JPH0422306Y2 - - Google Patents

Info

Publication number
JPH0422306Y2
JPH0422306Y2 JP1984072889U JP7288984U JPH0422306Y2 JP H0422306 Y2 JPH0422306 Y2 JP H0422306Y2 JP 1984072889 U JP1984072889 U JP 1984072889U JP 7288984 U JP7288984 U JP 7288984U JP H0422306 Y2 JPH0422306 Y2 JP H0422306Y2
Authority
JP
Japan
Prior art keywords
module
terminal
test
terminals
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984072889U
Other languages
English (en)
Japanese (ja)
Other versions
JPS60185274U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7288984U priority Critical patent/JPS60185274U/ja
Publication of JPS60185274U publication Critical patent/JPS60185274U/ja
Application granted granted Critical
Publication of JPH0422306Y2 publication Critical patent/JPH0422306Y2/ja
Granted legal-status Critical Current

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Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP7288984U 1984-05-18 1984-05-18 配線試験装置 Granted JPS60185274U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7288984U JPS60185274U (ja) 1984-05-18 1984-05-18 配線試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7288984U JPS60185274U (ja) 1984-05-18 1984-05-18 配線試験装置

Publications (2)

Publication Number Publication Date
JPS60185274U JPS60185274U (ja) 1985-12-09
JPH0422306Y2 true JPH0422306Y2 (es) 1992-05-21

Family

ID=30611727

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7288984U Granted JPS60185274U (ja) 1984-05-18 1984-05-18 配線試験装置

Country Status (1)

Country Link
JP (1) JPS60185274U (es)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5983069A (ja) * 1982-11-02 1984-05-14 Seiko Epson Corp アクテイブマトリクス基板の測定方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5983069A (ja) * 1982-11-02 1984-05-14 Seiko Epson Corp アクテイブマトリクス基板の測定方法

Also Published As

Publication number Publication date
JPS60185274U (ja) 1985-12-09

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