JPH044354Y2 - - Google Patents
Info
- Publication number
- JPH044354Y2 JPH044354Y2 JP19934984U JP19934984U JPH044354Y2 JP H044354 Y2 JPH044354 Y2 JP H044354Y2 JP 19934984 U JP19934984 U JP 19934984U JP 19934984 U JP19934984 U JP 19934984U JP H044354 Y2 JPH044354 Y2 JP H044354Y2
- Authority
- JP
- Japan
- Prior art keywords
- orifice
- electrode
- needle
- tip
- mass spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 claims description 31
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 10
- 239000007789 gas Substances 0.000 description 7
- 229910052786 argon Inorganic materials 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 239000012159 carrier gas Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000009616 inductively coupled plasma Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19934984U JPH044354Y2 (de) | 1984-12-28 | 1984-12-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19934984U JPH044354Y2 (de) | 1984-12-28 | 1984-12-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61179652U JPS61179652U (de) | 1986-11-10 |
| JPH044354Y2 true JPH044354Y2 (de) | 1992-02-07 |
Family
ID=30759188
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19934984U Expired JPH044354Y2 (de) | 1984-12-28 | 1984-12-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH044354Y2 (de) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6358726B1 (ja) * | 2018-04-03 | 2018-07-18 | グローテクノロジー株式会社 | グロー放電システムとそのイオン引き出し構造、グロー放電質量分析装置 |
| JP6396618B1 (ja) | 2018-04-03 | 2018-09-26 | グローテクノロジー株式会社 | グロー放電システム及びこれを用いたグロー放電質量分析装置 |
-
1984
- 1984-12-28 JP JP19934984U patent/JPH044354Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61179652U (de) | 1986-11-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5935347A (ja) | イオン生成装置 | |
| JPWO2003041115A1 (ja) | 質量分析装置 | |
| JP4415490B2 (ja) | 液体クロマトグラフ質量分析装置 | |
| JPH08304342A (ja) | 液体クロマトグラフ質量分析装置 | |
| JPH044354Y2 (de) | ||
| JPH0218854A (ja) | 液体クロマトグラフ／質量分析装置 | |
| US4808819A (en) | Mass spectrometric apparatus | |
| JP2001093461A5 (ja) | イオン源及びこれを用いる質量分析計 | |
| JP3561422B2 (ja) | 大気圧イオン源 | |
| JP2603722B2 (ja) | 高周波誘導結合プラズマ質量分析装置 | |
| JPH02135655A (ja) | 大気圧イオン化質量分析計 | |
| US7701123B2 (en) | Electron source for ionization with leakage current suppression | |
| RU2801343C1 (ru) | Устройство ионизации, система для масс-спектрометрии и способ ионизации | |
| JP7453642B2 (ja) | イオン化装置、質量分析システム及びイオン化方法 | |
| JPS58135544A (ja) | 電界電離型イオン源 | |
| JPS60121252U (ja) | 質量分析装置用イオン源 | |
| JPS5832200Y2 (ja) | イオン源装置 | |
| JP3226584B2 (ja) | 質量分析計 | |
| JP2000106127A (ja) | 大気圧イオン源 | |
| JPH0432148A (ja) | 質量分析装置用イオン源 | |
| JP2000214135A (ja) | 液体クロマトグラフ質量分析装置 | |
| JP2535694Y2 (ja) | 電子線源装置 | |
| JPH077660B2 (ja) | 大気圧イオン化質量分析計 | |
| JPS559107A (en) | Ion generation method and device for ionization detection | |
| JPH04253150A (ja) | 電気泳動−質量分析装置 |