JPH0478173B2 - - Google Patents
Info
- Publication number
- JPH0478173B2 JPH0478173B2 JP61133860A JP13386086A JPH0478173B2 JP H0478173 B2 JPH0478173 B2 JP H0478173B2 JP 61133860 A JP61133860 A JP 61133860A JP 13386086 A JP13386086 A JP 13386086A JP H0478173 B2 JPH0478173 B2 JP H0478173B2
- Authority
- JP
- Japan
- Prior art keywords
- copper
- lead wire
- wire
- film
- corrosion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/015—Manufacture or treatment of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/521—Structures or relative sizes of bond wires
- H10W72/522—Multilayered bond wires, e.g. having a coating concentric around a core
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5525—Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/553—Materials of bond wires not comprising solid metals or solid metalloids, e.g. polymers, ceramics or liquids
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/555—Materials of bond wires of outermost layers of multilayered bond wires, e.g. material of a coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Wire Bonding (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61133860A JPS62291123A (ja) | 1986-06-11 | 1986-06-11 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61133860A JPS62291123A (ja) | 1986-06-11 | 1986-06-11 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62291123A JPS62291123A (ja) | 1987-12-17 |
| JPH0478173B2 true JPH0478173B2 (enExample) | 1992-12-10 |
Family
ID=15114737
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61133860A Granted JPS62291123A (ja) | 1986-06-11 | 1986-06-11 | 半導体装置の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62291123A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4740773B2 (ja) * | 2003-04-16 | 2011-08-03 | 新光電気工業株式会社 | リードフレーム、半導体装置及びリードフレームの製造方法 |
| JP4705078B2 (ja) * | 2006-08-31 | 2011-06-22 | 新日鉄マテリアルズ株式会社 | 半導体装置用銅合金ボンディングワイヤ |
| DE102018107563B4 (de) | 2018-03-29 | 2022-03-03 | Infineon Technologies Austria Ag | Halbleitervorrichtung mit kupferstruktur und verfahren zur herstellung einer halbleitervorrichung |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60224255A (ja) * | 1984-04-20 | 1985-11-08 | Hitachi Cable Ltd | ボンデイングワイヤ及びその製造方法 |
| JPS6175554A (ja) * | 1984-09-21 | 1986-04-17 | Hitachi Ltd | 半導体装置 |
-
1986
- 1986-06-11 JP JP61133860A patent/JPS62291123A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62291123A (ja) | 1987-12-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR900007303B1 (ko) | 수지봉지형 반도체장치 | |
| US6566253B2 (en) | Method of making electrical interconnection for attachment to a substrate | |
| US4472730A (en) | Semiconductor device having an improved moisture resistance | |
| US5825078A (en) | Hermetic protection for integrated circuits | |
| US6933614B2 (en) | Integrated circuit die having a copper contact and method therefor | |
| US6452271B2 (en) | Interconnect component for a semiconductor die including a ruthenium layer and a method for its fabrication | |
| JPS62145758A (ja) | パラジウムを用いる銅製ボンデイングパツドの酸化防止法 | |
| TW202030846A (zh) | 半導體裝置及製造方法 | |
| JP3345397B2 (ja) | アルミニウム合金金属化層の腐食抑制保護層およびその製法 | |
| US5780931A (en) | Surface mounting semiconductor device and semiconductor mounting component | |
| IE53902B1 (en) | Process for fabricating a semiconductor device having a phosphosilicate glass layer | |
| JPH0478173B2 (enExample) | ||
| US6479402B1 (en) | Method to improve adhesion of molding compound by providing an oxygen rich film over the top surface of a passivation layer | |
| JP3274381B2 (ja) | 半導体装置の突起電極形成方法 | |
| Chyan et al. | Mechanistic Investigation and Prevention of Al Bond Pad Corrosion in Cu Wire-bonded Device Assembly | |
| GB2134709A (en) | Semiconductor device and fabrication method thereof | |
| US3714521A (en) | Semiconductor device or monolithic integrated circuit with tungsten interconnections | |
| JP3590603B2 (ja) | 半導体装置およびその製造方法 | |
| JP3326466B2 (ja) | 半導体素子の電極形成方法 | |
| JPH0546978B2 (enExample) | ||
| JP2892055B2 (ja) | 樹脂封止型半導体素子 | |
| JPS6310547A (ja) | 半導体装置 | |
| JPS63266844A (ja) | 半導体装置の製造方法 | |
| JPS5949687B2 (ja) | 半導体装置 | |
| JPS63272042A (ja) | 半導体装置 |