JPH041467U - - Google Patents
Info
- Publication number
- JPH041467U JPH041467U JP4104090U JP4104090U JPH041467U JP H041467 U JPH041467 U JP H041467U JP 4104090 U JP4104090 U JP 4104090U JP 4104090 U JP4104090 U JP 4104090U JP H041467 U JPH041467 U JP H041467U
- Authority
- JP
- Japan
- Prior art keywords
- leads
- tape substrate
- test
- electrodes
- aligned
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 4
- 238000000034 method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4104090U JPH041467U (en, 2012) | 1990-04-17 | 1990-04-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4104090U JPH041467U (en, 2012) | 1990-04-17 | 1990-04-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH041467U true JPH041467U (en, 2012) | 1992-01-08 |
Family
ID=31551361
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4104090U Pending JPH041467U (en, 2012) | 1990-04-17 | 1990-04-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH041467U (en, 2012) |
-
1990
- 1990-04-17 JP JP4104090U patent/JPH041467U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH041467U (en, 2012) | ||
| JPS5821879U (ja) | 電子回路試験装置 | |
| JPS59154677U (ja) | 半導体装置の試験装置 | |
| JPS60109326U (ja) | 半導体疑似試験装置 | |
| JPH0227578U (en, 2012) | ||
| JPS6059174U (ja) | 静電気試験装置 | |
| JPS62170575U (en, 2012) | ||
| JPH0415075U (en, 2012) | ||
| JPS58164235U (ja) | 半導体装置の試験装置 | |
| JPS588174U (ja) | 厚膜回路基板測定装置 | |
| JPS61139481U (en, 2012) | ||
| JPS6364036U (en, 2012) | ||
| JPS59162671U (ja) | 半導体装置用高温試験装置 | |
| JPS59125837U (ja) | 半導体検査装置 | |
| JPS5883153U (ja) | ウエ−ハ検査装置 | |
| JPS63109674U (en, 2012) | ||
| JPS6027377U (ja) | 回路ユニツト検査用触針装置 | |
| JPS59192839U (ja) | ウエハの測定装置 | |
| JPS6117678U (ja) | 試験器 | |
| JPS59154635U (ja) | 接着強度試験機 | |
| JPS60168075U (ja) | 集積回路試験装置 | |
| JPS58189532U (ja) | ウエ−ハ試験装置 | |
| JPS5869938U (ja) | 半導体素子の検査装置 | |
| JPS58127369U (ja) | Pnpトランジスタ用測定装置 | |
| JPS60144237U (ja) | 半導体装置の検査装置 |