JPH0512779Y2 - - Google Patents

Info

Publication number
JPH0512779Y2
JPH0512779Y2 JP1148687U JP1148687U JPH0512779Y2 JP H0512779 Y2 JPH0512779 Y2 JP H0512779Y2 JP 1148687 U JP1148687 U JP 1148687U JP 1148687 U JP1148687 U JP 1148687U JP H0512779 Y2 JPH0512779 Y2 JP H0512779Y2
Authority
JP
Japan
Prior art keywords
shoot
roof
lead
measurement
push
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1148687U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63120179U (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1148687U priority Critical patent/JPH0512779Y2/ja
Publication of JPS63120179U publication Critical patent/JPS63120179U/ja
Application granted granted Critical
Publication of JPH0512779Y2 publication Critical patent/JPH0512779Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1148687U 1987-01-30 1987-01-30 Expired - Lifetime JPH0512779Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1148687U JPH0512779Y2 (enrdf_load_stackoverflow) 1987-01-30 1987-01-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1148687U JPH0512779Y2 (enrdf_load_stackoverflow) 1987-01-30 1987-01-30

Publications (2)

Publication Number Publication Date
JPS63120179U JPS63120179U (enrdf_load_stackoverflow) 1988-08-03
JPH0512779Y2 true JPH0512779Y2 (enrdf_load_stackoverflow) 1993-04-02

Family

ID=30798746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1148687U Expired - Lifetime JPH0512779Y2 (enrdf_load_stackoverflow) 1987-01-30 1987-01-30

Country Status (1)

Country Link
JP (1) JPH0512779Y2 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2600392B2 (ja) * 1989-09-22 1997-04-16 日立電子エンジニアリング株式会社 Icデバイスのコンタクト機構
JP2535051Y2 (ja) * 1990-07-11 1997-05-07 株式会社アドバンテスト Ic搬送装置におけるic素子のicソケット接触機構

Also Published As

Publication number Publication date
JPS63120179U (enrdf_load_stackoverflow) 1988-08-03

Similar Documents

Publication Publication Date Title
JP2854276B2 (ja) 半導体素子テスト用のトレーユニット
US4782589A (en) Process of connecting lead frame to a semi-conductor device and a device to effect same
JPH0512779Y2 (enrdf_load_stackoverflow)
US6296504B1 (en) Socket for electrical parts
JP4536250B2 (ja) 通電用クリップを用いた給放電試験装置
JP3158418B2 (ja) チップ型電子部品の挟持装置
JPH0373551A (ja) チップトレイ
JP3341473B2 (ja) 板材の折り曲げ応力測定装置
JPS5844797A (ja) コンタクトを支持基板に挿入するための挿入装置
JP3469357B2 (ja) 電子部品におけるリード端子の曲げ加工装置
JPH0526904A (ja) スプリングコンタクト及びその接触方法
JPS59632Y2 (ja) 回路素子挾持装置
JPH08292228A (ja) Icデバイスの試験装置
JPH09145781A (ja) プリント回路カードおよびまたはフラットモジュールの検査装置
JPH02107978A (ja) 試験機の部品セット装置
JP3842037B2 (ja) 電気部品用ソケット
JPH10239389A (ja) 半導体装置の測定用ソケットおよび半導体装置の 測定方法
JP3772526B2 (ja) 電極挿入装置
JPH0158632B2 (enrdf_load_stackoverflow)
JPS6324454Y2 (enrdf_load_stackoverflow)
JPH034939Y2 (enrdf_load_stackoverflow)
JPH1151994A (ja) 電気接続補助装置
JPH0519823Y2 (enrdf_load_stackoverflow)
JPS6167299A (ja) 電子部品の打抜き収納装置
JPS5896748A (ja) 半導体装置の測定装置