JPH0443467B2 - - Google Patents

Info

Publication number
JPH0443467B2
JPH0443467B2 JP59252412A JP25241284A JPH0443467B2 JP H0443467 B2 JPH0443467 B2 JP H0443467B2 JP 59252412 A JP59252412 A JP 59252412A JP 25241284 A JP25241284 A JP 25241284A JP H0443467 B2 JPH0443467 B2 JP H0443467B2
Authority
JP
Japan
Prior art keywords
test
new
line
old
subscriber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59252412A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61129953A (ja
Inventor
Fumio Onimaru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP25241284A priority Critical patent/JPS61129953A/ja
Publication of JPS61129953A publication Critical patent/JPS61129953A/ja
Publication of JPH0443467B2 publication Critical patent/JPH0443467B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M3/00Automatic or semi-automatic exchanges
    • H04M3/22Arrangements for supervision, monitoring or testing
    • H04M3/26Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/302Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs
    • H04M3/303Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs and using PCM multiplexers, e.g. pair gain systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
JP25241284A 1984-11-29 1984-11-29 加入者回線試験システム Granted JPS61129953A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25241284A JPS61129953A (ja) 1984-11-29 1984-11-29 加入者回線試験システム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25241284A JPS61129953A (ja) 1984-11-29 1984-11-29 加入者回線試験システム

Publications (2)

Publication Number Publication Date
JPS61129953A JPS61129953A (ja) 1986-06-17
JPH0443467B2 true JPH0443467B2 (es) 1992-07-16

Family

ID=17236982

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25241284A Granted JPS61129953A (ja) 1984-11-29 1984-11-29 加入者回線試験システム

Country Status (1)

Country Link
JP (1) JPS61129953A (es)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52140217A (en) * 1976-05-19 1977-11-22 Hitachi Ltd Test equipment
JPS575459A (en) * 1980-06-14 1982-01-12 Fujitsu Ltd Communication system for test device control information

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52140217A (en) * 1976-05-19 1977-11-22 Hitachi Ltd Test equipment
JPS575459A (en) * 1980-06-14 1982-01-12 Fujitsu Ltd Communication system for test device control information

Also Published As

Publication number Publication date
JPS61129953A (ja) 1986-06-17

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