JPH0526182B2 - - Google Patents

Info

Publication number
JPH0526182B2
JPH0526182B2 JP59135203A JP13520384A JPH0526182B2 JP H0526182 B2 JPH0526182 B2 JP H0526182B2 JP 59135203 A JP59135203 A JP 59135203A JP 13520384 A JP13520384 A JP 13520384A JP H0526182 B2 JPH0526182 B2 JP H0526182B2
Authority
JP
Japan
Prior art keywords
pattern
mask
exposure
photosensitive material
etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP59135203A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6115140A (ja
Inventor
Niwaji Majima
Hiromichi Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59135203A priority Critical patent/JPS6115140A/ja
Publication of JPS6115140A publication Critical patent/JPS6115140A/ja
Publication of JPH0526182B2 publication Critical patent/JPH0526182B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP59135203A 1984-07-02 1984-07-02 パタ−ン作成方法 Granted JPS6115140A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59135203A JPS6115140A (ja) 1984-07-02 1984-07-02 パタ−ン作成方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59135203A JPS6115140A (ja) 1984-07-02 1984-07-02 パタ−ン作成方法

Publications (2)

Publication Number Publication Date
JPS6115140A JPS6115140A (ja) 1986-01-23
JPH0526182B2 true JPH0526182B2 (US20030220297A1-20031127-C00074.png) 1993-04-15

Family

ID=15146260

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59135203A Granted JPS6115140A (ja) 1984-07-02 1984-07-02 パタ−ン作成方法

Country Status (1)

Country Link
JP (1) JPS6115140A (US20030220297A1-20031127-C00074.png)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07113283B2 (ja) * 1991-01-31 1995-12-06 鹿島建設株式会社 竪型地下駐車場

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5429976A (en) * 1977-08-10 1979-03-06 Nec Home Electronics Ltd Manufacture of semiconductor device
JPS5968737A (ja) * 1982-10-13 1984-04-18 Tokyo Ohka Kogyo Co Ltd ポジ型及びネガ型パタ−ンの同時形成方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5429976A (en) * 1977-08-10 1979-03-06 Nec Home Electronics Ltd Manufacture of semiconductor device
JPS5968737A (ja) * 1982-10-13 1984-04-18 Tokyo Ohka Kogyo Co Ltd ポジ型及びネガ型パタ−ンの同時形成方法

Also Published As

Publication number Publication date
JPS6115140A (ja) 1986-01-23

Similar Documents

Publication Publication Date Title
JP2004134553A (ja) レジストパターンの形成方法及び半導体装置の製造方法
JPH075675A (ja) マスク及びその製造方法
US20030039893A1 (en) Exposed phase edge mask method for generating periodic structures with subwavelength feature
JPS6236636B2 (US20030220297A1-20031127-C00074.png)
JPH0526182B2 (US20030220297A1-20031127-C00074.png)
JPS6326536B2 (US20030220297A1-20031127-C00074.png)
JPH05204131A (ja) ホトマスク及びこれを用いたパターン形成方法
US5908718A (en) Phase shifting photomask with two different transparent regions
JP2610402B2 (ja) 二重露光によるt形のゲートの製造方法
JPS59155921A (ja) レジストパタ−ンの形成方法
US5682056A (en) Phase shifting mask and method of manufacturing same
JPH06186728A (ja) ホトマスクの製造方法
JP3215394B2 (ja) 電極配線導通孔の製造方法および半導体装置の製造方法
JP3282207B2 (ja) 透過型位相シフトマスクおよびその製造方法
JPS63275115A (ja) 半導体装置のパタ−ン形成方法
JPH05341494A (ja) 位相シフトフォトマスク及びその作成方法
JPS6233580B2 (US20030220297A1-20031127-C00074.png)
JPH06132216A (ja) パターン形成方法
JPH0450942A (ja) レチクルおよびその製造方法
JP2933759B2 (ja) 位相シフトマスクの製造方法
JPH0567566A (ja) 多層レジスト及びそれを用いたレジストパターンの製造方法
JPH0236049B2 (US20030220297A1-20031127-C00074.png)
JPH0653107A (ja) 半導体装置の製造方法
JP2693171B2 (ja) 薄膜磁気ヘッドの製造方法
JPH0419697B2 (US20030220297A1-20031127-C00074.png)

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees