JPH0450528B2 - - Google Patents
Info
- Publication number
- JPH0450528B2 JPH0450528B2 JP5393283A JP5393283A JPH0450528B2 JP H0450528 B2 JPH0450528 B2 JP H0450528B2 JP 5393283 A JP5393283 A JP 5393283A JP 5393283 A JP5393283 A JP 5393283A JP H0450528 B2 JPH0450528 B2 JP H0450528B2
- Authority
- JP
- Japan
- Prior art keywords
- flaw
- circuit
- output
- signal
- representative
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 13
- 238000007689 inspection Methods 0.000 claims description 7
- 238000000605 extraction Methods 0.000 claims description 4
- 238000010521 absorption reaction Methods 0.000 description 7
- 229910000831 Steel Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000010959 steel Substances 0.000 description 3
- 230000002745 absorbent Effects 0.000 description 2
- 239000002250 absorbent Substances 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000013139 quantization Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5393283A JPS59180346A (ja) | 1983-03-31 | 1983-03-31 | 表面検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5393283A JPS59180346A (ja) | 1983-03-31 | 1983-03-31 | 表面検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59180346A JPS59180346A (ja) | 1984-10-13 |
JPH0450528B2 true JPH0450528B2 (enrdf_load_stackoverflow) | 1992-08-14 |
Family
ID=12956505
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5393283A Granted JPS59180346A (ja) | 1983-03-31 | 1983-03-31 | 表面検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59180346A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0623646B2 (ja) * | 1986-03-10 | 1994-03-30 | 工業技術院長 | 撮像式塗装下地処理面グレ−ド判定装置 |
-
1983
- 1983-03-31 JP JP5393283A patent/JPS59180346A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59180346A (ja) | 1984-10-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR850000855B1 (ko) | 흠(hurt)검사 장치 | |
JPH01143945A (ja) | テープ欠陥検出方法 | |
US3779649A (en) | Method of and an electro-optical system for inspecting material | |
JP3218908B2 (ja) | 表面疵検査方法及びその装置 | |
JPH0450528B2 (enrdf_load_stackoverflow) | ||
EP0423794B1 (en) | Surface inspecting apparatus | |
JPH079403B2 (ja) | 物体の表面欠陥検査方法 | |
JPH09113465A (ja) | 亜鉛メッキ系鋼板用表面欠陥検出装置 | |
JPH0829145A (ja) | 表面欠陥検査方法 | |
JPS6142221B2 (enrdf_load_stackoverflow) | ||
JPS61260147A (ja) | 表面欠陥検査装置 | |
US5402228A (en) | On-line dirt counter | |
JPS6344151A (ja) | 外観検査装置 | |
JP3523945B2 (ja) | 表面検査方法 | |
JPS6321857B2 (enrdf_load_stackoverflow) | ||
JPS593245A (ja) | 欠陥検査装置 | |
JPH04238207A (ja) | 欠陥検査装置 | |
JPH0749314A (ja) | 表面欠陥検査装置 | |
JPH09133639A (ja) | 表面欠陥検査方法 | |
CA2080587C (en) | On-line dirt counter | |
JPH0610658B2 (ja) | 表面欠陥検出装置 | |
JPH06294758A (ja) | 欠陥検出装置 | |
JPS5892936A (ja) | 欠陥検査装置 | |
JPH01253641A (ja) | 筋状欠陥弁別処理回路 | |
JPH0326447Y2 (enrdf_load_stackoverflow) |