JPH042908B2 - - Google Patents
Info
- Publication number
- JPH042908B2 JPH042908B2 JP61069522A JP6952286A JPH042908B2 JP H042908 B2 JPH042908 B2 JP H042908B2 JP 61069522 A JP61069522 A JP 61069522A JP 6952286 A JP6952286 A JP 6952286A JP H042908 B2 JPH042908 B2 JP H042908B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- hole
- contact probe
- contact
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 107
- 238000000034 method Methods 0.000 claims description 15
- 238000007689 inspection Methods 0.000 description 8
- 238000005259 measurement Methods 0.000 description 7
- 238000002513 implantation Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000006835 compression Effects 0.000 description 3
- 238000007906 compression Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Standing Axle, Rod, Or Tube Structures Coupled By Welding, Adhesion, Or Deposition (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61069522A JPS62225961A (ja) | 1986-03-26 | 1986-03-26 | コンタクトプロ−ブ植設方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61069522A JPS62225961A (ja) | 1986-03-26 | 1986-03-26 | コンタクトプロ−ブ植設方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62225961A JPS62225961A (ja) | 1987-10-03 |
| JPH042908B2 true JPH042908B2 (enrdf_load_stackoverflow) | 1992-01-21 |
Family
ID=13405137
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61069522A Granted JPS62225961A (ja) | 1986-03-26 | 1986-03-26 | コンタクトプロ−ブ植設方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62225961A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0233363U (enrdf_load_stackoverflow) * | 1988-06-10 | 1990-03-02 | ||
| WO2008084627A1 (ja) * | 2006-12-19 | 2008-07-17 | Nhk Spring Co., Ltd. | 導電性接触子ユニット |
| DE102009016181A1 (de) * | 2009-04-03 | 2010-10-14 | Atg Luther & Maelzer Gmbh | Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten |
-
1986
- 1986-03-26 JP JP61069522A patent/JPS62225961A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62225961A (ja) | 1987-10-03 |