JPH0443206B2 - - Google Patents

Info

Publication number
JPH0443206B2
JPH0443206B2 JP60053587A JP5358785A JPH0443206B2 JP H0443206 B2 JPH0443206 B2 JP H0443206B2 JP 60053587 A JP60053587 A JP 60053587A JP 5358785 A JP5358785 A JP 5358785A JP H0443206 B2 JPH0443206 B2 JP H0443206B2
Authority
JP
Japan
Prior art keywords
thickness
distance
measured
plate
predetermined distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60053587A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61212709A (ja
Inventor
Atsushi Koishikawa
Masakane Takahata
Shoji Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP5358785A priority Critical patent/JPS61212709A/ja
Publication of JPS61212709A publication Critical patent/JPS61212709A/ja
Publication of JPH0443206B2 publication Critical patent/JPH0443206B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP5358785A 1985-03-18 1985-03-18 板材の厚さ測定方法 Granted JPS61212709A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5358785A JPS61212709A (ja) 1985-03-18 1985-03-18 板材の厚さ測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5358785A JPS61212709A (ja) 1985-03-18 1985-03-18 板材の厚さ測定方法

Publications (2)

Publication Number Publication Date
JPS61212709A JPS61212709A (ja) 1986-09-20
JPH0443206B2 true JPH0443206B2 (enrdf_load_stackoverflow) 1992-07-15

Family

ID=12946988

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5358785A Granted JPS61212709A (ja) 1985-03-18 1985-03-18 板材の厚さ測定方法

Country Status (1)

Country Link
JP (1) JPS61212709A (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5844306A (ja) * 1981-09-10 1983-03-15 Sumitomo Metal Ind Ltd 鋼板の板厚測定装置
JPS59158016U (ja) * 1983-04-11 1984-10-23 川崎製鉄株式会社 エツジ追従式板厚測定装置

Also Published As

Publication number Publication date
JPS61212709A (ja) 1986-09-20

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term