JPH0429213B2 - - Google Patents

Info

Publication number
JPH0429213B2
JPH0429213B2 JP1234596A JP23459689A JPH0429213B2 JP H0429213 B2 JPH0429213 B2 JP H0429213B2 JP 1234596 A JP1234596 A JP 1234596A JP 23459689 A JP23459689 A JP 23459689A JP H0429213 B2 JPH0429213 B2 JP H0429213B2
Authority
JP
Japan
Prior art keywords
light
optical system
laser beam
scanning
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1234596A
Other languages
English (en)
Japanese (ja)
Other versions
JPH02191314A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1234596A priority Critical patent/JPH02191314A/ja
Publication of JPH02191314A publication Critical patent/JPH02191314A/ja
Publication of JPH0429213B2 publication Critical patent/JPH0429213B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7003Alignment type or strategy, e.g. leveling, global alignment
    • G03F9/7023Aligning or positioning in direction perpendicular to substrate surface

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP1234596A 1989-09-12 1989-09-12 パターン検出装置 Granted JPH02191314A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1234596A JPH02191314A (ja) 1989-09-12 1989-09-12 パターン検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1234596A JPH02191314A (ja) 1989-09-12 1989-09-12 パターン検出装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP58005184A Division JPS59132126A (ja) 1983-01-14 1983-01-18 位置合わせ装置

Publications (2)

Publication Number Publication Date
JPH02191314A JPH02191314A (ja) 1990-07-27
JPH0429213B2 true JPH0429213B2 (en, 2012) 1992-05-18

Family

ID=16973512

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1234596A Granted JPH02191314A (ja) 1989-09-12 1989-09-12 パターン検出装置

Country Status (1)

Country Link
JP (1) JPH02191314A (en, 2012)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6826424B1 (en) * 2000-12-19 2004-11-30 Haishan Zeng Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices
JP5261665B2 (ja) * 2008-05-27 2013-08-14 株式会社ブイ・テクノロジー 近接露光装置
JP5637931B2 (ja) * 2011-05-17 2014-12-10 キヤノン株式会社 インプリント装置、インプリント方法およびデバイス製造方法
JP5800977B2 (ja) * 2014-10-23 2015-10-28 キヤノン株式会社 インプリント装置、インプリント方法およびデバイス製造方法
JP6039770B2 (ja) * 2015-08-27 2016-12-07 キヤノン株式会社 インプリント装置およびデバイス製造方法

Also Published As

Publication number Publication date
JPH02191314A (ja) 1990-07-27

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