JPH047446B2 - - Google Patents
Info
- Publication number
- JPH047446B2 JPH047446B2 JP58163494A JP16349483A JPH047446B2 JP H047446 B2 JPH047446 B2 JP H047446B2 JP 58163494 A JP58163494 A JP 58163494A JP 16349483 A JP16349483 A JP 16349483A JP H047446 B2 JPH047446 B2 JP H047446B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- wavefront
- measurement
- shape
- plane mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58163494A JPS6055213A (ja) | 1983-09-06 | 1983-09-06 | 波面形状測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58163494A JPS6055213A (ja) | 1983-09-06 | 1983-09-06 | 波面形状測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6055213A JPS6055213A (ja) | 1985-03-30 |
JPH047446B2 true JPH047446B2 (enrdf_load_stackoverflow) | 1992-02-12 |
Family
ID=15774928
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58163494A Granted JPS6055213A (ja) | 1983-09-06 | 1983-09-06 | 波面形状測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6055213A (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0613443Y2 (ja) * | 1985-04-22 | 1994-04-06 | 株式会社リコー | 波面形状測定器 |
US4743118A (en) * | 1985-04-04 | 1988-05-10 | Ricoh Company, Ltd. | Method of detecting origin of shear and measuring amount of shear in shearing interferometer systems |
JPH02238306A (ja) * | 1989-03-13 | 1990-09-20 | Ricoh Co Ltd | 微小変位測定装置 |
WO2015052715A1 (en) * | 2013-10-07 | 2015-04-16 | Ramot At Tel-Aviv University Ltd. | Polarization-independent differential interference contrast optical arrangement |
-
1983
- 1983-09-06 JP JP58163494A patent/JPS6055213A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6055213A (ja) | 1985-03-30 |
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