JPH045023Y2 - - Google Patents
Info
- Publication number
- JPH045023Y2 JPH045023Y2 JP1983059049U JP5904983U JPH045023Y2 JP H045023 Y2 JPH045023 Y2 JP H045023Y2 JP 1983059049 U JP1983059049 U JP 1983059049U JP 5904983 U JP5904983 U JP 5904983U JP H045023 Y2 JPH045023 Y2 JP H045023Y2
- Authority
- JP
- Japan
- Prior art keywords
- printed circuit
- semiconductor component
- component mounting
- circuit board
- pitch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004020 conductor Substances 0.000 claims description 27
- 239000004065 semiconductor Substances 0.000 claims description 22
- 238000007689 inspection Methods 0.000 claims description 8
- 238000009413 insulation Methods 0.000 claims 1
- 239000011295 pitch Substances 0.000 description 10
- 238000012360 testing method Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 2
- 230000003014 reinforcing effect Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
【考案の詳細な説明】
本考案は、プリント回路板の回路網の電気的導
通の有無を検査するプリント回路板検査装置に関
するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a printed circuit board testing device for testing the presence or absence of electrical continuity in a circuit network on a printed circuit board.
一般にプリント回路板にはI.C.,L.S.I.等の半
導体部品を取り付けるための半導体部品取付用端
子が形成される場合がある。 In general, printed circuit boards may be provided with semiconductor component mounting terminals for mounting semiconductor components such as ICs and LSIs.
第1図は、このようなプリント回路板1の一例
を示し、複数の半導体部品取付用端子(以下単に
取付用端子という)2……が半導体部品(例えば
16ピンI.C.)の足の配置に合わせて狭いピツチP
(例えば0.1インチ程度)で二列に整列させられて
いる。また各取付用端子2……からは、各々独立
に分離させられた回路導体3……が引き出され、
さらに回路導体3……のもう一方の端には取付用
端子2……よりも広いピツチで並べられ、かつ、
取付用端子2より大きい接続用端子4……が設け
られている。 FIG. 1 shows an example of such a printed circuit board 1, in which a plurality of semiconductor component mounting terminals (hereinafter simply referred to as mounting terminals) 2... are connected to semiconductor components (e.g.
Narrow pitch P to match the foot placement of the 16-pin IC)
(for example, about 0.1 inch) and are arranged in two rows. Also, from each mounting terminal 2..., independently separated circuit conductors 3... are drawn out,
Further, at the other end of the circuit conductor 3... are arranged with a wider pitch than the mounting terminals 2..., and
Connection terminals 4 larger than the mounting terminals 2 are provided.
従来、このようなプリント回路板1の回路導体
3……の導通検査を行なう場合は、前記複数の取
付用端子2……を導伝棒等で短絡し、この導伝棒
と前記接続用端子4……の一つ一つとの間で導通
をチエツクする方法がとられていた。 Conventionally, when conducting a continuity test of the circuit conductors 3 of such a printed circuit board 1, the plurality of mounting terminals 2... are short-circuited with a conductive rod or the like, and the conductive rod and the connection terminal are connected to each other. A method was used to check continuity between each of the 4.
しかしながら、このような従来方法では、取付
用端子2……の凹凸、あるいはプリント回路板1
の反り等のために導伝棒による短絡が不安定とな
つて正確な検査が難かしくなり、また各回路導体
3……相互間に短絡があつた場合、これを検出す
ることができない等の難点があつた。 However, in such a conventional method, unevenness of the mounting terminal 2... or printed circuit board 1
Short circuits caused by conductive rods become unstable due to warping of the conductive rods, making accurate inspection difficult, and short circuits between the circuit conductors 3... cannot be detected. There was a problem.
本考案は前述事情を考慮してなされたもので、
取付用端子等の微細な端子を有するプリント回路
板の導通検査を正確かつ能率よく行ない得るプリ
ント回路板検査装置の提供を目的とするものであ
る。 This invention was made in consideration of the above circumstances,
The object of the present invention is to provide a printed circuit board inspection device that can accurately and efficiently conduct a continuity test on a printed circuit board having minute terminals such as mounting terminals.
以下本考案を図面に示す実施例に基づいて説明
する。 The present invention will be described below based on embodiments shown in the drawings.
第2図〜第5図は、本考案の一実施例を示すも
ので、第2図は前記取付用端子2……を有するプ
リント回路板1の検査に適用される検査装置であ
る。図中符号5は、ポリエステル等からなる絶縁
性フイルムであり、この絶縁性フイルム5は、第
3図に示す如く略台形状に形成される。そしてそ
の下面には、その短辺から長辺に向かつて複数本
の配線導体6……が並設され、この配線導体6…
…の一端部6a……は、前記取付用端子2……の
配置に合わせて二列に並べられるとともに一端部
6a……相互の間隔は取付用端子2……のピツチ
Pと同一とされる。また配線導体6……の他端部
6b……は前記絶縁性フイルム5の長辺に沿つて
一列に並べられるとともに、その相互間隔は前記
ピツチP以上に広げられてコネクタ用導体7……
とされて配設される。これら配線導体6……およ
びコネクタ導体7……は、例えば銅箔等によつて
形成され、絶縁性フイルム5と一体に接着される
ものである。 2 to 5 show an embodiment of the present invention, and FIG. 2 shows an inspection apparatus applied to inspect a printed circuit board 1 having the mounting terminals 2 . . . . Reference numeral 5 in the figure is an insulating film made of polyester or the like, and this insulating film 5 is formed into a substantially trapezoidal shape as shown in FIG. On the lower surface thereof, a plurality of wiring conductors 6... are arranged in parallel from the short side to the long side, and the wiring conductors 6...
The one end portions 6a... are arranged in two rows in accordance with the arrangement of the mounting terminals 2..., and the mutual spacing between the one end portions 6a is the same as the pitch P of the mounting terminals 2... . Further, the wiring conductors 6...the other end portions 6b... are arranged in a line along the long side of the insulating film 5, and the mutual spacing between them is widened beyond the pitch P so that the connector conductors 7...
It will be arranged as follows. These wiring conductors 6 . . . and connector conductors 7 .
一方前記配線導体6……の一端部6a……には
絶縁性フイルム5と直交方向に突出する複数の接
触子8……が設けられる。これら接触子8は、第
4図および第5図に示す如くばね部8aの先端に
棒状の接触部8bが設けられたものであり、配線
導体6……の一端部6a……にはんだ付け等によ
つて固定される。また図中符号9は絶縁性フイル
ムの短辺近傍に剛性を付与するための補強板であ
り、符号10はスペーサ11を介して絶縁性フイ
ルム5に固定される支持板である。この支持板1
0には前記接触子8の接触部8bが緩挿される案
内孔10a……が設けられ、接触部8bは案内孔
10aを貫通して下方に突出した状態とされる。 On the other hand, a plurality of contacts 8 protruding in a direction orthogonal to the insulating film 5 are provided at one end 6a of the wiring conductor 6. As shown in FIGS. 4 and 5, these contacts 8 are provided with a rod-shaped contact portion 8b at the tip of a spring portion 8a, and are soldered or otherwise attached to one end 6a of the wiring conductor 6. Fixed by Further, reference numeral 9 in the figure is a reinforcing plate for imparting rigidity to the vicinity of the short side of the insulating film, and reference numeral 10 is a support plate fixed to the insulating film 5 via a spacer 11. This support plate 1
0 is provided with a guide hole 10a into which the contact portion 8b of the contactor 8 is loosely inserted, and the contact portion 8b passes through the guide hole 10a and projects downward.
このように構成されたプリント回路板検査装置
の使用方法について説明すれば、第2図のように
コネクタ用導体7……を検査器(図示略)に配線
されたコネクタ12に接続した状態で、接触子8
……をプリント回路板1の取付用端子2……に正
対させる。このとき接触子8……は取付用端子2
……のピツチPと同一ピツチで並べられているの
で、どれか2本の接触子8,8の位置を合わせる
ことによつて全ての接触子8……と取付用端子2
……とを正対させることができる。しかる後に、
前記補強板9をプリント回路板1の方向に押圧す
ると、接触子8……は案内孔10a……の案内に
よつて横振れを防止されつつばね部8aの作用に
よつて伸縮するため、取付用端子の凹凸や、プリ
ント回路板1の反りにかかわりなく取付用端子2
……に確実に接触する。従つてこの状態におい
て、前記プリント回路板1の接続用端子4……
に、前記検出器に配線された他のコネクタや他の
検査用接触子等を接触させれば、回路導体3……
の導通検査を正確かつ能率よく行なえるものであ
る。 To explain how to use the printed circuit board inspection apparatus configured in this way, as shown in FIG. contact 8
. . . to directly face the mounting terminal 2 . . . of the printed circuit board 1. At this time, the contact 8... is the mounting terminal 2.
Since they are lined up at the same pitch as the pitches P of ......, by aligning the positions of any two contacts 8, 8, all contacts 8... and mounting terminals 2 can be connected.
... can be made to face each other directly. After that,
When the reinforcing plate 9 is pressed in the direction of the printed circuit board 1, the contacts 8 are prevented from wobbling laterally by the guidance of the guide holes 10a, and are expanded and contracted by the action of the spring portions 8a, so that the mounting Mounting terminals 2 regardless of unevenness of the terminals or warping of the printed circuit board 1.
Make sure to come into contact with... Therefore, in this state, the connection terminals 4 of the printed circuit board 1...
If another connector wired to the detector or another test contact etc. is brought into contact with the circuit conductor 3...
Continuity testing can be performed accurately and efficiently.
なお第6図は、本考案の他の実施例であり、28
ピンI.C.用の取付用端子を有するプリント回路板
の検査に使用される絶縁性フイルム5′およびそ
の表面に形成される配線導体6等を示すものであ
る。 FIG. 6 shows another embodiment of the present invention, 28
This figure shows an insulating film 5' used for testing printed circuit boards having mounting terminals for pin ICs, and wiring conductors 6 formed on the surface thereof.
以上説明したように本考案によれば、プリント
回路板に設けられた半導体部品取付用端子と、こ
の半導体部品取付用端子から引き出された接続用
端子との間の電気的導通の有無を検査するプリン
ト回路板検査装置において、絶縁性フイルムの表
面に複数本の配線導体を並設し、この配線導体の
一端部の間隔を前記半導体部品取付用端子のピツ
チと同一とし、また他端部の間隔を前記ピツチよ
りも広げてコネクタ用導体として配設し、かつ、
前記配線導体の一端部に、この配線導体の前記絶
縁性フイルムと反対側に位置するばね部の先端に
棒状の接触部を設けてなる複数の接触子を、前記
絶縁性フイルムと直交する方向に突出して設け、
前記半導体部品取付用端子に前記複数の接触子を
接触させる構成としたので次のような効果を得る
ことができる。 As explained above, according to the present invention, the presence or absence of electrical continuity between the semiconductor component mounting terminal provided on the printed circuit board and the connection terminal drawn out from the semiconductor component mounting terminal is inspected. In a printed circuit board inspection device, a plurality of wiring conductors are arranged in parallel on the surface of an insulating film, and the spacing between one end of the wiring conductor is the same as the pitch of the semiconductor component mounting terminal, and the spacing between the other end is the same as the pitch of the semiconductor component mounting terminal. is arranged wider than the pitch as a conductor for the connector, and
A plurality of contacts each having a rod-shaped contact portion at the tip of a spring portion located on the opposite side of the wiring conductor from the insulating film are attached to one end of the wiring conductor in a direction perpendicular to the insulating film. Provided prominently,
Since the plurality of contacts are brought into contact with the semiconductor component mounting terminal, the following effects can be obtained.
半導体部品取付用端子を検出器等に配線され
たコネクタに接続できるようにしたのプリント
回路板の導通検査の作業能率を高めることがで
きる。 The efficiency of continuity testing of printed circuit boards can be improved by connecting terminals for mounting semiconductor components to connectors wired to detectors, etc.
各取付用端子と各接続用端子との間の導通を
チエツクすることができるので回路導体相互間
に短絡があれば、これを検出し得る。 Since continuity between each mounting terminal and each connection terminal can be checked, any short circuit between circuit conductors can be detected.
半導体部品取付用端子が、ある部材に形成さ
れた細長い穴の奥先にあり、この細長い穴を通
して接触子を半導体部品取付用端子に接触させ
なければならないようなプリント回路板に対し
ても、前記細長い穴の奥先まで棒状の接触部を
挿入させることができ、半導体部品取付用端子
にばね力を作用させて接触子を接触させること
ができる。 The above method also applies to printed circuit boards in which the semiconductor component mounting terminal is located at the far end of a long and narrow hole formed in a certain member, and a contact must be brought into contact with the semiconductor component mounting terminal through this long and thin hole. The rod-shaped contact portion can be inserted deep into the elongated hole, and a spring force can be applied to the semiconductor component mounting terminal to bring the contact into contact.
半導体部品の足のピツチおよび数と同じピツ
チおよび数の半導体部品取付用端子を有するプ
リント回路板であれば、どのようなプリント回
路板の検査にも適用ぶきるので汎用性があり、
例えば同じコネクタに嵌め込み可能な数種類の
本案装置を用意し、それらを交換しながら検査
を行なえば、種々の回路パターンのプリント回
路板を検査することができる。 It is versatile because it can be applied to the inspection of any printed circuit board as long as it has the same pitch and number of semiconductor component mounting terminals as the legs of the semiconductor components.
For example, by preparing several types of devices according to the present invention that can be fitted into the same connector and inspecting them while exchanging them, printed circuit boards with various circuit patterns can be inspected.
第1図は、半導体部品取付用端子を有するプリ
ント回路板の一例を示す平面図、第2図〜第5図
は本考案の一実施例を示し、第2図は斜視図、第
3図は絶縁性フイルムの平面図、第4図は第2図
の−線に沿う矢視図、第5図は第4図の−
線に沿う矢視図、第6図は本考案の他の実施例
を説明する絶縁性フイルムの平面図である。
1……プリント回路板、2……半導体部品取付
用端子、4……接続用端子、5,5′……絶縁性
フイルム、6……配線導体、6a……一端部、6
b……他端部、7……コネクタ用導体、8……接
触子、8a……ばね部、8b……接触部。
FIG. 1 is a plan view showing an example of a printed circuit board having terminals for attaching semiconductor components, FIGS. 2 to 5 show an embodiment of the present invention, FIG. 2 is a perspective view, and FIG. A plan view of the insulating film, FIG. 4 is a view along the - line of FIG. 2, and FIG. 5 is a plan view of the insulating film.
6 is a plan view of an insulating film illustrating another embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Printed circuit board, 2... Terminal for mounting semiconductor components, 4... Connection terminal, 5, 5'... Insulating film, 6... Wiring conductor, 6a... One end, 6
b...Other end portion, 7...Conductor for connector, 8...Contactor, 8a...Spring portion, 8b...Contact portion.
Claims (1)
用端子2と、この半導体部品取付用端子から引き
出された接続用端子4との間の電気的導通の有無
を検査するプリント回路板検査装置において、絶
縁性フイルム5,5′の表面に複数本の配線導体
6を並設し、この配線導体の一端部6aの間隔を
前記半導体部品取付用端子のピツチPと同一と
し、また他端部6bの間隔を前記ピツチよりも広
げてコネクタ用導体7として配設し、かつ、前記
配線導体の一端部に、この配線導体の前記絶縁性
フイルムと反対側に位置するばね部8aの先端に
棒状の接触部8bを設けてなる複数の接触子8
を、前記絶縁性フイルムと直交する方向に突出し
て設け、前記半導体部品取付用端子に前記複数の
接触子を接触させることを特徴とするプリント回
路板検査装置。 In a printed circuit board inspection device that inspects the presence or absence of electrical continuity between a semiconductor component mounting terminal 2 provided on a printed circuit board 1 and a connection terminal 4 pulled out from this semiconductor component mounting terminal, insulation A plurality of wiring conductors 6 are arranged in parallel on the surfaces of the conductive films 5, 5', and the spacing between one end portion 6a of the wiring conductor is the same as the pitch P of the semiconductor component mounting terminal, and the spacing between the other end portion 6b is the same as the pitch P of the semiconductor component mounting terminal. is arranged as a connector conductor 7 wider than the pitch, and a rod-shaped contact portion is provided at one end of the wiring conductor at the tip of a spring portion 8a located on the opposite side of the wiring conductor from the insulating film. A plurality of contacts 8 provided with 8b
A printed circuit board inspection apparatus characterized in that a plurality of contacts are provided to protrude in a direction orthogonal to the insulating film, and the plurality of contacts are brought into contact with the semiconductor component mounting terminals.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5904983U JPS59163968U (en) | 1983-04-20 | 1983-04-20 | Printed circuit board inspection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5904983U JPS59163968U (en) | 1983-04-20 | 1983-04-20 | Printed circuit board inspection equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59163968U JPS59163968U (en) | 1984-11-02 |
JPH045023Y2 true JPH045023Y2 (en) | 1992-02-13 |
Family
ID=30189309
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5904983U Granted JPS59163968U (en) | 1983-04-20 | 1983-04-20 | Printed circuit board inspection equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59163968U (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0438299Y2 (en) * | 1984-11-27 | 1992-09-08 | ||
JPH06784Y2 (en) * | 1986-10-17 | 1994-01-05 | 理化電子株式会社 | Jig for inspection of electronic parts |
JP2539264Y2 (en) * | 1990-07-24 | 1997-06-25 | ヒューグルエレクトロニクス株式会社 | Probe card |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4917685A (en) * | 1972-06-05 | 1974-02-16 |
-
1983
- 1983-04-20 JP JP5904983U patent/JPS59163968U/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4917685A (en) * | 1972-06-05 | 1974-02-16 |
Also Published As
Publication number | Publication date |
---|---|
JPS59163968U (en) | 1984-11-02 |
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