device

Country Status (1)

Country Link
JP (1) JP2730388B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006216674A (en) * 2005-02-02 2006-08-17 Sharp Corp Printed circuit with improved heat dissipation performance and circuit module comprising the same

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0263146A (en) * 1988-08-29 1990-03-02 Hitachi Ltd Radiating structure of heat-generating component mounted on printed-circuit board
JPH0442989A (en) * 1990-06-06 1992-02-13 Ibiden Co Ltd Electronic component placing board and manufacture thereof
JP3038653U (en) * 1996-12-10 1997-06-24 認 小松 Beer automatic volume selling device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0263146A (en) * 1988-08-29 1990-03-02 Hitachi Ltd Radiating structure of heat-generating component mounted on printed-circuit board
JPH0442989A (en) * 1990-06-06 1992-02-13 Ibiden Co Ltd Electronic component placing board and manufacture thereof
JP3038653U (en) * 1996-12-10 1997-06-24 認 小松 Beer automatic volume selling device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006216674A (en) * 2005-02-02 2006-08-17 Sharp Corp Printed circuit with improved heat dissipation performance and circuit module comprising the same

Also Published As

Publication number Publication date
JP2730388B2 (en) 1998-03-25

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Effective date: 19971118