JPH0430547Y2 - - Google Patents

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Publication number
JPH0430547Y2
JPH0430547Y2 JP9594385U JP9594385U JPH0430547Y2 JP H0430547 Y2 JPH0430547 Y2 JP H0430547Y2 JP 9594385 U JP9594385 U JP 9594385U JP 9594385 U JP9594385 U JP 9594385U JP H0430547 Y2 JPH0430547 Y2 JP H0430547Y2
Authority
JP
Japan
Prior art keywords
hole
terminal
probe array
probe
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9594385U
Other languages
Japanese (ja)
Other versions
JPS625280U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9594385U priority Critical patent/JPH0430547Y2/ja
Publication of JPS625280U publication Critical patent/JPS625280U/ja
Application granted granted Critical
Publication of JPH0430547Y2 publication Critical patent/JPH0430547Y2/ja
Expired legal-status Critical Current

Links

Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は印刷配線板の端子検査装置に関し、と
くに直接型外部端子(以後端子と称す)の布線試
験を行う端子検査装置の改良に関する。
[Detailed Description of the Invention] [Industrial Field of Application] The present invention relates to a terminal inspection device for printed wiring boards, and more particularly to an improvement of a terminal inspection device that conducts wiring tests for direct type external terminals (hereinafter referred to as terminals).

〔従来の技術〕[Conventional technology]

従来、第2図に示すような印刷配線板(以後配
線板と略称)1の端子4に電気的な接触を行い、
端子4と配線板1内のスルホールランド2間の布
線試験を実施するに第3図a,bの例に示す装置
が実用化されており、プローブ配列板5上にプロ
ーブ6が一定ピツチで格子交点上に突出して配置
され、プローブ配列板5の下面側に突出したプロ
ーブ6の下端が接続配線9aおよびコネクタ(図
示省略)を介し、布線試験機(図示省略)に接続
されている。一方、端子用プローブ配列板7上の
端子用プローブ8のピツチは、配線板1の端子4
のピツチに合せ、かつ端子用プローブ8は配線板
1をプローブ6上に位置決め治具(図示省略)を
用いて位置決めした時の端子4の位置に合せ配置
固定される。
Conventionally, electrical contact is made to terminals 4 of a printed wiring board (hereinafter referred to as wiring board) 1 as shown in FIG.
The device shown in the example of FIG. The lower ends of the probes 6, which are arranged to protrude on the grid intersections and protrude from the lower surface side of the probe array plate 5, are connected to a wiring tester (not shown) via connection wiring 9a and a connector (not shown). On the other hand, the pitch of the terminal probes 8 on the terminal probe array board 7 is
The terminal probes 8 are arranged and fixed in alignment with the positions of the terminals 4 when the wiring board 1 is positioned on the probes 6 using a positioning jig (not shown).

プローブ配列板5と端子用プローブ配列板7は
互いに一定の位置関係を保持して布線試験機(図
示省略)に固定され、端子用プローブ配列板7は
交換可能である。また、端子用プローブ8は端子
用の接続配線9bおよび中継コネクタ(図示省
略)を介して布線試験機(図示省略)に接続され
る。この状態で、配線板1の布線試験を行うに
は、配線板位置決め治具(図示省略)を用いて、
配線板1を端子4のある側(第2図では上面)を
下にしてプローブ配列板5および端子用プローブ
配列板7上に位置決めし、加圧機構(図示省略)
により配線板1の端子4と端子用プローブ8、ラ
ンド2とプローブ6とをそれぞれ接触させて用い
ている。
The probe array plate 5 and the terminal probe array plate 7 are fixed to a wiring tester (not shown) while maintaining a fixed positional relationship with each other, and the terminal probe array plate 7 is replaceable. Further, the terminal probe 8 is connected to a wiring tester (not shown) via a terminal connection wiring 9b and a relay connector (not shown). In this state, to perform a wiring test on the wiring board 1, use a wiring board positioning jig (not shown).
Position the wiring board 1 on the probe array plate 5 and the terminal probe array plate 7 with the side with the terminals 4 (the top surface in FIG. 2) facing down, and apply pressure using a pressurizing mechanism (not shown).
Accordingly, the terminal 4 of the wiring board 1 and the terminal probe 8 are brought into contact with each other, and the land 2 and the probe 6 are brought into contact with each other.

〔考案が解決しようとする問題点〕[Problem that the invention attempts to solve]

上述した従来の配線板の端子検査装置には、次
のような欠点があつた。
The conventional wiring board terminal inspection apparatus described above has the following drawbacks.

(イ) 端子用プローブ8は全てラツピングにて接続
配線と接続されており、製作に手間がかかる。
(a) The terminal probes 8 are all connected to the connection wiring by wrapping, which takes time and effort to manufacture.

(ロ) 端子用プローブ配列板7には常に接続配線お
よびコネクタが付属しており、運搬および保管
が困難である。
(b) Connection wiring and connectors are always attached to the terminal probe array plate 7, making transportation and storage difficult.

(ハ) 端子用プローブ8から出ている接続配線はコ
ネクタを介して布線試験機に接続されているた
め、端子用プローブ配列板7を交換するごとに
コネクタを着脱する必要があり、手間がかかる
だけでなくコネクタの着脱摩耗劣化による接続
信頼性の低下等の問題があつた。
(c) Since the connection wiring coming out from the terminal probe 8 is connected to the wiring tester via a connector, it is necessary to attach and detach the connector every time the terminal probe array plate 7 is replaced, which is time-consuming. In addition to this, there were other problems such as a decrease in connection reliability due to wear and tear of the connector.

〔問題点を解決するための手段〕[Means for solving problems]

本考案によれば、一定間隔で直線状に配列させ
た第一のスルホール導通孔と前記導通孔と回路パ
ターンを介して接続されかつ、被検査配線板の端
子ピツチと一致させて配列させた第二のスルホー
ル導通孔とを有する回路基板および、前記回路基
板の第2のスルホール導通孔と同一ピツチでプロ
ーブを貫通植立させたプローブ配列板を上下に接
合させた積層体と、絶縁板にプローブを貫通植立
したプローブ配列状の余白縁部の上面に設けた凹
状の穴部内に厚板状の弾性体を突設させ、前記回
路基板の第一のスルホール導通孔下面と接触する
プローブを貫通植立させ、かつ穴部に前記積層体
を嵌合設置させたことを特徴とする配線板の端子
検査装置が得られる。
According to the present invention, the first through-hole conductive holes are arranged in a straight line at regular intervals, and the first through-holes are connected to the conductive holes through the circuit pattern and are arranged in line with the terminal pitch of the wiring board to be inspected. A laminated body in which a circuit board having two through-hole conductive holes, a probe array plate having probes penetrated and planted at the same pitch as the second through-hole conductive holes of the circuit board are joined vertically, and an insulating plate and a probe array plate. A thick plate-like elastic body is provided to protrude into a concave hole provided on the upper surface of the blank edge of the probe array formed by penetrating the probes, and penetrates the probes that are in contact with the lower surface of the first through-hole conductive hole of the circuit board. There is obtained a terminal inspection device for a wiring board, characterized in that the laminated body is placed upright and fitted into the hole.

〔実施例〕〔Example〕

次に、本考案の実施例を第1図a〜cにより説
明する。
Next, an embodiment of the present invention will be described with reference to FIGS. 1a to 1c.

プローブ11は従来例の第3図aのプローブ配
列と同様に、プローブ配列板10上に一定ピツチ
で格子交点上に植立配置され、配列板10の下面
から突出したプローブ11の下端から接続配線
(図示省略)を介して布線試験機(図示省略)に
接続される。接続プローブ12は、プローブ配列
板10の一辺に設けた余白部の上面を段差状に中
抜きした穴部の底面に一定ピツチで直線上に貫通
して植立し、プローブ11と同様にプローブ12
の下端から接続配線(図示省略)を介して布線試
験機(図示省略)に接続される。さらに、この穴
部の底面には、端子用プローブ配列板20と回路
基板30の積層体を固定するネジ孔13および前
記積層体の穴部への嵌合を一定位置で停止させる
ストツパ14を有する。
Similar to the conventional probe array shown in FIG. 3a, the probes 11 are arranged on the probe array plate 10 at a constant pitch on grid intersection points, and connection wiring is connected from the lower end of the probes 11 protruding from the lower surface of the array plate 10. (not shown) is connected to a wiring tester (not shown). The connection probes 12 are installed by penetrating the bottom of a hole formed in a step shape in the upper surface of a margin provided on one side of the probe array plate 10 in a straight line at a constant pitch.
It is connected to a wiring tester (not shown) from the lower end of the unit via connection wiring (not shown). Furthermore, the bottom of this hole has a screw hole 13 for fixing the stacked body of the terminal probe array plate 20 and the circuit board 30, and a stopper 14 for stopping the fitting of the stacked body into the hole at a certain position. .

第1図bは前述の第1図aの穴部に嵌合する端
子用プローブ配列板20および回路基板30を説
明する分解斜視図である。端子用プローブ配列板
20は、プローブ配列板10の穴部に嵌合される
形状の絶縁体に端子用プローブ21を貫通植立し
て構成されており、その上面からの投影形状は回
路基板30と同一である。この端子用プローブ2
1の植立位置は、検査対象の配線板1の端子4の
配列ピツチ(第2図参照)と同一ピツチでかつ、
配線板1をプローブ11上に位置決め治具(図示
省略)にて位置決めした時の配線板1の端子4の
位置に一致させる。
FIG. 1b is an exploded perspective view illustrating the terminal probe array plate 20 and circuit board 30 that fit into the holes shown in FIG. 1a. The terminal probe array plate 20 is constructed by planting the terminal probes 21 through an insulator shaped to fit into the holes of the probe array plate 10, and its projected shape from the top surface is similar to that of the circuit board 30. is the same as Probe 2 for this terminal
The planting position of 1 is the same pitch as the arrangement pitch of the terminals 4 of the wiring board 1 to be inspected (see Fig. 2), and
The positions of the terminals 4 of the wiring board 1 are made to coincide with the positions of the terminals 4 of the wiring board 1 when the wiring board 1 is positioned on the probe 11 using a positioning jig (not shown).

プローブ配列板20の下に配設する回路基板3
0上にはスルホールランドA33、接続パターン
34、およびスルホールランドB35が形成され
ており、スルホールランドA33はプローブ配列
板10に植立された接続プローブ12の配列ピツ
チと同一のピツチでかつ、接続プローブ12と同
一位置になるよう配置される。スルホールランド
B35は、端子用プローブ21の配列ピツチと同
一のピツチでかつ、端子用プローブ配列板20と
回路基板30を接合した場合、端子用プローブ2
1と同一位置になるよう配置される。なお、この
場合、貫通孔31も固定孔22と同一位置になる
よう配置される。
A circuit board 3 disposed under the probe array board 20
0, a through hole land A33, a connection pattern 34, and a through hole land B35 are formed, and the through hole land A33 has the same pitch as the arrangement pitch of the connection probes 12 planted on the probe array plate 10, and has the same pitch as the connection probe 12 installed on the probe array plate 10. It is placed at the same position as 12. The through hole land B35 has the same pitch as the arrangement pitch of the terminal probes 21, and when the terminal probe arrangement board 20 and the circuit board 30 are joined, the terminal probes 2
It is placed in the same position as 1. In this case, the through hole 31 is also arranged at the same position as the fixing hole 22.

第1図cは端子用プローブ配列板20と回路基
板30の接合状態を説明する断面図であり、回路
基板30は端子用プローブ配列板20の下面から
突設するパイロツトピン24をパイロツト孔32
に嵌合することにより端子用プローブ配列板20
の下面の一定位置に接合させることができ、同時
に端子用プローブ21下端の突出部21aはスル
ホールランドB35に嵌合される。なお、通常こ
の突出部21aとスルホールランドB35は、半
田等により電気的接続が可能に設けている。
FIG. 1c is a cross-sectional view illustrating the bonding state of the terminal probe array plate 20 and the circuit board 30.
By fitting the terminal probe array plate 20
At the same time, the protrusion 21a at the lower end of the terminal probe 21 is fitted into the through-hole land B35. Note that the protrusion 21a and the through-hole land B35 are normally provided so that they can be electrically connected by soldering or the like.

次に実際の布線検査を行う場合について説明す
る。
Next, the case where actual wiring inspection is performed will be explained.

端子用プローブ配列板20と回路基板30を互
いに接合したままプローブ配列板10上の穴部に
嵌合し、固定ネジ23を固定孔22を介して固定
ネジ孔13に螺合させて固定する。このとき、端
子用プローブ配列板20と回路基板30は穴部の
略中央に突設する厚板状の弾性ストツパ14によ
り接続プローブ12と回路基板30上のスルホー
ルランドA33が適切な力で接触する位置で停止
する。この状態で端子用プローブ21は、スルホ
ールランドB35、接続パターン34、スルホー
ルランドA33、接続プローブ12を介した導電
経路により布線試験機(図示省略)と電気的に接
続される。なお、以後の布線検査実施手順は従来
例と同様である。
The terminal probe array plate 20 and the circuit board 30 are fitted into the holes on the probe array plate 10 while being joined to each other, and the fixing screws 23 are screwed into the fixing screw holes 13 through the fixing holes 22 to fix them. At this time, the connection probe 12 and the through-hole land A33 on the circuit board 30 are brought into contact with an appropriate force by the thick elastic stopper 14 protruding from the approximate center of the hole in the terminal probe array plate 20 and the circuit board 30. Stop at a position. In this state, the terminal probe 21 is electrically connected to a wiring tester (not shown) through a conductive path via the through-hole land B35, the connection pattern 34, the through-hole land A33, and the connection probe 12. Note that the subsequent wiring inspection implementation procedure is the same as in the conventional example.

〔考案の効果〕[Effect of idea]

以上、本考案の端子検査装置を使用すれば、次
の効果がある。
As described above, if the terminal inspection device of the present invention is used, the following effects can be obtained.

(イ) プローブ配列板の構造が簡単になり、ラツピ
ング配線が不要となるのでプローブ配列板の製
作時間が短縮される。
(a) The structure of the probe array board is simplified and wrapping wiring is not required, so the manufacturing time of the probe array board is shortened.

(ロ) プローブ配列板に対する接続配線およびコネ
クタが不要となるので、運搬、保管が容易とな
る。
(b) Since connection wiring and connectors to the probe array board are not required, transportation and storage become easier.

(ハ) 端子用プローブと布線試験機を、コネクタを
介さずに簡単な操作で接続できるので、前準備
時間が少なく、高信頼性の布線試験を実施する
ことができる。
(c) Since the terminal probe and the wiring tester can be connected with a simple operation without using a connector, preparation time is short and highly reliable wiring tests can be performed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図aは本考案の印刷配線板の端子検査装置
の一部分解斜視図、第1図b,cは第1図aの主
要部を示す分解斜視図およびその側断面図。第2
図は被検査印刷配線板の斜視図、第3図a,bは
従来の印刷配線板の端子検査装置主要部の斜視図
およびその側断面図である。 図中の記号、1……印刷配線板、2……スルホ
ールランド、3……回路パターン、4……端子、
5,10……プローブ配列板、6,11……プロ
ーブ、7,20……端子用プローブ配列板、8,
21……端子用プローブ、9a,9b……接続配
線、12……接続プローブ、13……固定ネジ
孔、14……ストツパ、22……固定孔、23…
…固定ネジ、24……パイロツトピン、30……
回路基板、31……貫通孔、32……パイロツト
孔、33……スルホールランドA、34……接続
パターン、35……スルホールランドB。
FIG. 1a is a partially exploded perspective view of a terminal inspection device for a printed wiring board according to the present invention, and FIGS. 1b and 1c are an exploded perspective view and a side sectional view showing the main parts of FIG. 1a. Second
The figure is a perspective view of a printed wiring board to be inspected, and FIGS. 3a and 3b are a perspective view and a side sectional view of the main part of a conventional terminal inspection apparatus for a printed wiring board. Symbols in the diagram: 1...Printed wiring board, 2...Through hole land, 3...Circuit pattern, 4...Terminal,
5, 10... Probe array plate, 6, 11... Probe, 7, 20... Terminal probe array plate, 8,
21...Terminal probe, 9a, 9b...Connection wiring, 12...Connection probe, 13...Fixing screw hole, 14...Stopper, 22...Fixing hole, 23...
...Fixing screw, 24...Pilot pin, 30...
Circuit board, 31...Through hole, 32...Pilot hole, 33...Through hole land A, 34...Connection pattern, 35...Through hole land B.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 一定の間隔で直線状に配列させた第1のスルホ
ール導通孔と、前記導通孔と回路パターンを介し
て接続し、かつ被検査印刷配線板の端子部のピツ
チ間隔と一致させて配列させた第2のスルホール
導通孔とを有する回路基板と、前記回路基板の第
2のスルホール導通孔と同一配列ピツチ間隔でプ
ローブを貫通植立させたプローブ配列板とを上下
に接合させた積層体と、絶縁板にプローブを貫通
植立したプローブ配列板の余白縁部の上面に設け
た凹状の穴部内に厚板状の弾性体を突設させ、前
記回路基板の第一のスルホール導通孔下面と接触
するプローブを貫通植立させ、かつ穴部に前記積
層体を嵌合設置させたことを特徴とする印刷配線
板の端子検査装置。
first through-hole conductive holes arranged linearly at regular intervals; and second through-holes connected to the conductive holes via a circuit pattern and arranged to match the pitch spacing of the terminals of the printed wiring board to be inspected. A laminate in which a circuit board having two through-hole conductive holes and a probe array plate having probes inserted therethrough and planted at the same array pitch as the second through-hole conductive holes of the circuit board are vertically joined; A thick plate-shaped elastic body is provided to protrude into a concave hole provided on the upper surface of the margin edge of the probe array plate in which the probes are inserted through the plate, and comes into contact with the lower surface of the first through-hole conduction hole of the circuit board. 1. A terminal inspection device for a printed wiring board, characterized in that a probe is installed through the hole, and the laminate is fitted into the hole.
JP9594385U 1985-06-25 1985-06-25 Expired JPH0430547Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9594385U JPH0430547Y2 (en) 1985-06-25 1985-06-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9594385U JPH0430547Y2 (en) 1985-06-25 1985-06-25

Publications (2)

Publication Number Publication Date
JPS625280U JPS625280U (en) 1987-01-13
JPH0430547Y2 true JPH0430547Y2 (en) 1992-07-23

Family

ID=30961120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9594385U Expired JPH0430547Y2 (en) 1985-06-25 1985-06-25

Country Status (1)

Country Link
JP (1) JPH0430547Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02104803U (en) * 1989-02-06 1990-08-21
KR102545546B1 (en) * 2018-11-29 2023-06-20 가부시키가이샤 무라타 세이사쿠쇼 Probe fitting structure and probe

Also Published As

Publication number Publication date
JPS625280U (en) 1987-01-13

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