JPH0421973U - - Google Patents

Info

Publication number
JPH0421973U
JPH0421973U JP6343990U JP6343990U JPH0421973U JP H0421973 U JPH0421973 U JP H0421973U JP 6343990 U JP6343990 U JP 6343990U JP 6343990 U JP6343990 U JP 6343990U JP H0421973 U JPH0421973 U JP H0421973U
Authority
JP
Japan
Prior art keywords
board
body plate
inspection
jig main
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6343990U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6343990U priority Critical patent/JPH0421973U/ja
Publication of JPH0421973U publication Critical patent/JPH0421973U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図Ａは、本考案の一実施例に係る基板検査
装置の平面図、第１図Ｂは、第１図Ａに示す検査
ユニツトの拡大図、第１図Ｃは、第１図Ａに示す
治具本体プレートの伸縮の構造を示す図、第２図
は本考案の一実施例に係る基板検査装置及び液晶
基板の側面図、第３図Ａは、従来の基板検査装置
の底面図、第３図Ｂは、第３図Ａに示すプローブ
ブロツク部分の側面の拡大断面図である。 ２ａ，２ｂ……治具本体プレート、４……プロ
ーブ、８Ｘθ，８Ｙ……調整用マイクロメータ、
１０……液晶基板、１０Ｐ……パツド、８１，８
２……検査ユニツト。 1A is a plan view of a board inspection apparatus according to an embodiment of the present invention, FIG. 1B is an enlarged view of the inspection unit shown in FIG. 1A, and FIG. 1C is a plan view of the inspection unit shown in FIG. 1A. 2 is a side view of a substrate inspection device and a liquid crystal substrate according to an embodiment of the present invention, and FIG. 3A is a bottom view of a conventional substrate inspection device. FIG. 3B is an enlarged side sectional view of the probe block portion shown in FIG. 3A. 2a, 2b...Jig body plate, 4...Probe, 8Xθ, 8Y...Adjustment micrometer,
10...Liquid crystal board, 10P...Pad, 81,8
2...Inspection unit.

Claims (1)

【実用新案登録請求の範囲】 治具本体プレート、 治具本体プレートに備えられている複数の接触
端子であつて、検査対象である基板の導通パター
ンの所定の箇所に接触する複数の接触端子、 を備えた基板検査装置において、 治具本体プレート上に二以上の検査ユニツトを
脱着可能なように備え、 前記接触子を分割して各検査ユニツトに備え、 検査ユニツトに備えられる調整具であつて、治
具本体プレート上における検査ユニツトの位置を
調整し、接触端子を検査対象である基板の微細な
導通パターンの所定の箇所に接触させる為の調整
具を備えている、 ことを特徴とする基板検査装置。[Scope of Utility Model Registration Claims] A jig main body plate, a plurality of contact terminals provided on the jig main body plate that contact predetermined locations of a conductive pattern of a board to be inspected; In a board inspection apparatus equipped with a jig body plate, two or more inspection units are removably provided on a jig main body plate, the contactor is divided and provided in each inspection unit, and an adjustment tool provided in the inspection unit. A board characterized in that it is equipped with an adjustment tool for adjusting the position of the inspection unit on the jig main plate and bringing the contact terminal into contact with a predetermined location of a fine conductive pattern on the board to be inspected. Inspection equipment.
JP6343990U 1990-06-14 1990-06-14 Pending JPH0421973U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6343990U JPH0421973U (en) 1990-06-14 1990-06-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6343990U JPH0421973U (en) 1990-06-14 1990-06-14

Publications (1)

Publication Number Publication Date
JPH0421973U true JPH0421973U (en) 1992-02-24

Family

ID=31593490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6343990U Pending JPH0421973U (en) 1990-06-14 1990-06-14

Country Status (1)

Country Link
JP (1) JPH0421973U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008544283A (en) * 2005-06-24 2008-12-04 フォームファクター， インコーポレイテッド Method and apparatus for adjusting a multi-substrate probe structure
JP2010540941A (en) * 2007-09-26 2010-12-24 フォームファクター， インコーポレイテッド Assembly and alignment of components
JP2017194388A (en) * 2016-04-21 2017-10-26 日本電子材料株式会社 Probe card
WO2023248595A1 (en) * 2022-06-22 2023-12-28 ヤマハファインテック株式会社 Method for manufacturing probe unit, probe unit, probe mounting body, and electrical inspection device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS519260A (en) * 1974-07-11 1976-01-24 Mitsubishi Rayon Co
JPS5623470B2 (en) * 1976-12-20 1981-05-30
JPH03218472A (en) * 1990-01-23 1991-09-26 Nippon Maikuronikusu:Kk Probe for display panel
JPH046475A (en) * 1990-04-24 1992-01-10 Canon Inc Fixed state tester for electronic component

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS519260A (en) * 1974-07-11 1976-01-24 Mitsubishi Rayon Co
JPS5623470B2 (en) * 1976-12-20 1981-05-30
JPH03218472A (en) * 1990-01-23 1991-09-26 Nippon Maikuronikusu:Kk Probe for display panel
JPH046475A (en) * 1990-04-24 1992-01-10 Canon Inc Fixed state tester for electronic component

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008544283A (en) * 2005-06-24 2008-12-04 フォームファクター， インコーポレイテッド Method and apparatus for adjusting a multi-substrate probe structure
JP2010540941A (en) * 2007-09-26 2010-12-24 フォームファクター， インコーポレイテッド Assembly and alignment of components
JP2017194388A (en) * 2016-04-21 2017-10-26 日本電子材料株式会社 Probe card
WO2023248595A1 (en) * 2022-06-22 2023-12-28 ヤマハファインテック株式会社 Method for manufacturing probe unit, probe unit, probe mounting body, and electrical inspection device

Similar Documents

Publication Publication Date Title
JPH0421973U (en)
JPS61179747U (en)
JPH0416367U (en)
JPH0328465U (en)
JPH01142871U (en)
JPH02102760U (en)
JPH0174570U (en)
JPS6360971U (en)
JPS62108877U (en)
JPS6150275U (en)
JPH0463135U (en)
JPH0463134U (en)
JPS6314173U (en)
JPS6176367U (en)
JPS648672U (en)
JPH0392042U (en)
JPH03106467U (en)
JPH0265376U (en)
JPS58193270U (en) Printed wiring board inspection equipment
JPS61102042U (en)
JPH02126386U (en)
JPS63107867U (en)
JPH01129861U (en)
JPS606223U (en) Photomask inspection machine
JPH0231135U (en)