JPH0510617B2 - - Google Patents

Info

Publication number
JPH0510617B2
JPH0510617B2 JP58204531A JP20453183A JPH0510617B2 JP H0510617 B2 JPH0510617 B2 JP H0510617B2 JP 58204531 A JP58204531 A JP 58204531A JP 20453183 A JP20453183 A JP 20453183A JP H0510617 B2 JPH0510617 B2 JP H0510617B2
Authority
JP
Japan
Prior art keywords
sample
diffraction
surface layer
texture
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58204531A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6095336A (ja
Inventor
Michio Katayama
Takeshi Kitagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP58204531A priority Critical patent/JPS6095336A/ja
Publication of JPS6095336A publication Critical patent/JPS6095336A/ja
Publication of JPH0510617B2 publication Critical patent/JPH0510617B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP58204531A 1983-10-31 1983-10-31 表面層の集合組織測定方法及び装置 Granted JPS6095336A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58204531A JPS6095336A (ja) 1983-10-31 1983-10-31 表面層の集合組織測定方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58204531A JPS6095336A (ja) 1983-10-31 1983-10-31 表面層の集合組織測定方法及び装置

Publications (2)

Publication Number Publication Date
JPS6095336A JPS6095336A (ja) 1985-05-28
JPH0510617B2 true JPH0510617B2 (fr) 1993-02-10

Family

ID=16492078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58204531A Granted JPS6095336A (ja) 1983-10-31 1983-10-31 表面層の集合組織測定方法及び装置

Country Status (1)

Country Link
JP (1) JPS6095336A (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3731421B2 (ja) 1999-12-24 2006-01-05 豊田合成株式会社 収納ボックス

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55158544A (en) * 1979-05-29 1980-12-10 Kawasaki Steel Corp On-line measuring method of and apparatus for aggregation structure

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4736140U (fr) * 1971-05-08 1972-12-21

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55158544A (en) * 1979-05-29 1980-12-10 Kawasaki Steel Corp On-line measuring method of and apparatus for aggregation structure

Also Published As

Publication number Publication date
JPS6095336A (ja) 1985-05-28

Similar Documents

Publication Publication Date Title
KR900008955B1 (ko) 합금피막의 피막두께 및 조성 측정방법
KR101046018B1 (ko) 형광 x선 분석 장치
US5414747A (en) Method and apparatus for in-process analysis of polycrystalline films and coatings by x-ray diffraction
JPS6052706A (ja) 膜厚測定装置
US5289266A (en) Noncontact, on-line determination of phosphate layer thickness and composition of a phosphate coated surface
CA1052479A (fr) Methode de mesure du degre d'alliage des toles d'acier galvanisees au recuit
CA1320008C (fr) Methode et appareil de determination simultanee de l'epaisseur et de la composition d'une pellicule
JPH0510617B2 (fr)
Knoth et al. Examination of layered structures by total-reflection X-ray fluorescence analysis
Baumvol New trends in hard coatings technology
JPH0619268B2 (ja) 金属上塗膜の厚さ測定方法
JP4302852B2 (ja) 金属材表面酸化物の測定方法およびx線回折装置
JPH06347247A (ja) めっき層合金相厚さの測定方法
JPS649575B2 (fr)
KR100489298B1 (ko) ×선 회절을 이용한 합금화 용융 아연 도금 강판의합금화도 측정 방법
JP2873125B2 (ja) めっき付着量の測定方法および装置
De Buyser et al. X‐Ray Measurement of Residual Stresses in Textured Thin Coatings
JPS61100643A (ja) 合金メツキ被膜のx線分析方法
JPS6058537A (ja) Fe−Ζn合金メツキ鋼板のメツキ定量方法
JPH0610660B2 (ja) 合金被膜の膜厚及び組成測定方法
JP3047563B2 (ja) X線回折法による膜厚測定方法
JPS6014109A (ja) めつき鋼板のめつき付着量測定装置
JPS6367121B2 (fr)
Bolle et al. X-ray diffraction study of concentration depth profiles of binary alloy coatings during thermal diffusion: application to brass coating
JPH03272441A (ja) 合金皮膜の組成および付着量測定方法