JPH0428143B2 - - Google Patents
Info
- Publication number
- JPH0428143B2 JPH0428143B2 JP29866886A JP29866886A JPH0428143B2 JP H0428143 B2 JPH0428143 B2 JP H0428143B2 JP 29866886 A JP29866886 A JP 29866886A JP 29866886 A JP29866886 A JP 29866886A JP H0428143 B2 JPH0428143 B2 JP H0428143B2
- Authority
- JP
- Japan
- Prior art keywords
- dust
- value
- comparison
- tolerance
- management
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000428 dust Substances 0.000 claims description 93
- 238000005259 measurement Methods 0.000 claims description 23
- 238000001514 detection method Methods 0.000 claims description 16
- 238000004364 calculation method Methods 0.000 claims description 15
- 235000012431 wafers Nutrition 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29866886A JPS63152138A (ja) | 1986-12-17 | 1986-12-17 | ダスト管理装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29866886A JPS63152138A (ja) | 1986-12-17 | 1986-12-17 | ダスト管理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63152138A JPS63152138A (ja) | 1988-06-24 |
| JPH0428143B2 true JPH0428143B2 (OSRAM) | 1992-05-13 |
Family
ID=17862721
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP29866886A Granted JPS63152138A (ja) | 1986-12-17 | 1986-12-17 | ダスト管理装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63152138A (OSRAM) |
-
1986
- 1986-12-17 JP JP29866886A patent/JPS63152138A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63152138A (ja) | 1988-06-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5147498A (en) | Apparatus for controlling temperature in the processing of a substrate | |
| US20020029115A1 (en) | Machine tool maintenance system | |
| JPH0428143B2 (OSRAM) | ||
| JP3095463B2 (ja) | 三次元測定方法 | |
| JP3365551B2 (ja) | ロット供給システム及びロット供給方法 | |
| JPH0871973A (ja) | ストッカ用ロボットの教示方法 | |
| JPS61120969A (ja) | 衝撃記録装置 | |
| JPH04184203A (ja) | 位置計測装置の制御装置 | |
| JPH0763515B2 (ja) | 廃棄物収容ピットにおける火災検出方法 | |
| JP2565032Y2 (ja) | 研削盤のドレスインターバル制御装置 | |
| JPS6344076A (ja) | コンクリ−ト打設時における脱型時期検出方法 | |
| JP2001176953A (ja) | 半導体ウエハ搬送装置受け渡し部の寸法測定器、その寸法測定器を用いた測定・調整方法及び校正用装置 | |
| JPH04333341A (ja) | 塗型膜厚の測定方法 | |
| JPH0871972A (ja) | ロボットとカメラの自動調整方法 | |
| JP3923700B2 (ja) | 検査データ管理システム及びウエハ形成装置 | |
| JP3265545B2 (ja) | 作業車状態検出装置の調整制御装置 | |
| JPS60240952A (ja) | 風呂の湯沸し監視装置 | |
| JP2841117B2 (ja) | コイル位置検出装置 | |
| JP4249881B2 (ja) | J1c試験装置 | |
| JP3418554B2 (ja) | 平板保持装置及び平板保持方法 | |
| JPS63169433A (ja) | クリ−ンル−ムの清浄度制御装置 | |
| JPH0461851U (OSRAM) | ||
| JPS59205613A (ja) | シ−ケンスモニタ装置 | |
| JPH05302980A (ja) | 放射能汚染検出装置 | |
| JP2790585B2 (ja) | 粒子測定システム |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |