JPH042908B2 - - Google Patents

Info

Publication number
JPH042908B2
JPH042908B2 JP61069522A JP6952286A JPH042908B2 JP H042908 B2 JPH042908 B2 JP H042908B2 JP 61069522 A JP61069522 A JP 61069522A JP 6952286 A JP6952286 A JP 6952286A JP H042908 B2 JPH042908 B2 JP H042908B2
Authority
JP
Japan
Prior art keywords
probe
hole
contact probe
contact
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61069522A
Other languages
Japanese (ja)
Other versions
JPS62225961A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP61069522A priority Critical patent/JPS62225961A/en
Publication of JPS62225961A publication Critical patent/JPS62225961A/en
Publication of JPH042908B2 publication Critical patent/JPH042908B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Standing Axle, Rod, Or Tube Structures Coupled By Welding, Adhesion, Or Deposition (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明はプリント配線基板の検査治具に使用さ
れるコンタクトプローブを植設する方法に関す
る。DETAILED DESCRIPTION OF THE INVENTION FIELD OF INDUSTRIAL APPLICATION The present invention relates to a method of implanting a contact probe used in a printed wiring board inspection jig.

従来の技術 第８図は上記検査治具の概略を示す。プローブ
プレート１には被検査プリント配線基板２の測定
位置に対応する位置にコンタクトプローブ３が植
設されており、各コンタクトプローブ３の検出信
号はそれぞれケーブル４を介して比較回路５に入
力される。比較回路５では、プリント配線基板２
を第８図仮想線位置に示すようにコンタクトプロ
ーブ３に押し当てた状態での検出信号と正常時の
各設定信号とを比較して、両者の一致検出によつ
て「良品」「不良品」の判定を行うよう構成され
ている。Prior Art FIG. 8 schematically shows the above-mentioned inspection jig. Contact probes 3 are installed on the probe plate 1 at positions corresponding to the measurement positions of the printed wiring board 2 to be inspected, and the detection signals of each contact probe 3 are inputted to a comparison circuit 5 via a cable 4, respectively. . In comparison circuit 5, printed wiring board 2
As shown in the imaginary line position in Figure 8, the detection signal when the probe is pressed against the contact probe 3 is compared with each normal setting signal, and if the two match, it is determined whether the product is "good" or "defective". The system is configured to make a determination.

第９図ａ，ｂはプローブプレート１へのコンタ
クトプローブ３の従来の植設過程を示す。 9a and 9b show the conventional process of implanting the contact probe 3 into the probe plate 1. FIG.

先ず、第９図ａのようにプローブプレート１の
上面Ｆ側から測定位置に対応する位置の孔６にコ
ンタクトプローブ３の基端部を差し込んで鍔部７
が上面Ｆに当接するまで圧入し、次いでプローブ
プレート１の下面Ｒ側に突出したコンタクトプロ
ーブ３の各基端部にケーブル４の接続作業が行わ
れる。 First, as shown in FIG. 9a, the base end of the contact probe 3 is inserted from the upper surface F side of the probe plate 1 into the hole 6 at the position corresponding to the measurement position, and the flange 7 is inserted.
The cables 4 are press-fitted until they come into contact with the upper surface F, and then the cables 4 are connected to the base ends of the contact probes 3 protruding toward the lower surface R of the probe plate 1.

なお、検査治具の筐体内部でのケーブル４の引
き回しを考慮して、最近ではケーブル４の中間部
の相互を平板状に接続したフラツトケーブルが使
用されるため、各コンタクトプローブ３とケーブ
ル４との接続はコンタクトプローブ３のプローブ
プレート１への植設完了後の工程で行われる。 In addition, in consideration of the routing of the cable 4 inside the housing of the inspection jig, recently a flat cable is used in which the middle parts of the cable 4 are connected to each other in a flat plate shape, so that each contact probe 3 and the cable The connection with the contact probe 4 is performed in a step after the contact probe 3 has been implanted into the probe plate 1.

発明が解決しようとする問題点 このような従来の植設方法では、コンタクトプ
ローブ(3)はプローブプレート１の上面Ｆ側からし
か植設できないため、上記のようにケーブル４と
してフラツトケーブルを使用した場合には各ケー
ブル４の比較回路５側の端部をプローブプレート
１のそれぞれの孔６に通して下面Ｒ側に引き出す
ようなことができず、コンタクトプローブ３とケ
ーブル４との接続はコンタクトプローブ３の圧入
の後工程で行うことが強いられているため、検査
治具の完成までには長時間を必要とする。Problems to be Solved by the Invention In such a conventional planting method, since the contact probe (3) can only be planted from the upper surface F side of the probe plate 1, a flat cable is used as the cable 4 as described above. In this case, it is not possible to pass the end of each cable 4 on the comparison circuit 5 side through each hole 6 of the probe plate 1 and pull it out to the lower surface R side, and the connection between the contact probe 3 and the cable 4 is made by contact. Since this has to be done in the process after press-fitting the probe 3, it takes a long time to complete the inspection jig.

更に、プローブプレート１の上面Ｆ側からコン
タクトプローブ３を圧入する作業は次の点からも
好ましくない。つまり、第１０図のように作業テ
ーブル１７上に被検査プリント配線基板２とプロ
ーブプレート１とを並べ、被検査プリント配線基
板２を見ながら測定個所S1，S2，S3に対応する位
置のプローブプレート１の孔６1，６2，６3に圧
入することになるが、測定個所S1〜S3の配列方向
が第１０図において一点鎖線Ａのように右上に配
列されているのに対して孔６1〜６3の配列方向は
一点鎖線Ｂのように右下りになるため、植設作業
に熟練するまでは測定個所S1，S3については誤つ
た位置の孔６1′，６3′にコンタクトプローブ３を
植設してしまうような事態が発生しやすい。 Furthermore, the operation of press-fitting the contact probe 3 from the upper surface F side of the probe plate 1 is not preferable from the following points. That is, as shown in FIG. 10, the printed wiring board 2 to be inspected and the probe plate 1 are arranged on the work table 17, and while looking at the printed wiring board 2 to be inspected, the positions corresponding to measurement points S 1 , S 2 , S 3 are measured. The probes will be press-fitted into the holes 6 1 , 6 2 , and 6 3 of the probe plate 1, but since the arrangement direction of the measurement points S 1 to S 3 is arranged at the upper right as shown by the dashed-dotted line A in FIG. On the other hand, the arrangement direction of the holes 6 1 to 6 3 is downward to the right as shown by the dashed-dotted line B, so until you become skilled in the planting work, you will have to worry about the holes 6 1 ′ in the wrong positions for the measurement points S 1 and S 3 . , 6 3 ', a situation where the contact probe 3 is implanted is likely to occur.

本発明はプローブプレートの下面側から圧入す
ることができ、植設に先立つて予めケーブルと接
続しておいても検査治具を組立てることのできる
コンタクトプローブ植設方法を提供することを目
的とする。 SUMMARY OF THE INVENTION An object of the present invention is to provide a contact probe implantation method that can press-fit a probe plate from the lower surface side and assemble an inspection jig even if it is connected to a cable in advance before implantation. .

問題点を解決するための手段 本発明のコンタクトプローブは、植設すべきコ
ンタクトプローブの大径部が通過可能な径の第１
の孔が穿設されたプローブプレートの一方の片面
に、第１の孔に対応してこの第１の孔よりも小径
の第２の孔が穿設された弾性シートを敷設し、コ
ンタクトプローブ先端をプローブプレートの他方
の片面側から前記大径部が第１の孔を貫通して第
２の孔を通過する位置にまで押し込み、次いでコ
ンタクトプローブを前記大径部が前記弾性シート
の表面に係合する位置まで戻して植設することを
特徴とする。Means for Solving the Problems The contact probe of the present invention has a first diameter that allows the large diameter portion of the contact probe to be implanted to pass through.
An elastic sheet is laid on one side of the probe plate in which a second hole corresponding to the first hole is formed, the diameter of which is smaller than that of the first hole. from the other side of the probe plate to a position where the large diameter portion passes through the first hole and the second hole, and then the contact probe is pushed into the probe plate so that the large diameter portion is engaged with the surface of the elastic sheet. It is characterized by being planted back to the position where it fits.

作 用 この構成よると、プローブプレートに弾性シー
トが敷かれているため、被検査プリント配線基板
をコンタクトプローブに押し付けても、前記弾性
シートがコンタクトプローブの大径部とプローブ
プレートの孔との間に介在して、コンタクトプロ
ーブが抜け落ちない。Effect According to this configuration, since the probe plate is covered with an elastic sheet, even if the printed wiring board to be inspected is pressed against the contact probe, the elastic sheet is between the large diameter part of the contact probe and the hole in the probe plate. This prevents the contact probe from falling out.

実施例 以下、本発明の具体的な実施例を第１図〜第７
図に基づいて説明する。Embodiments Hereinafter, specific embodiments of the present invention are shown in FIGS.
This will be explained based on the diagram.

第１図は本発明の植設方法によつて第９図と同
じプローブピン３をプローブプレート１に植設す
る過程を示す。 FIG. 1 shows the process of implanting the same probe pin 3 as shown in FIG. 9 on a probe plate 1 by the implantation method of the present invention.

プローブプレート１の上面Ｆには第１の孔とし
ての孔６の位置に対応して第２の孔としての穴８
が穿けられたゴムシート９が貼付けられており、
先ず、第１図ａのようにコンタクトプローブ３を
プローブプレート１の下面Ｒ側から押し込んで行
く。ここでプローブプレート１の孔６の内径P2
はコンタクトプローブ３の大径部である鍔部７の
直径P1と比べるとP2≧P1に形成されており、コ
ンタクトプローブ３を押し込んで行くと鍔部７は
孔６を通過する。 The top surface F of the probe plate 1 has a hole 8 as a second hole corresponding to the position of the hole 6 as the first hole.
A rubber sheet 9 with holes pierced thereon is attached.
First, as shown in FIG. 1a, the contact probe 3 is pushed into the probe plate 1 from the lower surface R side. Here, the inner diameter of the hole 6 of the probe plate 1 is P 2
is formed such that P 2 ≧P 1 when compared with the diameter P 1 of the flange 7, which is the large diameter portion of the contact probe 3, and when the contact probe 3 is pushed in, the flange 7 passes through the hole 6.

鍔部７が孔６を通過して更に押し込んで行く
と、ゴムシート９の穴８が第１図ｂのように鍔部
７で広げられる。コンタクトプローブ３の押し込
みが進むと、鍔部７は第１図ｃのようにゴムシー
ト９を通過する。そして最後に第１図ｃの状態あ
るコンタクトプローブ３を鍔部７がゴムシート９
の上面に当接するまで下側Ｒ側にコンタクトプロ
ーブ３を引き戻して植設が完了する。 When the flange 7 passes through the hole 6 and is further pushed in, the hole 8 in the rubber sheet 9 is widened by the flange 7 as shown in FIG. 1b. As the contact probe 3 is pushed in further, the flange 7 passes through the rubber sheet 9 as shown in FIG. 1c. Finally, the contact probe 3 in the state shown in FIG.
The contact probe 3 is pulled back to the lower R side until it comes into contact with the upper surface of the contact probe 3, and the implantation is completed.

このようにして植設しているため、コンタクト
プローブ３の先端に被検査プリント配線基板２が
押し付けられてコンタクトプローブ３に下面Ｒに
向かう力が作用しても、ゴムシート９がコンタク
トプローブ３の鍔部７とプローブプレート１の孔
６との間に介在するため、P2≦P1であつてもコ
ンタクトプローブ３はプローブプレート１の孔６
から抜け落ちない。 Because it is implanted in this way, even if the printed wiring board 2 to be inspected is pressed against the tip of the contact probe 3 and a force is applied to the contact probe 3 toward the lower surface R, the rubber sheet 9 is attached to the contact probe 3. Since the contact probe 3 is interposed between the flange 7 and the hole 6 of the probe plate 1, even if P 2 ≦P 1 , the contact probe 3 is connected to the hole 6 of the probe plate 1.
I can't get away from it.

更に、このようにプローブプレート１の下面Ｒ
側からコンタクトプローブ３を植設できるため、
従来では得られない次のような効果を奏する。 Furthermore, in this way, the lower surface R of the probe plate 1
Since the contact probe 3 can be implanted from the side,
It has the following effects that cannot be obtained conventionally.

第１に、ケーブル４としてフラツトケーブルを
使用する場合であつても、予めコンタクトプロー
ブ３の基端部にケーブルを接続しておいても検査
治具を組み立てられるため、従来のようなコンタ
クトプローブ植設後の後工程を簡略化できる。 First, even if a flat cable is used as the cable 4, the inspection jig can be assembled even if the cable is connected to the base end of the contact probe 3 in advance. Post-processing after planting can be simplified.

第２に、コンタクトプローブ３の植設作業を第
２図のように作業テーブル１７上に被検査プリン
ト配線基板２とプローブプレート１とを並べて被
検査プリント配線基板２の測定個所S1〜S3を見な
がら行う場合、プローブプレート１における測定
個所S1〜S3に対応する孔６1〜６3の配列方向は一
点鎖線Ｃのように一点鎖線Ａと同じ右上りである
ため、第１０図の場合と比べると作業に熟練が要
求されない。 Second, the contact probe 3 is installed by arranging the printed wiring board 2 to be inspected and the probe plate 1 on the work table 17 as shown in FIG . When performing this while looking at the measurement points S 1 to S 3 on the probe plate 1, the arrangement direction of the holes 6 1 to 6 3 corresponding to the measurement points S 1 to S 3 is upward to the right as shown by the dashed dotted line C, which is the same as the dashed dotted line A. Compared to the case of , the work does not require much skill.

第３図〜第６図は第１図とは異なる新規な形式
のコンタクトプローブを植設する場合の様子を示
す。 3 to 6 show how a new type of contact probe different from that shown in FIG. 1 is implanted.

この新規な形状のコンタクトプローブは、第３
図〜第５図に詳細を示すように、プローブピン１
０の中間部に外筒１１が装着されており、中間突
起１２と外筒１１の基端側の絞り部１３との間に
は圧縮ばね１４が介装されており、プローブピン
１０の前記中間突起１２が外筒１１の先端側の絞
り部１５に当接して停止するよう付勢されてい
る。前記外筒１１のプローブピン１０の先端側は
基端部側の径よりも大きな大径部１６が形成され
ており、大径部１６には第４図のように２ケ所の
割り溝１８が形成されている。 This novel shaped contact probe has a third
As shown in detail in Figures 5 to 5, the probe pin 1
An outer cylinder 11 is attached to the intermediate portion of the probe pin 10, and a compression spring 14 is interposed between the intermediate protrusion 12 and the constricted portion 13 on the base end side of the outer cylinder 11. The protrusion 12 is biased so as to come into contact with the constricted portion 15 on the distal end side of the outer cylinder 11 and stop. A large diameter portion 16 is formed on the distal end side of the probe pin 10 of the outer cylinder 11, which is larger than the diameter on the proximal end side, and the large diameter portion 16 has two slots 18 as shown in FIG. It is formed.

このように構成された新規な形式のコンタクト
プローブ３′も、第６図ａ〜ｄに示すように第１
図ａ〜ｄと同様の過程でプローブプレート１の下
面Ｒ側から植設できる。 The novel type of contact probe 3' constructed in this manner also has a first contact probe 3' as shown in FIGS.
The probe plate 1 can be implanted from the lower surface R side in the same process as shown in Figures a to d.

なお、第６の過程ではプローブピン１０の先端
は外筒１１から突出したままの状態でプローブプ
レート１の孔６への押し込みが行われているが、
これは第７図のようにすることによつて、より小
さな押し込み力だけで植設できる。 Note that in the sixth step, the tip of the probe pin 10 is pushed into the hole 6 of the probe plate 1 while remaining protruding from the outer cylinder 11;
This can be implanted with a smaller pushing force by doing as shown in Figure 7.

つまり、第７図では先ずａのようにプローブピ
ン１０の基端部を外筒１１に対して圧縮ばね１４
の付勢に抗して下方に引いた状態にして、プロー
ブピン１０の先端を大径部１６よりも後退させた
状態でプローブプレート１の下面Ｒ側から孔６に
押し込むと、大径部１６には割り溝１８が形成さ
れているため、大径部１６がゴムシート９の穴８
を通過する際に大径部１６は第７図ｂのように縮
径方向に押さえ付けられて弾性変形して縮径した
状態で通過し、大径部１６がゴムシート９を通過
すると、第７図ｃのように縮径していた前記大径
部１６は自己の弾性力で復帰する。この状態でプ
ローブピン１０の下方への前記引つぱり力を解除
すると、プローブピン１０の先端部は圧縮ばね１
４の付勢力で外筒１１の大径部１６を通過した位
置に復帰する。第７図ｄは第６図ｄと同様であ
る。 That is, in FIG. 7, first, as shown in a, the base end of the probe pin 10 is held against the outer cylinder 11 by the compression spring 14.
When the tip of the probe pin 10 is pushed back from the large diameter portion 16 into the hole 6 from the lower surface R side of the probe plate 1, the large diameter portion 16 Since the groove 18 is formed in the hole 8 of the rubber sheet 9, the large diameter portion 16 is formed in the hole 8 of the rubber sheet 9.
When passing through the rubber sheet 9, the large diameter portion 16 is pressed in the diameter reduction direction as shown in FIG. The large diameter portion 16, which has been reduced in diameter as shown in FIG. 7c, returns to its original state by its own elastic force. In this state, when the downward pulling force of the probe pin 10 is released, the tip of the probe pin 10 is compressed by the compression spring 1.
It returns to the position where it passed through the large diameter part 16 of the outer cylinder 11 with the urging force of 4. FIG. 7d is similar to FIG. 6d.

このようにして植設すれば、第７図ｂで大径部
１６が縮径する分だけ第６図の場合に比べて押し
込み力が小さくても植設することができる。ま
た、第７図ａ，ｂのようにプローブピン１０に引
つぱり力を作用させた状態では、大径部１６が縮
径できるため、大径部１６の直径をP3とすると、
プローブプレート１の孔の内径P2はP3＜P2であ
つても大径部１６は通過可能である。 If it is implanted in this manner, it can be implanted even if the pushing force is smaller than in the case of FIG. 6 due to the diameter reduction of the large diameter portion 16 in FIG. 7b. Furthermore, when a pulling force is applied to the probe pin 10 as shown in FIGS. 7a and 7b, the large diameter portion 16 can be reduced in diameter, so if the diameter of the large diameter portion 16 is P3 , then
Even if the inner diameter P 2 of the hole in the probe plate 1 satisfies P 3 <P 2 , the large diameter portion 16 can pass through.

上記各実施例においては、弾性シートとしてゴ
ムシート９を使用したが、これは弾性変形する合
成樹脂シートとしても同様である。 In each of the above embodiments, the rubber sheet 9 was used as the elastic sheet, but the same applies to a synthetic resin sheet that is elastically deformable.

発明の効果 以上説明のように本発明のコンタクトプローブ
植設方法は、弾性シートをプローブプレート上に
敷設してプローブプレートの前記弾性シートが敷
設されていない側から孔にコンタクトプローブを
押し込むため、植設終了状態ではコンタクトプロ
ーブの大径部とプローブプレートの孔の間に前記
弾性シートが介在するため、コンタクトプローブ
が抜け落ちることがない。Effects of the Invention As explained above, in the contact probe planting method of the present invention, an elastic sheet is laid on the probe plate and the contact probe is pushed into the hole from the side of the probe plate where the elastic sheet is not laid. In the completed installation state, the elastic sheet is interposed between the large diameter portion of the contact probe and the hole in the probe plate, so that the contact probe does not fall out.

更に、被検査プリント配線基板の配設側とは反
対側の面からプローブプレートに植設できるた
め、比較回路との接続用ケーブルにフラツトケー
ブルが使用される場合においても植設よりも前に
コンタクトプローブの基端部にケーブルを接続す
ることができ、検査治具組み立てにおいて植設後
の配線工程を省くとができ、予じめケーブルの接
続作業を実施しておくことによつて、加工スピー
ドを大幅に向上させることができるものである。 Furthermore, since the probe plate can be planted from the side opposite to the installation side of the printed wiring board to be tested, even if a flat cable is used for the connection cable with the comparison circuit, it can be installed before planting. A cable can be connected to the base end of the contact probe, and the wiring process after planting can be omitted when assembling the inspection jig. This can significantly improve speed.

【図面の簡単な説明】[Brief explanation of drawings]

第１図〜第７図は本発明の具体的な実施例を示
し、第１図は本発明の植設過程の説明図、第２図
は第１図の植設時の作業テーブル上の平面図、第
３図〜第５図は新規なコンタクトプローブの正面
図とＸ−X′矢視図および縦断面図、第６図と第
７図はそれぞれ第３図のコンタクトプローブの植
設過程の説明図、第８図は検査治具の構成図、第
９図は従来のコンタクトプローブの植設過程の説
明図、第１０図は第９図の植設作業時の作業テー
ブル上の平面図である。 １……プローブプレート、２……被検査プリン
ト配線基板、３，３′……コンタクトプローブ、
６……プローブプレートの孔、７……鍔部（大径
部）、９……ゴムシート（弾性シート）、１０……
プローブピン、１６……大径部、１８……割り
溝、Ｆ……プローブプレートの上面、Ｒ……プロ
ーブプレートの下面。 Figures 1 to 7 show specific embodiments of the present invention, Figure 1 is an explanatory diagram of the planting process of the present invention, and Figure 2 is a plane on the work table during the planting of Figure 1. Figures 3 to 5 are a front view, an X-X' arrow view, and a longitudinal sectional view of the new contact probe, and Figures 6 and 7 are respectively showing the process of implanting the contact probe in Figure 3. An explanatory diagram, Fig. 8 is a configuration diagram of the inspection jig, Fig. 9 is an explanatory diagram of the conventional contact probe implantation process, and Fig. 10 is a plan view of the work table during the implantation work in Fig. 9. be. 1... Probe plate, 2... Printed wiring board to be inspected, 3, 3'... Contact probe,
6... Hole of probe plate, 7... Flange part (large diameter part), 9... Rubber sheet (elastic sheet), 10...
Probe pin, 16... Large diameter portion, 18... Division groove, F... Top surface of probe plate, R... Bottom surface of probe plate.

Claims (1)

【特許請求の範囲】[Claims] １ 植設すべきコンタクトプローブの大径部が通
過可能な径の第１の孔が穿設されたプローブプレ
ートの一方の片面に、第１の孔に対応してこの第
１の孔よりも小径の第２の孔が穿設された弾性シ
ートを敷設し、コンタクトプローブ先端をプロー
ブプレートの他方の片面側から前記大径部が第１
の孔を貫通して第２の孔を通過する位置にまで押
し込み、次いでコンタクトプローブを前記大径部
が前記弾性シートの表面に係合する位置まで戻し
て植設するコンタクトプローブ植設方法。1. On one side of the probe plate, which has a first hole with a diameter through which the large diameter part of the contact probe to be implanted can pass, a hole with a smaller diameter than the first hole corresponding to the first hole is bored. An elastic sheet with a second hole is laid down, and the contact probe tip is inserted from the other side of the probe plate so that the large diameter part is the first hole.
A method for implanting a contact probe, the method comprising: pushing the contact probe through the hole to a position where it passes through the second hole, and then returning the contact probe to a position where the large diameter portion engages with the surface of the elastic sheet.
JP61069522A 1986-03-26 1986-03-26 Method of erecting contact probe Granted JPS62225961A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61069522A JPS62225961A (en) 1986-03-26 1986-03-26 Method of erecting contact probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61069522A JPS62225961A (en) 1986-03-26 1986-03-26 Method of erecting contact probe

Publications (2)

Publication Number Publication Date
JPS62225961A JPS62225961A (en) 1987-10-03
JPH042908B2 true JPH042908B2 (en) 1992-01-21

Family

ID=13405137

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61069522A Granted JPS62225961A (en) 1986-03-26 1986-03-26 Method of erecting contact probe

Country Status (1)

Country Link
JP (1) JPS62225961A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0233363U (en) * 1988-06-10 1990-03-02
CN101563617A (en) * 2006-12-19 2009-10-21 日本发条株式会社 Conductive contact unit
DE102009016181A1 (en) * 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Contacting unit for a test device for testing printed circuit boards

Also Published As

Publication number Publication date
JPS62225961A (en) 1987-10-03

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