JPH0436459Y2 - - Google Patents
Info
- Publication number
- JPH0436459Y2 JPH0436459Y2 JP19228885U JP19228885U JPH0436459Y2 JP H0436459 Y2 JPH0436459 Y2 JP H0436459Y2 JP 19228885 U JP19228885 U JP 19228885U JP 19228885 U JP19228885 U JP 19228885U JP H0436459 Y2 JPH0436459 Y2 JP H0436459Y2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- base plate
- measuring instrument
- pins
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 24
- 239000011810 insulating material Substances 0.000 claims description 3
- 239000000523 sample Substances 0.000 description 5
- 208000019914 Mental Fatigue Diseases 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19228885U JPH0436459Y2 (enrdf_load_html_response) | 1985-12-16 | 1985-12-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19228885U JPH0436459Y2 (enrdf_load_html_response) | 1985-12-16 | 1985-12-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6299872U JPS6299872U (enrdf_load_html_response) | 1987-06-25 |
JPH0436459Y2 true JPH0436459Y2 (enrdf_load_html_response) | 1992-08-27 |
Family
ID=31147225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19228885U Expired JPH0436459Y2 (enrdf_load_html_response) | 1985-12-16 | 1985-12-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0436459Y2 (enrdf_load_html_response) |
-
1985
- 1985-12-16 JP JP19228885U patent/JPH0436459Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6299872U (enrdf_load_html_response) | 1987-06-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH02224259A (ja) | 集積回路用プローブカードを検査する方法及び装置 | |
JP2519737B2 (ja) | プロ−ブカ−ド | |
US3962719A (en) | Mounting pad and semiconductor encapsulation device combination | |
US5247844A (en) | Semiconductor pick-and-place machine calibration apparatus | |
US6281695B1 (en) | Integrated circuit package pin indicator | |
JPH0436459Y2 (enrdf_load_html_response) | ||
CN212988199U (zh) | 一种芯片打标位置检测治具 | |
CN107238785B (zh) | 芯片测试基座 | |
JPH1152000A (ja) | プリント配線基板の検査装置及び検査方法 | |
CN214426570U (zh) | 一种扬声器检具 | |
JPH0562699B2 (enrdf_load_html_response) | ||
JPS6020938Y2 (ja) | 半導体集積回路用部品 | |
JP2606309Y2 (ja) | Icソケット | |
KR940002230Y1 (ko) | 핀(pin)번호 식별이 용이한 개량집적회로(ic)와 소켓(socket) | |
JPH0749361Y2 (ja) | Icピンスケール | |
JP2540157Y2 (ja) | 電子部品の測定装置 | |
JP2003294808A (ja) | Bgaタイプicの測定用位置決め機能付icソケット | |
JPH022901A (ja) | 配線基板端子ピンの長さ検査機構 | |
JPH034031Y2 (enrdf_load_html_response) | ||
JPH0442783Y2 (enrdf_load_html_response) | ||
KR100922589B1 (ko) | 스크라이브 라인 측정용 서포터 | |
JP3056033U (ja) | ボールグリッドアレイ集積回路チップに用いるソケットとコンタクト | |
JPH01213181A (ja) | 素子収納用トレイ | |
JPH04216642A (ja) | 半導体パッケージ用キャリア及び半導体パッケージの測定方法 | |
JPH08201466A (ja) | Icソケットの検査装置 |