JPH049441B2 - - Google Patents
Info
- Publication number
- JPH049441B2 JPH049441B2 JP59053347A JP5334784A JPH049441B2 JP H049441 B2 JPH049441 B2 JP H049441B2 JP 59053347 A JP59053347 A JP 59053347A JP 5334784 A JP5334784 A JP 5334784A JP H049441 B2 JPH049441 B2 JP H049441B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- scattered light
- objective lens
- filter
- light receiving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 20
- 238000001514 detection method Methods 0.000 claims description 12
- 238000005259 measurement Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000004907 flux Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000002411 adverse Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59053347A JPS60196605A (ja) | 1984-03-19 | 1984-03-19 | 散乱光検出光学装置 |
US06/711,163 US4690565A (en) | 1984-03-19 | 1985-03-13 | Optical apparatus for the detection of scattered light |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59053347A JPS60196605A (ja) | 1984-03-19 | 1984-03-19 | 散乱光検出光学装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60196605A JPS60196605A (ja) | 1985-10-05 |
JPH049441B2 true JPH049441B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-02-20 |
Family
ID=12940238
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59053347A Granted JPS60196605A (ja) | 1984-03-19 | 1984-03-19 | 散乱光検出光学装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US4690565A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
JP (1) | JPS60196605A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3540916A1 (de) * | 1985-11-19 | 1987-05-21 | Zeiss Carl Fa | Verfahren und vorrichtung zur raster-lichtmikroskopischen darstellung von objekten im dunkelfeld |
JPH0810191B2 (ja) * | 1987-03-31 | 1996-01-31 | 株式会社島津製作所 | 散乱光検出装置 |
US4964726A (en) * | 1988-09-27 | 1990-10-23 | General Electric Company | Apparatus and method for optical dimension measurement using interference of scattered electromagnetic energy |
FR2656465B1 (fr) * | 1989-12-21 | 1992-05-07 | France Etat | Procede de mesure des dimensions d'un espaceur. |
DE4344650C1 (de) * | 1993-12-24 | 1995-01-26 | Mtu Muenchen Gmbh | Signaleinrichtung für Turbomaschinen |
DE19806124C1 (de) * | 1998-02-14 | 1999-06-24 | Leuze Electronic Gmbh & Co | Sensor |
JP3691404B2 (ja) * | 2001-02-28 | 2005-09-07 | 株式会社日立国際電気 | 微小寸法測定装置 |
JP4532930B2 (ja) * | 2004-02-20 | 2010-08-25 | オリンパス株式会社 | 暗視野照明装置 |
US10345571B2 (en) * | 2014-01-30 | 2019-07-09 | Karl Storz Endovision, Inc. | Intelligent light source |
EP3613344B1 (en) * | 2018-08-23 | 2021-08-04 | Nokia Technologies Oy | Photodetector apparatus for measuring heart rate |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2852693A (en) * | 1953-01-13 | 1958-09-16 | Standard Oil Co | Method and apparatus for measuring the optical properties of liquids |
JPS56126747A (en) * | 1980-03-12 | 1981-10-05 | Hitachi Ltd | Inspecting method for flaw, alien substance and the like on surface of sample and device therefor |
-
1984
- 1984-03-19 JP JP59053347A patent/JPS60196605A/ja active Granted
-
1985
- 1985-03-13 US US06/711,163 patent/US4690565A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS60196605A (ja) | 1985-10-05 |
US4690565A (en) | 1987-09-01 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |