JPH04506411A - 平面状および立体状検査材料の無接触検査方法および装置 - Google Patents

平面状および立体状検査材料の無接触検査方法および装置

Info

Publication number
JPH04506411A
JPH04506411A JP3501170A JP50117091A JPH04506411A JP H04506411 A JPH04506411 A JP H04506411A JP 3501170 A JP3501170 A JP 3501170A JP 50117091 A JP50117091 A JP 50117091A JP H04506411 A JPH04506411 A JP H04506411A
Authority
JP
Japan
Prior art keywords
light
test material
photoelectric converter
intensity
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3501170A
Other languages
English (en)
Japanese (ja)
Inventor
ショエップス　ヴィルフリート
Original Assignee
オプトコントロール　アクチェンゲゼルシャフト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by オプトコントロール　アクチェンゲゼルシャフト filed Critical オプトコントロール　アクチェンゲゼルシャフト
Publication of JPH04506411A publication Critical patent/JPH04506411A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP3501170A 1990-01-06 1991-01-07 平面状および立体状検査材料の無接触検査方法および装置 Pending JPH04506411A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH31/90-7 1990-01-06
CH31/90A CH681112A5 (en, 2012) 1990-01-06 1990-01-06

Publications (1)

Publication Number Publication Date
JPH04506411A true JPH04506411A (ja) 1992-11-05

Family

ID=4177789

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3501170A Pending JPH04506411A (ja) 1990-01-06 1991-01-07 平面状および立体状検査材料の無接触検査方法および装置

Country Status (9)

Country Link
EP (1) EP0462240A1 (en, 2012)
JP (1) JPH04506411A (en, 2012)
KR (1) KR920701784A (en, 2012)
AU (1) AU6911891A (en, 2012)
BR (1) BR9103915A (en, 2012)
CA (1) CA2050316A1 (en, 2012)
CH (1) CH681112A5 (en, 2012)
RU (1) RU2058546C1 (en, 2012)
WO (1) WO1991010891A1 (en, 2012)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005147750A (ja) * 2003-11-12 2005-06-09 Boeing Co:The 複合構造内の欠陥を識別するためのシステム
JP2007039335A (ja) * 1998-11-24 2007-02-15 Nippon Electric Glass Co Ltd セラミックス物品の製造方法
JP2018159931A (ja) * 2015-03-31 2018-10-11 浜松ホトニクス株式会社 投影表示装置

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH683293A5 (de) * 1991-12-20 1994-02-15 Peyer Ag Siegfried Fremdfasererkennung in Garnen.
AT1797U1 (de) * 1996-07-23 1997-11-25 Mte Messgeraete Entwicklungs U Optoelektronisches messsystem zur vermessung und identifikation von flachglasprodukten
US6100537A (en) * 1997-07-22 2000-08-08 "MTE" Messgerate, Entwicklungs- und Vertriebsgesellschaft mbH Measuring system for recognition of surface features
DE19801140A1 (de) 1998-01-14 1999-07-15 Voith Sulzer Papiertech Patent Vorrichtung zum direkten oder indirekten Auftrag eines flüssigen bis pastösen Auftragsmediums auf eine laufende Materialbahn sowie Betriebsverfahren für eine solche Vorrichtung
CN1195702C (zh) 1998-11-24 2005-04-06 日本电气硝子株式会社 陶瓷制品
FR2817964B1 (fr) * 2000-12-11 2003-03-14 Usinor Dispositif d'inspection automatique de surface d'une bande en defilement
EP1498723A1 (de) * 2003-07-17 2005-01-19 Hauni Maschinbau AG Verfahren zum Erkennen von Fremdkörpern innerhalb eines kontinuierlich geführten Produktstroms und Vorrichtung zur Durchführung desselben
US7640073B2 (en) 2005-04-14 2009-12-29 Jeld-Wen, Inc. Systems and methods of identifying and manipulating objects
RU2319117C1 (ru) * 2006-04-21 2008-03-10 Федеральное государственное унитарное предприятие "Центральный институт авиационного моторостроения имени П.И. Баранова" Устройство для определения углового распределения излучения, отраженного от исследуемой поверхности объекта
RU2540939C2 (ru) * 2013-05-24 2015-02-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Сибирская государственная геодезическая академия" (ФГБОУ ВПО "СГГА") Способ определения координат контрольной точки объекта с применением наземного лазерного сканера
DE102013221334A1 (de) * 2013-10-21 2015-04-23 Volkswagen Aktiengesellschaft Verfahren und Messvorrichtung zum Bewerten von Strukturunterschieden einer reflektierenden Oberfläche
RU178901U1 (ru) * 2017-10-30 2018-04-23 Олег Александрович Продоус Устройство для бесконтактного измерения шероховатости поверхности

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL240616A (en, 2012) * 1958-06-30
US3019346A (en) * 1960-03-28 1962-01-30 Jones & Laughlin Steel Corp Electronic surface inspection system
US3693021A (en) * 1970-06-29 1972-09-19 Eastman Kodak Co Web inspection system using interlaced photocells
US4594001A (en) * 1981-07-07 1986-06-10 Robotic Vision Systems, Inc. Detection of three-dimensional information with a projected plane of light
US4650333A (en) * 1984-04-12 1987-03-17 International Business Machines Corporation System for measuring and detecting printed circuit wiring defects
GB2159271B (en) * 1984-04-27 1988-05-18 Nissan Motor Surface flaw detecting method and apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007039335A (ja) * 1998-11-24 2007-02-15 Nippon Electric Glass Co Ltd セラミックス物品の製造方法
JP2005147750A (ja) * 2003-11-12 2005-06-09 Boeing Co:The 複合構造内の欠陥を識別するためのシステム
JP2018159931A (ja) * 2015-03-31 2018-10-11 浜松ホトニクス株式会社 投影表示装置
US10197895B2 (en) 2015-03-31 2019-02-05 Hamamatsu Photonics K.K. Projection display device

Also Published As

Publication number Publication date
RU2058546C1 (ru) 1996-04-20
KR920701784A (ko) 1992-08-12
CA2050316A1 (en) 1991-07-07
CH681112A5 (en, 2012) 1993-01-15
BR9103915A (pt) 1992-03-03
EP0462240A1 (de) 1991-12-27
AU6911891A (en) 1991-08-05
WO1991010891A1 (de) 1991-07-25

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