JPH052163B2 - - Google Patents
Info
- Publication number
- JPH052163B2 JPH052163B2 JP60202371A JP20237185A JPH052163B2 JP H052163 B2 JPH052163 B2 JP H052163B2 JP 60202371 A JP60202371 A JP 60202371A JP 20237185 A JP20237185 A JP 20237185A JP H052163 B2 JPH052163 B2 JP H052163B2
- Authority
- JP
- Japan
- Prior art keywords
- pin
- position detection
- detection device
- laser beam
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 claims description 17
- 238000003384 imaging method Methods 0.000 claims description 4
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 238000005452 bending Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Supply And Installment Of Electrical Components (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60202371A JPS6262252A (ja) | 1985-09-11 | 1985-09-11 | ピン位置検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60202371A JPS6262252A (ja) | 1985-09-11 | 1985-09-11 | ピン位置検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6262252A JPS6262252A (ja) | 1987-03-18 |
| JPH052163B2 true JPH052163B2 (enExample) | 1993-01-11 |
Family
ID=16456390
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60202371A Granted JPS6262252A (ja) | 1985-09-11 | 1985-09-11 | ピン位置検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6262252A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2730054B2 (ja) * | 1988-05-25 | 1998-03-25 | 松下電器産業株式会社 | 電子部品検査装置 |
| JP4562263B2 (ja) * | 2000-09-22 | 2010-10-13 | イビデン株式会社 | モニター検査装置 |
| US6755367B2 (en) | 2002-04-02 | 2004-06-29 | International Business Machines Corporation | Sensing position of pin on tape inside cartridge shell |
-
1985
- 1985-09-11 JP JP60202371A patent/JPS6262252A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6262252A (ja) | 1987-03-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO1993011403A1 (de) | Optischer abstandssensor | |
| JP2016106225A (ja) | 3次元測定装置 | |
| JPH05502720A (ja) | 物体を光電的に測定する方法および装置 | |
| JPH04158205A (ja) | 形状計測内視鏡装置 | |
| JPH052163B2 (enExample) | ||
| KR100887184B1 (ko) | 부분 경면 물체의 형상측정 장치 및 그 방법 | |
| JP2000193428A (ja) | 被測定物の測定方法及びその装置 | |
| JPH05317256A (ja) | 眼内寸法測定装置 | |
| JP3162872B2 (ja) | 電子部品の輪郭認識装置及びその輪郭認識方法 | |
| JPH10328864A (ja) | レーザ加工装置および加工対象物の位置測定方法 | |
| JP3018003B2 (ja) | スペックルノイズの除去装置 | |
| JP2005049317A (ja) | 干渉計 | |
| JPH0222505A (ja) | レーザ干渉測定装置 | |
| JP2932418B2 (ja) | ワークの位置計測方法 | |
| JP2739739B2 (ja) | 位置ずれ検査装置 | |
| JPH0540020A (ja) | 実装済プリント基板の検査装置 | |
| JPH03195906A (ja) | 半田付け状態検査装置 | |
| JPH01320415A (ja) | 実装済プリント基板の検査装置 | |
| JPH0789057B2 (ja) | 距離測定装置 | |
| JPH10332980A (ja) | 光ファイバリボンの結像 | |
| JP2728917B2 (ja) | パターン検出方法及びその装置並びに投影露光装置 | |
| JPH07251286A (ja) | レーザ加工装置 | |
| JPH03180708A (ja) | 表面形状測定装置 | |
| JPH0419457Y2 (enExample) | ||
| JPH04171646A (ja) | 原子間力顕微鏡装置 |