JPH0512779Y2 - - Google Patents
Info
- Publication number
- JPH0512779Y2 JPH0512779Y2 JP1148687U JP1148687U JPH0512779Y2 JP H0512779 Y2 JPH0512779 Y2 JP H0512779Y2 JP 1148687 U JP1148687 U JP 1148687U JP 1148687 U JP1148687 U JP 1148687U JP H0512779 Y2 JPH0512779 Y2 JP H0512779Y2
- Authority
- JP
- Japan
- Prior art keywords
- shoot
- roof
- lead
- measurement
- push
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 39
- 230000006835 compression Effects 0.000 claims description 2
- 238000007906 compression Methods 0.000 claims description 2
- 230000032258 transport Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1148687U JPH0512779Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-01-30 | 1987-01-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1148687U JPH0512779Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-01-30 | 1987-01-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63120179U JPS63120179U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-08-03 |
JPH0512779Y2 true JPH0512779Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-04-02 |
Family
ID=30798746
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1148687U Expired - Lifetime JPH0512779Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1987-01-30 | 1987-01-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0512779Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2600392B2 (ja) * | 1989-09-22 | 1997-04-16 | 日立電子エンジニアリング株式会社 | Icデバイスのコンタクト機構 |
JP2535051Y2 (ja) * | 1990-07-11 | 1997-05-07 | 株式会社アドバンテスト | Ic搬送装置におけるic素子のicソケット接触機構 |
-
1987
- 1987-01-30 JP JP1148687U patent/JPH0512779Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS63120179U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-08-03 |