JPH0480347B2 - - Google Patents

Info

Publication number
JPH0480347B2
JPH0480347B2 JP58180689A JP18068983A JPH0480347B2 JP H0480347 B2 JPH0480347 B2 JP H0480347B2 JP 58180689 A JP58180689 A JP 58180689A JP 18068983 A JP18068983 A JP 18068983A JP H0480347 B2 JPH0480347 B2 JP H0480347B2
Authority
JP
Japan
Prior art keywords
integrated circuit
rotary table
circuit components
jig
transport jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58180689A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6074542A (ja
Inventor
Takeshi Urushibara
Osami Asai
Setsuo Arikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58180689A priority Critical patent/JPS6074542A/ja
Publication of JPS6074542A publication Critical patent/JPS6074542A/ja
Publication of JPH0480347B2 publication Critical patent/JPH0480347B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P74/00—

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP58180689A 1983-09-30 1983-09-30 集積回路部品用自動検査装置 Granted JPS6074542A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58180689A JPS6074542A (ja) 1983-09-30 1983-09-30 集積回路部品用自動検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58180689A JPS6074542A (ja) 1983-09-30 1983-09-30 集積回路部品用自動検査装置

Publications (2)

Publication Number Publication Date
JPS6074542A JPS6074542A (ja) 1985-04-26
JPH0480347B2 true JPH0480347B2 (OSRAM) 1992-12-18

Family

ID=16087584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58180689A Granted JPS6074542A (ja) 1983-09-30 1983-09-30 集積回路部品用自動検査装置

Country Status (1)

Country Link
JP (1) JPS6074542A (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114137260A (zh) * 2021-11-26 2022-03-04 国网湖北省电力有限公司直流运检公司 一种柔性直流输电换流阀功率单元试验装置及试验方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6311876A (ja) * 1986-07-02 1988-01-19 Mitsubishi Electric Corp 半導体装置の特性検査・抜き取り分類装置
JP5083222B2 (ja) * 2009-01-05 2012-11-28 パナソニック株式会社 パレット自動交換装置
CN112246690A (zh) * 2020-09-02 2021-01-22 江苏盐芯微电子有限公司 一种集成电路封装芯片的分类装置
CN114814552B (zh) * 2022-05-09 2023-07-28 山东多瑞电子科技有限公司 一种用于温湿度传感器双层电路板的全自动检测装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114137260A (zh) * 2021-11-26 2022-03-04 国网湖北省电力有限公司直流运检公司 一种柔性直流输电换流阀功率单元试验装置及试验方法
CN114137260B (zh) * 2021-11-26 2023-06-27 国网湖北省电力有限公司直流运检公司 一种柔性直流输电换流阀功率单元试验装置及试验方法

Also Published As

Publication number Publication date
JPS6074542A (ja) 1985-04-26

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