JPH0388175U - - Google Patents

Info

Publication number
JPH0388175U
JPH0388175U JP14791989U JP14791989U JPH0388175U JP H0388175 U JPH0388175 U JP H0388175U JP 14791989 U JP14791989 U JP 14791989U JP 14791989 U JP14791989 U JP 14791989U JP H0388175 U JPH0388175 U JP H0388175U
Authority
JP
Japan
Prior art keywords
contact
board
contact member
bonding part
shot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14791989U
Other languages
English (en)
Japanese (ja)
Other versions
JP2577525Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989147919U priority Critical patent/JP2577525Y2/ja
Publication of JPH0388175U publication Critical patent/JPH0388175U/ja
Application granted granted Critical
Publication of JP2577525Y2 publication Critical patent/JP2577525Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1989147919U 1989-12-23 1989-12-23 ショート・オープン検査装置 Expired - Lifetime JP2577525Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989147919U JP2577525Y2 (ja) 1989-12-23 1989-12-23 ショート・オープン検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989147919U JP2577525Y2 (ja) 1989-12-23 1989-12-23 ショート・オープン検査装置

Publications (2)

Publication Number Publication Date
JPH0388175U true JPH0388175U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1991-09-09
JP2577525Y2 JP2577525Y2 (ja) 1998-07-30

Family

ID=31694390

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989147919U Expired - Lifetime JP2577525Y2 (ja) 1989-12-23 1989-12-23 ショート・オープン検査装置

Country Status (1)

Country Link
JP (1) JP2577525Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002162430A (ja) * 2001-08-24 2002-06-07 Jsr Corp 回路基板検査用アダプター装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4849473A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1971-10-22 1973-07-12
JPS5441171U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1977-08-26 1979-03-19
JPS63275200A (ja) * 1987-05-07 1988-11-11 Fujitsu Ltd 多端子部品の位置合わせ方式

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4849473A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1971-10-22 1973-07-12
JPS5441171U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1977-08-26 1979-03-19
JPS63275200A (ja) * 1987-05-07 1988-11-11 Fujitsu Ltd 多端子部品の位置合わせ方式

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002162430A (ja) * 2001-08-24 2002-06-07 Jsr Corp 回路基板検査用アダプター装置

Also Published As

Publication number Publication date
JP2577525Y2 (ja) 1998-07-30

Similar Documents

Publication Publication Date Title
JP3431872B2 (ja) Ｉｃ試験装置
JP3839061B2 (ja) 基板に構成部材を配置する方法及びこの方法を実施するための構成部材配置機械
JPH0388175U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH02118275U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP2002160187A (ja) 保持装置、搬送装置、ｉｃ検査装置、保持方法、搬送方法及びｉｃ検査方法
JPH0682227A (ja) 電子部品の外観検査方法及びその装置
JP3340114B2 (ja) 半導体装置用検査装置と部品実装機
JP3351245B2 (ja) デバイス検査装置
JP2001201536A (ja) チップ測定用プローバ
JP2541191Y2 (ja) フローティングガイド付きハンドラ用キャリア
JPS62108874U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH08330371A (ja) プローブ検査装置及び検査方法
JPH05273305A (ja) 実装基板検査装置
JP2676446B2 (ja) ワイヤボンディング方法
JPH0325238U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP2577219Y2 (ja) Ｉｃハンドラーのテストヘッド構造
JPH0244281U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH0719811B2 (ja) プロ−ブ装置によるウエハの検査方法
JPH0638421Y2 (ja) リードフレーム搬送・位置決め装置
JP2595034Y2 (ja) Ｉｃ試験装置
JP2687559B2 (ja) 三次元測定装置
JPH05109830A (ja) ボンデイング装置
JPH0323349U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH0372377U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH0381636U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)