JPH04948B2 - - Google Patents

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Publication number
JPH04948B2
JPH04948B2 JP60053277A JP5327785A JPH04948B2 JP H04948 B2 JPH04948 B2 JP H04948B2 JP 60053277 A JP60053277 A JP 60053277A JP 5327785 A JP5327785 A JP 5327785A JP H04948 B2 JPH04948 B2 JP H04948B2
Authority
JP
Japan
Prior art keywords
target
silicon nitride
silicon
density
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60053277A
Other languages
Japanese (ja)
Other versions
JPS61215259A (en
Inventor
Shigeo Mizoguchi
Yasunobu Yoshinaga
Kazuo Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHINKU ZAIRYO KK
Original Assignee
SHINKU ZAIRYO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHINKU ZAIRYO KK filed Critical SHINKU ZAIRYO KK
Priority to JP60053277A priority Critical patent/JPS61215259A/en
Publication of JPS61215259A publication Critical patent/JPS61215259A/en
Publication of JPH04948B2 publication Critical patent/JPH04948B2/ja
Granted legal-status Critical Current

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  • Ceramic Products (AREA)
  • Physical Vapour Deposition (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

(産業上の利用分野) 本発明はスパツタリングにより保護膜を形成す
る場合等に使用される窒化ケイ素ターゲツトの製
法に関する。 (従来の技術) 従来、窒化ケイ素ターケツトは焼結して製造さ
れるが、焼結性を持たせるためにイツトリアや酸
化マグネシウムを数%添加して焼結することを一
般としている。 (発明が解決しようとする問題点) 前記のようにイツトリア等を添加したターゲツ
トをスパツタリングして基板に保護膜を形成する
に使用すると、保護膜が色彩を帯びたり或は密着
性が不良になる欠点が発生する。またイツトリア
は高価であり安価な窒化ケイ素ターゲツトを得ら
れない欠点がある。 こうした欠点の改善のために反応焼結法により
該ターゲツトを製造することも提案されたが、未
反応のケイ素が保護膜の形成を阻害する欠点がな
お存する。 本発明はこうした欠点を解決し安価で成膜性の
良い窒化ケイ素ターゲツトを得る製法を提供する
ことを目的とするものである。 (問題点を解決するための手段) 本発明では、窒化ケイ素と二酸化ケイ素の粉末
を、重量比で70:30乃至95:5の割合で混合した
のち焼成するようにした。 (作用) 窒化ケイ素と共通の元素(シリコン)を有する
二酸化ケイ素はバインダーとして作用し、両者を
70:30乃至95:5の割合で混合して焼成して得ら
れた窒化ケイ素ターゲツトは、窒化ケイ素にイツ
トリア又は酸化マグネシウムを添加して焼成した
従来のターゲツトよりも密度は低いが反応焼結法
によるターゲツトとほぼ同等の密度が得られ比較
的焼結性が良好であつた。また本発明による窒化
ケイ素ターゲツトはスパツタ電力も十分にとれ、
スパツタリングレートも満足するものであつた。
さらに形成された薄膜は着色がなく、保護膜とし
ての性能も従来のイツトリア等を混入したターゲ
ツトによるものと変りがなかつた。 (実施例) 本発明の実施例は次の通りである。 実施例 1 窒化ケイ素粉末70部に対し二酸化ケイ素粉末30
部を混合し、これを金型に入れて焼結成形した。
これによつて得たテストピースについて密度を測
定した結果、表1に示すように2.3g/cm3で、後
記の比較例1による従来の製法によるテストピー
スよりも密度は小さいが比較例2による従来の製
法によるテストピースの密度と略同等であつた。 さらに直径4インチ、厚さ6mmのターゲツトに
ついて、一定条件下でメタルボンデングを行なつ
た後、膜形成率を測定し、形成膜の密着性、着色
の具合を肉眼で観察した結果、表2に示すように
膜形成率は0.4(μm/h)/(V・A/cm2)で密
着性も良く無色の保護膜が得られた。 実施例 2 窒化ケイ素粉末80部に対し、二酸化ケイ素粉末
20部を混合し、これを金型に入れ焼結成形した。
これによつて得たテストピースの密度を測定した
結果、表1に示すように2.2g/cm3で後記の比較
例2の場合と余り変わりがなかつた。さらに直径
4インチ厚さ6mmのターゲツトについて一定条件
下でのメタルボンテイングを行なつた後、膜形成
率を測定し、形成膜の密着性及び着色の具合を肉
眼で観察したところ表2に示すように実施例1と
同様であつた。 実施例 3 窒化ケイ素粉末95部に対し、二酸化ケイ素粉末
5部を混合し、金型に入れ焼結成形した。これに
よつて得たテストピースについての密度の測定の
結果は表1の如くであり、直径4インチ、厚さ6
mmのターゲツトについて一定条件下でメタルボン
デイングを行なつた後、膜形成率を測定し、密着
性、着色の具合を肉眼で観察した結果は表2の通
り実施例1と同様であつた。 比較例 1 窒化ケイ素粉末95部酸化マグネシウム粉末3部
イツトリア粉末2部を混合し、金型に入れ焼結成
形する従来の製法によりテストピースを形成し、
これの密度を測定した結果を表1に示す。さらに
直径4インチ、厚さ6mmのターゲツトについて、
一定条件下でのメタルボンデイングを行なつた
後、膜形成率を測定し、形成膜の密着性や着色の
具合を肉眼で観察した結果は表2の通りである。 比較例 2 金属ケイ素粉末を金型に入れ、高温条件下で窒
素ガスを反応させる従来高知の反応焼結法により
製作したテストピースの密度は表1に示すように
2.4g/cm3であり、比較例1と同様に直径4イン
チ、厚さ6mmのターゲツトを製作してこれを一定
条件下でメタルボンデイングを行なつた後、膜形
成率を測定し、形成膜の密着性、着色の具合を肉
眼で観察した結果は表2の通りである。
(Industrial Application Field) The present invention relates to a method for manufacturing a silicon nitride target used when forming a protective film by sputtering. (Prior Art) Conventionally, silicon nitride tarkets are manufactured by sintering, but it is common to add several percent of itria or magnesium oxide and sintering to give them sinterability. (Problems to be Solved by the Invention) When a target to which itria or the like is added as described above is used to form a protective film on a substrate by sputtering, the protective film becomes colored or the adhesion becomes poor. Defects occur. Furthermore, itria is expensive and has the disadvantage that it cannot be used as a cheap silicon nitride target. Although it has been proposed to manufacture the target by a reactive sintering method in order to overcome these drawbacks, there still remains the drawback that unreacted silicon inhibits the formation of a protective film. The object of the present invention is to solve these drawbacks and provide a manufacturing method for obtaining a silicon nitride target that is inexpensive and has good film formation properties. (Means for Solving the Problems) In the present invention, silicon nitride and silicon dioxide powders are mixed in a weight ratio of 70:30 to 95:5 and then fired. (Function) Silicon dioxide, which has the same element (silicon) as silicon nitride, acts as a binder and binds both.
The silicon nitride target obtained by mixing and firing at a ratio of 70:30 to 95:5 has a lower density than the conventional target made by adding ytria or magnesium oxide to silicon nitride and firing, but it is possible to use the reaction sintering method. The density was almost the same as that of the target, and the sinterability was relatively good. In addition, the silicon nitride target according to the present invention has sufficient sputtering power.
The sputtering rate was also satisfactory.
Furthermore, the thin film formed was not colored, and its performance as a protective film was the same as that of a conventional target mixed with itria or the like. (Example) Examples of the present invention are as follows. Example 1 70 parts of silicon nitride powder to 30 parts of silicon dioxide powder
The mixture was mixed and put into a mold and sintered.
As a result of measuring the density of the test piece obtained in this way, as shown in Table 1, the density was 2.3 g/ cm3 , which is lower than the test piece made by the conventional method according to Comparative Example 1 described later, but compared to Comparative Example 2. The density was approximately the same as that of a test piece made using a conventional manufacturing method. Furthermore, after metal bonding was performed under certain conditions on a target with a diameter of 4 inches and a thickness of 6 mm, the film formation rate was measured, and the adhesion and coloring of the formed film were observed with the naked eye. As shown in the figure, the film formation rate was 0.4 (μm/h)/(VA/cm 2 ), and a colorless protective film with good adhesion was obtained. Example 2 Silicon dioxide powder to 80 parts of silicon nitride powder
20 parts were mixed, and this was put into a mold and sintered.
The density of the test piece thus obtained was measured, and as shown in Table 1, it was 2.2 g/cm 3 , which was not much different from that of Comparative Example 2 described later. Furthermore, after performing metal bonding under certain conditions on a target with a diameter of 4 inches and a thickness of 6 mm, the film formation rate was measured, and the adhesion and coloring of the formed film were observed with the naked eye, as shown in Table 2. It was the same as in Example 1. Example 3 95 parts of silicon nitride powder and 5 parts of silicon dioxide powder were mixed, and the mixture was placed in a mold and sintered. The density measurement results for the test pieces obtained in this way are as shown in Table 1, with a diameter of 4 inches and a thickness of 6 inches.
After metal bonding was carried out under certain conditions on a target of mm, the film formation rate was measured, and the adhesion and coloring were visually observed, and the results were the same as in Example 1 as shown in Table 2. Comparative Example 1 A test piece was formed by a conventional method of mixing 95 parts of silicon nitride powder, 3 parts of magnesium oxide powder, and 2 parts of ittria powder, and placing the mixture in a mold and sintering it.
Table 1 shows the results of measuring the density of this. Furthermore, for a target with a diameter of 4 inches and a thickness of 6 mm,
After metal bonding was performed under certain conditions, the film formation rate was measured, and the adhesion and coloring of the formed film were observed with the naked eye. The results are shown in Table 2. Comparative Example 2 The density of the test piece manufactured by the conventional Kochi reaction sintering method, in which metal silicon powder is placed in a mold and reacted with nitrogen gas under high temperature conditions, is as shown in Table 1.
2.4 g/cm 3 , a target with a diameter of 4 inches and a thickness of 6 mm was prepared in the same manner as in Comparative Example 1, and after metal bonding was performed on this under certain conditions, the film formation rate was measured and the formed film was measured. The results of visual observation of the adhesion and coloring are shown in Table 2.

【表】【table】

【表】 (発明の効果) このように本発明に於ては、窒化ケイ素と二酸
化ケイ素の粉末を重量比で70:3乃至95:5の割
合で混合したのち焼成してスパツタリング用窒化
ケイ素ターゲツトを製作するようにしたので、安
価で焼結性の良いターゲツトが得られ、これを使
用して形成した保護膜は無色で遊離ケイ素の突起
などが無く、さらに膜形成率も良く、良好な保護
膜を迅速に形成出来る等の効果がある。
[Table] (Effects of the invention) As described above, in the present invention, silicon nitride and silicon dioxide powders are mixed in a weight ratio of 70:3 to 95:5 and then fired to form a silicon nitride target for sputtering. By using this method, we were able to obtain an inexpensive target with good sinterability, and the protective film formed using this target was colorless and had no free silicon protrusions, and had a good film formation rate, providing good protection. It has the advantage of being able to quickly form a film.

Claims (1)

【特許請求の範囲】[Claims] 1 窒化ケイ素と二酸化ケイ素の粉末を、重量比
で70:30乃至95:5の割合で混合したのち焼成す
ることを特徴とするスパツタリング用窒化ケイ素
ターゲツトの製法。
1. A method for producing a silicon nitride target for sputtering, which comprises mixing powders of silicon nitride and silicon dioxide at a weight ratio of 70:30 to 95:5 and then firing the mixture.
JP60053277A 1985-03-19 1985-03-19 Manufacture of silicon nitride target for sputtering Granted JPS61215259A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60053277A JPS61215259A (en) 1985-03-19 1985-03-19 Manufacture of silicon nitride target for sputtering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60053277A JPS61215259A (en) 1985-03-19 1985-03-19 Manufacture of silicon nitride target for sputtering

Publications (2)

Publication Number Publication Date
JPS61215259A JPS61215259A (en) 1986-09-25
JPH04948B2 true JPH04948B2 (en) 1992-01-09

Family

ID=12938241

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60053277A Granted JPS61215259A (en) 1985-03-19 1985-03-19 Manufacture of silicon nitride target for sputtering

Country Status (1)

Country Link
JP (1) JPS61215259A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0283261A (en) * 1988-09-21 1990-03-23 Shin Etsu Chem Co Ltd Silicon nitride-based target material for sputtering
JP5206111B2 (en) * 2008-05-19 2013-06-12 大日本印刷株式会社 Raw material powder for ion plating evaporation source material, ion plating evaporation source material and manufacturing method thereof, and gas barrier sheet manufacturing method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54123110A (en) * 1978-03-17 1979-09-25 Tokyo Shibaura Electric Co Production of siliconee ceramics
JPS56141153A (en) * 1980-04-03 1981-11-04 Toshiba Corp Target for x-ray tube
JPS56169773A (en) * 1980-05-30 1981-12-26 Sharp Corp Target for spattering by plenar magnetron
JPS5774177A (en) * 1980-10-29 1982-05-10 Toshiba Corp Thin film thermal head
JPS5874585A (en) * 1981-10-26 1983-05-06 三菱マテリアル株式会社 Surface clad silicon nitride base sintered member for high speed cutting
JPS58118273A (en) * 1982-01-06 1983-07-14 Hitachi Ltd Heat-sensitive recording head
JPS58161975A (en) * 1982-03-16 1983-09-26 日本特殊陶業株式会社 Manufacture of silicon nitride sintered body
JPS58204451A (en) * 1982-05-21 1983-11-29 Seiko Epson Corp X-ray generator

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54123110A (en) * 1978-03-17 1979-09-25 Tokyo Shibaura Electric Co Production of siliconee ceramics
JPS56141153A (en) * 1980-04-03 1981-11-04 Toshiba Corp Target for x-ray tube
JPS56169773A (en) * 1980-05-30 1981-12-26 Sharp Corp Target for spattering by plenar magnetron
JPS5774177A (en) * 1980-10-29 1982-05-10 Toshiba Corp Thin film thermal head
JPS5874585A (en) * 1981-10-26 1983-05-06 三菱マテリアル株式会社 Surface clad silicon nitride base sintered member for high speed cutting
JPS58118273A (en) * 1982-01-06 1983-07-14 Hitachi Ltd Heat-sensitive recording head
JPS58161975A (en) * 1982-03-16 1983-09-26 日本特殊陶業株式会社 Manufacture of silicon nitride sintered body
JPS58204451A (en) * 1982-05-21 1983-11-29 Seiko Epson Corp X-ray generator

Also Published As

Publication number Publication date
JPS61215259A (en) 1986-09-25

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