JPH0525389B2 - - Google Patents
Info
- Publication number
- JPH0525389B2 JPH0525389B2 JP63218664A JP21866488A JPH0525389B2 JP H0525389 B2 JPH0525389 B2 JP H0525389B2 JP 63218664 A JP63218664 A JP 63218664A JP 21866488 A JP21866488 A JP 21866488A JP H0525389 B2 JPH0525389 B2 JP H0525389B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- region
- base
- emitter
- collector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
- H10D10/01—Manufacture or treatment
- H10D10/021—Manufacture or treatment of heterojunction BJTs [HBT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
- H10D10/80—Heterojunction BJTs
- H10D10/821—Vertical heterojunction BJTs
- H10D10/841—Vertical heterojunction BJTs having a two-dimensional base, e.g. modulation-doped base, inversion layer base or delta-doped base
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/17—Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
- H10D62/177—Base regions of bipolar transistors, e.g. BJTs or IGBTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/60—Impurity distributions or concentrations
- H10D62/605—Planar doped, e.g. atomic-plane doped or delta-doped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
Landscapes
- Bipolar Transistors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/094,633 US4825265A (en) | 1987-09-04 | 1987-09-04 | Transistor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6472562A JPS6472562A (en) | 1989-03-17 |
JPH0525389B2 true JPH0525389B2 (en:Method) | 1993-04-12 |
Family
ID=22246275
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63218664A Granted JPS6472562A (en) | 1987-09-04 | 1988-09-02 | Transistor |
Country Status (5)
Country | Link |
---|---|
US (1) | US4825265A (en:Method) |
EP (1) | EP0306258B1 (en:Method) |
JP (1) | JPS6472562A (en:Method) |
CA (1) | CA1286799C (en:Method) |
DE (1) | DE3887716T2 (en:Method) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63276267A (ja) * | 1987-05-08 | 1988-11-14 | Fujitsu Ltd | 半導体装置の製造方法 |
US4967254A (en) * | 1987-07-16 | 1990-10-30 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device |
CA1303754C (en) * | 1988-09-07 | 1992-06-16 | American Telephone And Telegraph Company | Bipolar hot electron transistor |
US5206524A (en) * | 1988-09-28 | 1993-04-27 | At&T Bell Laboratories | Heterostructure bipolar transistor |
US5164218A (en) * | 1989-05-12 | 1992-11-17 | Nippon Soken, Inc. | Semiconductor device and a method for producing the same |
US5106766A (en) * | 1989-07-11 | 1992-04-21 | At&T Bell Laboratories | Method of making a semiconductor device that comprises p-type III-V semiconductor material |
US5001534A (en) * | 1989-07-11 | 1991-03-19 | At&T Bell Laboratories | Heterojunction bipolar transistor |
US5077597A (en) * | 1990-08-17 | 1991-12-31 | North Carolina State University | Microelectronic electron emitter |
JP3130545B2 (ja) * | 1991-03-06 | 2001-01-31 | 株式会社東芝 | 半導体装置および半導体装置の製造方法 |
US5162243A (en) * | 1991-08-30 | 1992-11-10 | Trw Inc. | Method of producing high reliability heterojunction bipolar transistors |
US5286997A (en) * | 1992-03-31 | 1994-02-15 | Texas Instruments Incorporated | Method for forming an isolated, low resistance epitaxial subcollector for bipolar transistors |
US5448087A (en) * | 1992-04-30 | 1995-09-05 | Trw Inc. | Heterojunction bipolar transistor with graded base doping |
US5298438A (en) * | 1992-08-31 | 1994-03-29 | Texas Instruments Incorporated | Method of reducing extrinsic base-collector capacitance in bipolar transistors |
US5700701A (en) * | 1992-10-30 | 1997-12-23 | Texas Instruments Incorporated | Method for reducing junction capacitance and increasing current gain in collector-up bipolar transistors |
US5716859A (en) * | 1995-12-22 | 1998-02-10 | The Whitaker Corporation | Method of fabricating a silicon BJT |
JP3087671B2 (ja) * | 1996-12-12 | 2000-09-11 | 日本電気株式会社 | バイポーラトランジスタおよびその製造方法 |
DE19944925B4 (de) * | 1999-09-13 | 2010-11-25 | Ihp Gmbh - Innovations For High Performance Microelectronics / Leibniz-Institut Für Innovative Mikroelektronik | Schichtstruktur für bipolare Transistoren und Verfahren zu deren Herstellung |
EP2202784B1 (en) * | 2008-12-29 | 2017-10-25 | Imec | Method for manufacturing a junction |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3780359A (en) * | 1971-12-20 | 1973-12-18 | Ibm | Bipolar transistor with a heterojunction emitter and a method fabricating the same |
US4410902A (en) * | 1981-03-23 | 1983-10-18 | The United States Of America As Represented By The Secretary Of The Army | Planar doped barrier semiconductor device |
DE3572752D1 (en) * | 1984-09-21 | 1989-10-05 | American Telephone & Telegraph | A novel semiconductor device |
US4882609A (en) * | 1984-11-19 | 1989-11-21 | Max-Planck Gesellschaft Zur Forderung Der Wissenschafter E.V. | Semiconductor devices with at least one monoatomic layer of doping atoms |
US4691215A (en) * | 1985-01-09 | 1987-09-01 | American Telephone And Telegraph Company | Hot electron unipolar transistor with two-dimensional degenerate electron gas base with continuously graded composition compound emitter |
JPS61276261A (ja) * | 1985-05-30 | 1986-12-06 | Fujitsu Ltd | 高速バイポ−ラトランジスタの製造方法 |
-
1987
- 1987-09-04 US US07/094,633 patent/US4825265A/en not_active Expired - Lifetime
-
1988
- 1988-08-30 DE DE3887716T patent/DE3887716T2/de not_active Expired - Lifetime
- 1988-08-30 EP EP88308002A patent/EP0306258B1/en not_active Expired - Lifetime
- 1988-08-31 CA CA000576146A patent/CA1286799C/en not_active Expired - Lifetime
- 1988-09-02 JP JP63218664A patent/JPS6472562A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
EP0306258A3 (en) | 1989-10-18 |
DE3887716D1 (de) | 1994-03-24 |
US4825265A (en) | 1989-04-25 |
EP0306258B1 (en) | 1994-02-09 |
EP0306258A2 (en) | 1989-03-08 |
CA1286799C (en) | 1991-07-23 |
DE3887716T2 (de) | 1994-05-19 |
JPS6472562A (en) | 1989-03-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5389554A (en) | Method for fabricating microwave heterojunction bipolar transistors with emitters designed for high power applications | |
US4959702A (en) | Si-GaP-Si heterojunction bipolar transistor (HBT) on Si substrate | |
JPH0525389B2 (en:Method) | ||
GB1598145A (en) | Semiconductor devices | |
EP0207968B1 (en) | Hot electron unipolar transistor | |
EP0177246B1 (en) | Heterojunction bipolar transistor and method of manufacturing the same | |
JP3058345B2 (ja) | 半導体素子 | |
US4716445A (en) | Heterojunction bipolar transistor having a base region of germanium | |
US5404028A (en) | Electrical junction device with lightly doped buffer region to precisely locate a p-n junction | |
US5206524A (en) | Heterostructure bipolar transistor | |
EP0197424B1 (en) | Process of fabricating a heterojunction bipolar transistor | |
US5381027A (en) | Semiconductor device having a heterojunction and a two dimensional gas as an active layer | |
Wu et al. | An AlGaAs/GaAs heterostructure-emitter bipolar transistor | |
US3500141A (en) | Transistor structure | |
US5258631A (en) | Semiconductor device having a two-dimensional electron gas as an active layer | |
EP0229672B1 (en) | A heterojunction bipolar transistor having a base region of germanium | |
JPH029133A (ja) | ダブルヘテロ接合・反転ベーストランジスタ | |
US4772932A (en) | Bipolar transistor and including gas layers between the emitter and base and the base and collector | |
Ma et al. | Influence of buffer layer thickness on DC performance of GaAs/AlGaAs heterojunction bipolar transistors grown on silicon substrates | |
JPS63200567A (ja) | ヘテロ接合バイポ−ラトランジスタおよびその製造方法 | |
EP0361759A2 (en) | Heterostructure bipolar transistor | |
Hill et al. | Uniform, high-gain AlGaAs/In/sub 0.05/Ga/sub 0.95/As/GaAs Pnp heterojunction bipolar transistors by dual selective etch process | |
JPH0738393B2 (ja) | 半導体装置 | |
JP2834172B2 (ja) | 電界効果トランジスタ | |
JP2841380B2 (ja) | ヘテロ接合バイポーラトランジスタ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080412 Year of fee payment: 15 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090412 Year of fee payment: 16 |
|
EXPY | Cancellation because of completion of term | ||
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090412 Year of fee payment: 16 |