JPH0435812Y2 - - Google Patents
Info
- Publication number
- JPH0435812Y2 JPH0435812Y2 JP1983049322U JP4932283U JPH0435812Y2 JP H0435812 Y2 JPH0435812 Y2 JP H0435812Y2 JP 1983049322 U JP1983049322 U JP 1983049322U JP 4932283 U JP4932283 U JP 4932283U JP H0435812 Y2 JPH0435812 Y2 JP H0435812Y2
- Authority
- JP
- Japan
- Prior art keywords
- measurement data
- measurement
- semiconductor device
- difference
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4932283U JPS59154678U (ja) | 1983-04-01 | 1983-04-01 | 半導体の測定器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4932283U JPS59154678U (ja) | 1983-04-01 | 1983-04-01 | 半導体の測定器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59154678U JPS59154678U (ja) | 1984-10-17 |
| JPH0435812Y2 true JPH0435812Y2 (OSRAM) | 1992-08-25 |
Family
ID=30179831
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4932283U Granted JPS59154678U (ja) | 1983-04-01 | 1983-04-01 | 半導体の測定器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59154678U (OSRAM) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2597580B2 (ja) * | 1987-05-19 | 1997-04-09 | 株式会社東芝 | 半導体測定装置 |
-
1983
- 1983-04-01 JP JP4932283U patent/JPS59154678U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59154678U (ja) | 1984-10-17 |
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